RAN5#90-e

1 Opening of the meeting
R5-210000 Agenda - opening session WG Chairman
R5-210001 RAN5#90-e E-Meeting Timelines, Scope, Process WG Chairman
R5-211282 Agenda - opening session WG Chairman
2.1 Live Reports
R5-210002 RAN5 Leadership Team WG Chairman
R5-210003 RAN5#89-e WG Minutes ETSI Secretariat
R5-210004 RAN5#89-e WG Action Points ETSI Secretariat
R5-210005 Latest RAN Plenary notes WG Chairman
R5-210006 Latest RAN Plenary draft Report WG Chairman
R5-210007 Post Plenary Active Work Item update ETSI Secretariat
R5-210192 MCC TF160 Status Report MCC TF160
2.2 General Reports for information
R5-210008 RAN5 SR to RP#90-e WG Chairman
R5-210009 TF160 SR to RP#90-e WG Chairman
R5-210964 GCF 3GPP TCL after GCF CAG#65 Ericsson
R5-210966 3GPP RAN5 CA status list (pre-RAN5#90-e meeting) Ericsson
3 Incoming Liaison Statements
R5-210014 LS on nominal channel spacing calculation for two carriers at band n41 with 40MHz and 80MHz channel bandwidths TSG WG RAN4
R5-210015 LS on OTA LTE UE TRP and TRS Requirements MSG TFES
R5-210016 Test methods for over-the-air TRP field measurements of unwanted emissions from IMT radio equipment utilizing active antennas ITU-R WP 1C
R5-210017 LS on Use of Inclusive Language in 3GPP TSG SA
R5-210018 NGMN-GTI 5G Smart Devices Supporting Network Slicing NGMN Next Generation Mobile Networks Alliance Project 5G Smart Devices Supporting Network Slicing
R5-210019 LS to 3GPP RAN5 on LTE frequency band grouping GCF CAG
R5-211277 LS on inter-RAT cell reselection for mobility state estimation TSG WG RAN2
R5-211278 Reply LS on Rel-16 mandatory RRM requirements TSG WG RAN2
R5-211279 LS to RAN5 on RRC processing time with segmentation TSG WG RAN2
R5-211280 Reply LS on reporting of SINR measurements for serving cell TSG WG RAN2
R5-211284 LS on change of methodology for new LTE-CA REL-17 combinations TSG WG RAN4
R5-211285 LS on Signalling scheme of Transparent TxD TSG WG RAN4
R5-211286 LS on Test Methodology for UE URLLC Ultra Low BLER CQI requirements TSG WG RAN4
4.1 New Work Item proposals - for intro only
R5-210080 New WID on UE Conformance Test Aspects for NR RF Requirement Enhancements for FR2 Nokia, Nokia Shanghai Bell
R5-210104 New WID on UE Conformance Test Aspects for Enhancement of Network Slicing China Mobile, China Telecom, China Unicom
R5-210514 New WID on UE Conformance Test Aspects for 2-step RACH for NR ZTE Corporation, China Telecom
R5-210774 New WID on UE Conformance Test Aspects – High power UE (power class 2) for EN-DC with 1 LTE band + 1 NR TDD band China Unicom
R5-210827 New WID on UE Conformance Test Aspects – LTE-NR & NR-NR Dual Connectivity and NR CA enhancements Nokia, Nokia Shanghai Bell
R5-211080 New WID on UE Conformance Test Aspects for NR-based Access to Unlicensed Spectrum Qualcomm Wireless GmbH
R5-211087 New WID - UE Conformance Test Aspects - Support of eCall over IMS for NR Qualcomm Incorporated
4.2.1 5GS
R5-210100 Checklist - NR_Rel-16_CA_DC for RAN5#89-e CMCC, BV
R5-210107 5G Smart Devices Supporting Network Slicing CMCC
R5-210984 Checklist - Adding new NR band or channel bandwidth to existing bands Ericsson
4.2.2 All other topics
R5-211106 Discussion on subclause drafting rules in RAN5 specs ZTE Corporation
4.3 RAN5 PRDs/Templates
R5-210010 RAN5#90-e LS Template WG Chairman
R5-210021 Draft RAN5 Terms of Reference WG Chairman
R5-210168 New RAN5 PRD-19 on RAN5 WP Template Samsung, Ericsson
R5-210193 RAN5 PRD12 version 6.5 MCC TF160
R5-210555 New RAN5 PRD-19 on RAN5 WP Template Samsung, Ericsson
4.5.3 Other open issues from joint sessions - original A.I. retained
R5-210011 Meeting schedule for 2021-22 WG Chairman
R5-210105 New SID: Study on on 5G NR UE supporting Network Slicing Testing China Mobile, China Unicom
R5-210106 Proposal for introduction of a New Study Item on 5G NR UE supporting Network Slicing Testing CMCC
R5-211314 Draft RAN5 Terms of Reference WG Chairman
R5-211317 Proposal for introduction of a New Study Item on 5G NR UE supporting Network Slicing Testing CMCC
7.2.3 Other open issues from joint sessions - original A.I. retained
R5-211361 Draft RAN5 Terms of Reference WG Chairman
7.3 iWD/PRD Updates
R5-210139 PRD-17 on Guidance to Work Item Codes (post RAN#91-e version) Samsung (Rapporteur)
7.4.1 Final version of Work Item Proposals
R5-211302 New WID on UE Conformance Test Aspects for NR RF Requirement Enhancements for FR2 Nokia, Nokia Shanghai Bell
R5-211303 New WID on UE Conformance Test Aspects for Enhancement of Network Slicing China Mobile, China Telecom, China Unicom
R5-211304 New WID on UE Conformance Test Aspects for 2-step RACH for NR ZTE Corporation, China Telecom
R5-211305 New WID on UE Conformance Test Aspects – LTE-NR & NR-NR Dual Connectivity and NR CA enhancements Nokia, Nokia Shanghai Bell
R5-211306 New WID on UE Conformance Test Aspects for NR-based Access to Unlicensed Spectrum Qualcomm Wireless GmbH
R5-211307 New WID on UE Conformance Test Aspects – High power UE (power class 2) for EN-DC with 1 LTE band + 1 NR TDD band China Unicom
R5-211308 New WID - UE Conformance Test Aspects - Support of eCall over IMS for NR Qualcomm Incorporated
R5-211309 New SID: Study on on 5G NR UE supporting Network Slicing Testing China Mobile, China Unicom
7.4.2 Active Work Items/ Study Item: work plans (wp) / status reports (sr) / Work Item Descriptions (wid)
R5-210012 WI Progress and Target Completion Date Review WG Chairman
R5-210096 SR - Rel-16 IIOT after RAN5#90-e CMCC
R5-210097 WP - Rel-16 IIOT after RAN5#90-e CMCC
R5-210098 SR - NR_Rel-16_CA_DC after RAN5#90-e CMCC
R5-210099 WP - NR_Rel-16_CA_DC after RAN5#90-e CMCC
R5-210101 SR - Rel-16 HST after RAN5#90-e CMCC
R5-210102 WP - Rel-16 HST after RAN5#90-e CMCC
R5-210103 Revised WID on UE Conformance Test Aspects for NR HST CMCC
R5-210126 SR - NR_SON_MDT-UEConTest after RAN5#90-e CMCC, Ericsson
R5-210127 WP - NR_SON_MDT-UEConTest after RAN5#90-e CMCC, Ericsson
R5-210273 WP UE Conformance Test Aspects - Rel-16 Private Network Support for NG-RAN Qualcomm CDMA Technologies
R5-210274 SR UE Conformance Test Aspects - Rel-16 Private Network Support for NG-RAN Qualcomm CDMA Technologies
R5-210275 WP UE Conformance Test Aspects - Rel-16 Optimisations on UE radio capability signalling – NR/E-UTRA Qualcomm CDMA Technologies
R5-210276 SR UE Conformance Test Aspects - Rel-16 Optimisations on UE radio capability signalling – NR/E-UTRA Qualcomm CDMA Technologies
R5-210278 Revised WID - Rel-16 Optimisations on UE radio capability signalling – NR/E-UTRA Qualcomm CDMA Technologies
R5-210287 Revised WID on UE Conformance Test Aspects for SON and MDT support for NR CMCC, Ericsson
R5-210334 Work plan: UE Conformance Test Aspects for NR Positioning Support CATT
R5-210335 SR UE Conformance Test Aspects - NR Positioning Support CATT
R5-210336 Work plan: B1C Signal in BDS Positioning System Support for LTE and NR CATT
R5-210337 SR UE Conformance Test Aspects - B1C Signal in BDS Positioning System Support for LTE and NR CATT
R5-210338 Work plan: UE Conformance Test Aspects – UE power saving in NR CATT
R5-210339 SR UE Conformance Test Aspects - UE power saving in NR CATT
R5-210340 WP UE Conformance Test Aspects – Further NB-IoT enhancements CATT
R5-210341 SR UE Conformance Test Aspects - Further NB-IoT enhancements CATT
R5-210395 SR UE Conformance Test Aspects - Additional LTE bands for UE category M2 and/or NB2 in Rel-16 Ericsson
R5-210396 WP UE Conformance Test Aspects - Additional LTE bands for UE category M2 and/or NB2 in Rel-16 Ericsson
R5-210583 WI Update for UE Conformance Test Aspects - Rel -16 for CLI handling for NR Qualcomm Technologies Netherlands B.V.
R5-210584 SR UE Conformance Test Aspects - Rel -16 for CLI handling for NR Qualcomm Technologies Netherlands B.V.
R5-210585 SR on 5G NR User Equipment (UE) Application Layer Data Throughput Performance Qualcomm Technologies Netherlands B.V.
R5-210586 SI update on 5G NR User Equipment (UE) Application Layer Data Throughput Performance Qualcomm Technologies Netherlands B.V.
R5-210587 SR - UE Conformance Test Aspects - Enhancements for Mission Critical Services MCPTT, MCData and MCVideo (UID - 890042) MCenhUEConTest NIST
R5-210588 WP - UE Conformance Test Aspects - Enhancements for Mission Critical Services MCPTT, MCData and MCVideo (UID - 890042) MCenhUEConTest NIST
R5-210696 SR UE Conformance Test Aspects - Rel-16 NR Mobility Enhancement Huawei, Hisilicon
R5-210697 WP UE Conformance Test Aspects - Rel-16 NR Mobility Enhancement Huawei, Hisilicon
R5-210718 SR UE Conformance Test Aspects - Rel-16 NR V2X Huawei, Hisilicon
R5-210719 WP UE Conformance Test Aspects - Rel-16 NR V2X Huawei, Hisilicon
R5-210720 SR UE Conformance Test Aspects- SRVCC_NR_to_UMTS China Unicom
R5-210721 WP UE Conformance Test Aspects- SRVCC_NR_to_UMTS China Unicom
R5-210759 WP - Shortened TTI and processing time for LTE Huawei, HiSilicon
R5-210760 SR - Shortened TTI and processing time for LTE Huawei, HiSilicon
R5-210761 WP - RF requirements for NR frequency range 1 (FR1) Huawei, HiSilicon
R5-210762 SR - RF requirements for NR frequency range 1 (FR1) Huawei, HiSilicon
R5-210763 WP - Enhancements on MIMO for NR Huawei, HiSilicon
R5-210764 SR - Enhancements on MIMO for NR Huawei, HiSilicon
R5-210765 WP - NR URLLC Huawei, HiSilicon
R5-210766 SR - NU URLLC Huawei, HiSilicon
R5-210797 Revised WID on UE Conformance Test Aspects – Single Radio Voice Call Continuity from 5G to 3G China Unicom
R5-210876 WP - R15 TDD HPUE – Status after RAN5#90-e Huawei, HiSilicon
R5-210877 SR - R15 TDD HPUE – Status after RAN5#90-e Huawei, HiSilicon
R5-210878 WP - R17 NR_CADC_NR_LTE_DC – Status after RAN5#90-e Huawei, HiSilicon
R5-210879 SR - R17 NR_CADC_NR_LTE_DC – Status after RAN5#90-e Huawei, HiSilicon
R5-210895 WP UE Conformance Test Aspects - New Rel-17 NR licensed bands and extension of existing NR bands after 90e Huawei, Hisilicon
R5-210896 SR UE Conformance Test Aspects - New Rel-17 NR licensed bands and extension of existing NR bands after 90e Huawei, Hisilicon
R5-210939 SR UE Conformance Test Aspects- Additional LTE bands for UE category M1 and/or NB1 in Rel-16 Ericsson
R5-210940 WP UE Conformance Test Aspects- Additional LTE bands for UE category M1 and/or NB1 in Rel-16 Ericsson
R5-210968 WP UE Conformance Test Aspects - Rel-14 LTE CA configurations Ericsson
R5-210969 SR UE Conformance Test Aspects - Rel-14 LTE CA configurations Ericsson
R5-210970 WP UE Conformance Test Aspects - Rel-15 LTE CA configurations Ericsson
R5-210971 SR UE Conformance Test Aspects - Rel-15 LTE CA configurations Ericsson
R5-210972 WP UE Conformance Test Aspects - Rel-16 LTE CA configurations Ericsson
R5-210973 SR UE Conformance Test Aspects - Rel-16 LTE CA configurations Ericsson
R5-210974 WP UE Conformance Test Aspects - 5G system with NR and LTE Ericsson
R5-210975 SR UE Conformance Test Aspects - 5G system with NR and LTE Ericsson
R5-210978 WP UE Conformance Test Aspects - New Rel-16 NR bands and extension of existing NR bands Ericsson
R5-210979 SR UE Conformance Test Aspects - New Rel-16 NR bands and extension of existing NR bands Ericsson
R5-210983 Revised WID: UE Conformance Test Aspects - 5G system with NR and LTE Ericsson
R5-211131 WP UE Conformance Test Aspects – Rel14 Enhanced Full Dimension MIMO for LTE Ericsson
R5-211132 SR UE Conformance Test Aspects – Rel14 Enhanced Full Dimension MIMO for LTE Ericsson
R5-211153 WP UE Conformance Test Aspects- Even further mobility enhancement for E-UTRAN after RAN5#90-e China Telecom
R5-211154 SR UE Conformance Test Aspects- Even further mobility enhancement for E-UTRAN after RAN5#90-e China Telecom
R5-211155 WP UE Conformance Test Aspects for add support of NR DL 256QAM for FR2 China Telecom
R5-211156 SR UE Conformance Test Aspects for add support of NR DL 256QAM for FR2 China Telecom
R5-211157 SR UE Conformance Test Aspects for NR performance requirement enhancement after RAN5#90-e China Telecom
R5-211163 WP UE Conformance Test Aspects - Even further enhanced MTC for LTE Ericsson
R5-211164 SR UE Conformance Test Aspects - Even further enhanced MTC for LTE Ericsson
R5-211197 SR UE Conformance Test Aspects- ENDC_UE_PC2_FDD_TDD after R5#90e China Unicom
R5-211198 WP UE Conformance Test Aspects- ENDC_UE_PC2_FDD_TDD after R5#90e China Unicom
R5-211287 WP UE Conformance Test Aspects - Enhancing LTE CA Utilization Nokia, Nokia Shanghai Bell
R5-211288 SR UE Conformance Test Aspects - Enhancing LTE CA Utilization Nokia, Nokia Shanghai Bell
R5-211289 WP UE Conformance Test Aspects - NR performance requirement enhancement Qualcomm
R5-211290 SR UE Conformance Test Aspects - NR performance requirement enhancement Qualcomm
R5-211363 Revised WID on UE Conformance Test Aspects for NR HST CMCC
R5-211364 Revised WID - Rel-16 Optimisations on UE radio capability signalling – NR/E-UTRA Qualcomm CDMA Technologies
R5-211365 Revised WID on UE Conformance Test Aspects for SON and MDT support for NR CMCC, Ericsson
R5-211366 WP UE Conformance Test Aspects - Rel -16 for CLI handling for NR Qualcomm Technologies Netherlands B.V.
R5-211367 WP - 5G NR User Equipment (UE) Application Layer Data Throughput Performance Qualcomm Technologies Netherlands B.V.
7.5 Docs still needing agreement/endorsement/approval (e.g. Outgoing LS / Reports / New Specs / Info for certification bodies etc.)
R5-210141 TS 36.523-1 Tracker status after RAN5#90-e Samsung (Rapporteur)
R5-210156 TS 38.523-1 Tracker status after RAN5#90-e Samsung (Rapporteur)
R5-210400 FR2 Measurement Uncertainty (MU) and Test Tolerances (TT) Target Completion Update AT&T
R5-210965 RAN5#90-e summary of changes to RAN5 test cases with potential impact on GCF and PTCRB Ericsson, Samsung
R5-210967 3GPP RAN5 CA status list (post-RAN5#90-e meeting) Ericsson
R5-210976 5GS progress report RAN5#90-e Ericsson
R5-210977 Update of RAN5 5G NR phases and target update RAN5#90-e Ericsson
R5-211300 MCC TF160 Status Report MCC TF160
R5-211301 Reply LS on NGMN-GTI 5G Smart Devices Supporting Network Slicing TSG WG RAN5
R5-211359 LS on confirming IMS 180 Ringing before or after dedicated bearer establishment TSG WG RAN5
R5-211360 LS on ICE support for establishing an MCPTT pre-established session TSG WG RAN5
7.6 Confirmation of Future RAN5 Matters
R5-210013 Review deadlines for next quarter WG Chairman
5.2 Review incoming LS (fm A.I. 3) & new subject discussion papers
R5-210020 LS on SCell dropping TSG WG RAN4
5.3.2.1.1 Test frequencies (Clause 4.3.1)
R5-210077 Update of EN-DC inter-band configurations in clause 4.3.1 China Telecommunications
R5-210349 Addition of 3 band EN-DC Test Frequency (DC_1A-8A_n78A, DC_3A-8A_n78A) KT Corp.
R5-210350 Addition of 4 band EN-DC Test Frequency (DC_1A-3A-8A_n78A) KT Corp.
R5-210563 New note added for band n71 Ericsson
R5-210897 Correction to test frequency parameters for band n83 Huawei, Hisilicon
R5-210898 Correction to test frequency parameters for band n84 Huawei, Hisilicon
R5-211032 Correction test frequencies for CA_n261(2A) Ericsson
R5-211107 Corrections to subclauses in 38.508-1 with appropriate subclause level and heading styles ZTE Corporation
R5-211116 Update of 4.3.1.1.3.41.1 for test frequency of NR intra-band contiguous CA_n41C ZTE Corporation
R5-211118 Update of 4.3.1.1.3.78.1 for test frequency of NR intra-band contiguous CA_n78C ZTE Corporation
R5-211660 Update of EN-DC inter-band configurations in clause 4.3.1 China Telecommunications
R5-211661 Addition of 3 band EN-DC Test Frequency (DC_1A-8A_n78A, DC_3A-8A_n78A) KT Corp.
R5-211662 Addition of 4 band EN-DC Test Frequency (DC_1A-3A-8A_n78A) KT Corp.
5.3.2.1.2 Test environment for RF (Clauses 5)
R5-210599 Editorial correction on numbering of several Tables in 38.508-1 TTA
R5-210768 Update PDSCH-TimeDomainResourceAllocationList to consider coreset0 for Demod FR2 test cases Keysight Technologies UK Ltd
R5-210771 Correction in CodebookConfig for 4Tx RI Demod test cases Keysight Technologies UK Ltd
R5-210772 Alignment xOverhead setting with PDSCH RMCs for Demod FR2 testing Keysight Technologies UK Ltd
R5-210949 Updating the value of P-Max for EN-DC and NR SA test cases Huawei, HiSilicon
R5-211046 Update message content for PMI reporting test cases Keysight Technologies UK Ltd
R5-211090 Correction to the message contents for CQI reporting tests in 5.4.2.4 Anritsu
R5-211091 Correction to the message contents for PMI reporting tests in 5.4.2.5 Anritsu
R5-211663 Update PDSCH-TimeDomainResourceAllocationList to consider coreset0 for Demod FR2 test cases Keysight Technologies UK Ltd
R5-211664 Update message content for PMI reporting test cases Keysight Technologies UK Ltd
R5-211855 Updating the value of P-Max for EN-DC and NR SA test cases Huawei, HiSilicon
R5-211856 Correction to the message contents for CQI reporting tests in 5.4.2.4 Anritsu
R5-211857 Correction to the message contents for PMI reporting tests in 5.4.2.5 Anritsu
5.3.2.1.3 Test environment for RRM (Clause 7)
R5-210455 Update text in permitted test setups for RRM FR2 ROHDE & SCHWARZ
R5-210469 Changes to RRM default message contents ROHDE & SCHWARZ
R5-210477 Add SSB Index table for RRM with SECOND_SSB condition ROHDE & SCHWARZ
R5-210824 Number of control symbols for RRM tests with 240kHz SSB SCS ANRITSU LTD
R5-210872 Addition of default configuration of CSI-IM for RRM tests Huawei, HiSilicon
R5-210873 Correction of aperiodic CSI-RS reference configuration for RRM tests Huawei, HiSilicon
R5-211199 Specify CSI-SSB-ResourceSet for RRM ROHDE & SCHWARZ
R5-211665 Changes to RRM default message contents ROHDE & SCHWARZ
R5-211666 Add SSB Index table for RRM with SECOND_SSB condition ROHDE & SCHWARZ
R5-211667 Addition of default configuration of CSI-IM for RRM tests Huawei, HiSilicon
R5-211668 Specify CSI-SSB-ResourceSet for RRM ROHDE & SCHWARZ
5.3.2.1.4 Other clauses / Annexes
R5-210461 Editorial rework of the conditions for CSI-FrequencyOccupation ROHDE & SCHWARZ
R5-210462 Align TDD UL DL Common for RRM with TS 38.533 ROHDE & SCHWARZ
R5-210468 Add new SIB combination for RRM tests with single cell ROHDE & SCHWARZ
R5-210479 Correct reportOffsetList in CSI-ReportConfig ROHDE & SCHWARZ
R5-210480 Specify CSI-SSB-ResourceSet ROHDE & SCHWARZ
R5-211047 Clarification on the connection diagram for FR2 demod and RRM test cases Anritsu
R5-211089 Clarification on the initialBWP condition in PDCCH-ConfigCommon in 4.6.3 Anritsu
R5-211187 CR to 38.508-1 on larger quiet zone with grey box approach Keysight Technologies UK Ltd
R5-211669 Editorial rework of the conditions for CSI-FrequencyOccupation ROHDE & SCHWARZ
R5-211670 Align TDD UL DL Common for RRM with TS 38.533 ROHDE & SCHWARZ
R5-211671 Correct reportOffsetList in CSI-ReportConfig ROHDE & SCHWARZ
R5-211672 Specify CSI-SSB-ResourceSet ROHDE & SCHWARZ
R5-211673 Clarification on the connection diagram for FR2 demod and RRM test cases Anritsu
5.3.2.2 TS 38.508-2
R5-210078 Update of UE capabilities for EN-DC configurations China Telecommunications
R5-210353 Update of Table A.4.3.2B.2.3.2-2 (DC_1A-8A_n78A, DC_3A-8A_n78A) KT Corp.
R5-210354 Update of Table A.4.3.2B.2.3.3-2 (DC_1A-3A-8A_n78A) KT Corp.
R5-210483 Correction of core spec Ref. for 4 Rx antenna ports Capabilities CAICT
R5-210484 Addition of PUSCH HalfPi BPSK capability in FR2 CAICT
R5-210566 Update on manufacturer declaration required for Receiver Beam Peak Search Keysight Technologies UK Ltd
R5-210834 Introducing declaration of antenna size D for FR2 tests Anritsu
R5-211001 Update to NR FR1 2Rx-4Rx implementation Capabilities Bureau Veritas, Samsung
R5-211035 Introduction of UE capabilities for Rel-15 EN-DC FR1 configurations Ericsson
R5-211036 Introduction of UE capabilities for Rel-15 EN-DC FR2 configuration CA_n261(2A) Ericsson
R5-211108 Corrections to subclauses in 38.508-2 with appropriate subclause level and heading styles ZTE Corporation
R5-211182 Addition of PICS powerBoosting-pi2BPSK Google Inc.
R5-211195 CR to 38.508-2 on Antenna Aperture Declarations Keysight Technologies UK Ltd
R5-211251 CR to 38.508-2 on larger quiet zone with grey box approach Keysight Technologies UK Ltd
R5-211674 Introduction of UE capabilities for Rel-15 EN-DC FR2 configuration CA_n261(2A) Ericsson
R5-211849 CR to 38.508-2 on larger quiet zone with grey box approach Keysight Technologies UK Ltd
R5-211858 Update of UE capabilities for EN-DC configurations China Telecommunications
R5-211859 Update of Table A.4.3.2B.2.3.2-2 (DC_1A-8A_n78A, DC_3A-8A_n78A) KT Corp.
R5-211860 Update of Table A.4.3.2B.2.3.3-2 (DC_1A-3A-8A_n78A) KT Corp.
R5-211861 Introduction of UE capabilities for Rel-15 EN-DC FR1 configurations Ericsson
R5-211862 Addition of PICS powerBoosting-pi2BPSK Google Inc.
5.3.2.3 TS 38.509
R5-210519 Clarification of DRB identity in CLOSE UE TEST LOOP message in 38.509 Anritsu
R5-211675 Clarification of DRB identity in CLOSE UE TEST LOOP message in 38.509 Anritsu
5.3.2.4.1 Tx Requirements (Clause 6)
R5-210023 Clean up editors note Anritsu
R5-210291 Message exceptions definition in test case 6.2.2 Keysight Technologies UK Ltd
R5-210292 Clarifications for ON/OFF time mask for UL MIMO test case Keysight Technologies UK Ltd
R5-210485 Correction of test purpose for 6.3.2 and 6.3D.2 CAICT
R5-210486 Correction of test frequencies for NR band n28 30MHz test channel bandwidth of CA SUL and UL MIMO test cases in section 6 CAICT
R5-210723 Omitting of FR1 Rx cases with UL-MIMO on TDD bands Huawei, HiSilicon
R5-210793 Update of the test configuration for carrier leakage for SUL Huawei, HiSilicon
R5-210899 Removal of the highest SCS from test configuration for Tx spurious emissions for CA Huawei, Hisilicon
R5-210906 Updating A-SEM for MIMO testing for NS_04 Huawei, Hisilicon
R5-210907 Updating AMPR for MIMO test case for NS_35 Huawei, Hisilicon
R5-210908 Updating test applicability of test case 6.5D.2.4.2-UTRA ACLR for UL MIMO Huawei, Hisilicon
R5-210910 Correction to RB allocation start for test case 6.3D.4.2 Huawei, Hisilicon, Ericsson
R5-210911 Correction to test configuration table Test IDs for test case 6.5D.3.3 Huawei, Hisilicon
R5-210988 Change of RB allocation start in test case 6.3D.4.2 Ericsson
R5-210995 Update for 6.5.3.2 Spurious emission for UE co-existence_R15 Qualcomm Korea
R5-211002 Correction to TC6.4.2.5 EVM equalizer spectrum flatness for Pi2 BPSK Bureau Veritas
R5-211024 Update of Tx test procedure for PC2 UE on FDD bands due to maxUplinkDutyCycle Huawei, HiSilicon, Bureau Veritas
R5-211042 Spurious emissions for UE co-existence update to core specs Keysight Technologies UK Ltd
R5-211051 Introduction of additional Rel-15 EN-DC inter-band configurations to EN-DC MOP test case 6.2B.1.3 Ericsson
R5-211052 Introduction of dTIB,c for inter-band EN-DC Rel-15 EN-DC inter-band configurations Ericsson
R5-211092 Test ID separation to powerBoostPiBPSK 1 and 0 in Table 6.5.2.2.4.1-1 Anritsu
R5-211109 Corrections to subclauses in 38.521-1 with appropriate subclause level and heading styles ZTE Corporation
R5-211113 Corrections to reference figures for transmission bandwidth in FR1 ZTE Corporation
R5-211129 Introduction of dRIB,c for inter-band EN-DC Rel-15 EN-DC inter-band configurations Ericsson
R5-211176 Reference to measurement BW corrected in 6.5D.4 TX intermodulation test case Keysight Technologies UK Ltd
R5-211281 Correction to TC6.4.2.5 EVM equalizer spectrum flatness for Pi2 BPSK Bureau Veritas
R5-211608 Update of Tx test procedure for PC2 UE on FDD bands due to maxUplinkDutyCycle Huawei, HiSilicon, Bureau Veritas
R5-211613 Spurious emissions for UE co-existence update to core specs Keysight Technologies UK Ltd
R5-211676 Clarifications for ON/OFF time mask for UL MIMO test case Keysight Technologies UK Ltd
R5-211677 Correction of test frequencies for NR band n28 30MHz test channel bandwidth of CA SUL and UL MIMO test cases in section 6 CAICT
R5-211678 Updating AMPR for MIMO test case for NS_35 Huawei, Hisilicon
R5-211679 Correction to RB allocation start for test case 6.3D.4.2 Huawei, Hisilicon, Ericsson
5.3.2.4.2 Rx Requirements (Clause 7)
R5-210487 Editorial correction for error in Table 7.6.4.4.1-1 CAICT
R5-210488 Correction of test frequencies for NR band n28 30MHz test channel bandwidth of CA SUL and UL MIMO test cases in section 7 CAICT
R5-210902 Updating test case 7.3A.1_1 for 4Rx test requirements Huawei, Hisilicon
R5-210903 Editorial correction to clause 7.3.1 Huawei, Hisilicon
R5-210904 Updating test case 7.3C.2-Reference sensitivity power level for SUL Huawei, Hisilicon, CAICT
R5-210991 Update for 7.3.2 Reference sensitivity power level Qualcomm Korea
R5-211680 Correction of test frequencies for NR band n28 30MHz test channel bandwidth of CA SUL and UL MIMO test cases in section 7 CAICT
R5-211681 Updating test case 7.3C.2-Reference sensitivity power level for SUL Huawei, Hisilicon, CAICT
5.3.2.4.3 Clauses 1-5 / Annexes
R5-210290 Clarification of uplink power measurement uncertainty in test case 6.3.4.3 Keysight Technologies UK Ltd
R5-210802 Update of clause 5 to R15 TS 38.521-1 China Unicom
R5-211048 Correction to test tolerance for FR1 blocking tests Anritsu
R5-211682 Update of clause 5 to R15 TS 38.521-1 China Unicom
5.3.2.5.1 Tx Requirements (Clause 6)
R5-210293 New FR2 Common Uplink Configurations definition in section 6 Keysight Technologies UK Ltd
R5-210297 Editorial corrections in Occupied bandwidth test procedure Keysight Technologies UK Ltd
R5-210489 Correction of test purpose for 6.3.2 Transmit OFF power CAICT
R5-210490 Addition of new test case 6.3D.2 Transmit OFF power for UL MIMO CAICT
R5-210543 FR2 UL CA Frequency error test cases update Keysight Technologies UK Ltd
R5-210547 FR2 MPR, ACLR and SEM test cases update as per TP analysis update Keysight Technologies UK Ltd, Ericsson, CAICT
R5-210724 Omitting of FR2 Rx cases with UL-MIMO on TDD bands Huawei, HiSilicon
R5-210727 Addition of Inner_partial allocation in general section and a few test cases Huawei, HiSilicon, Keysight
R5-210728 Correction of parameter configuration for open loop power control Huawei, HiSilicon
R5-210729 Removing test condition of extreme voltage Huawei, HiSilicon
R5-210730 Cleaning up of FR2 test specification Huawei, HiSilicon
R5-210893 Update of TX Test Cases for UL MIMO in FR2 Sporton
R5-211028 Addition of new test case 6.2A.1.1.4 UE maximum output power - EIRP and TRP for 5UL CA KTL
R5-211029 Addition of new test case 6.2A.1.1.5 UE maximum output power - EIRP and TRP for 6UL CA KTL
R5-211030 Addition of new test case 6.2A.1.1.6 UE maximum output power - EIRP and TRP for 7UL CA KTL
R5-211031 Addition of new test case 6.2A.1.1.7 UE maximum output power - EIRP and TRP for 8UL CA KTL
R5-211093 Correction to ACLR relaxation value in TC 6.5.2.3 Anritsu
R5-211094 Correction to assumption of aggregated channel bandwidth in TC 6.5A.2.2 Anritsu
R5-211095 Correction to definition of power control window size in FR2 relative power tolerance in TC 6.3.4.3 Anritsu
R5-211097 Definition of relaxation value of spurious emissions UE co-existence in TC 6.5.3.2 Anritsu
R5-211110 Corrections to subclauses in 38.521-2 with appropriate subclause level and heading styles ZTE Corporation
R5-211114 Corrections to reference figures for transmission bandwidth configuration in FR2 ZTE Corporation
R5-211231 FR2 Tx additional spurious emission test case updates Qualcomm Finland RFFE Oy
R5-211683 Editorial corrections in Occupied bandwidth test procedure Keysight Technologies UK Ltd
R5-211684 FR2 UL CA Frequency error test cases update Keysight Technologies UK Ltd
R5-211685 Addition of Inner_partial allocation in general section and a few test cases Huawei, HiSilicon, Keysight
R5-211686 Correction of parameter configuration for open loop power control Huawei, HiSilicon
R5-211688 Addition of new test case 6.2A.1.1.4 UE maximum output power - EIRP and TRP for 5UL CA KTL
R5-211689 Addition of new test case 6.2A.1.1.5 UE maximum output power - EIRP and TRP for 6UL CA KTL
R5-211690 Addition of new test case 6.2A.1.1.6 UE maximum output power - EIRP and TRP for 7UL CA KTL
R5-211691 Addition of new test case 6.2A.1.1.7 UE maximum output power - EIRP and TRP for 8UL CA KTL
R5-211692 Corrections to reference figures for transmission bandwidth configuration in FR2 ZTE Corporation
R5-211863 FR2 MPR, ACLR and SEM test cases update as per TP analysis update Keysight Technologies UK Ltd, Ericsson, CAICT
R5-211864 Cleaning up of FR2 test specification Huawei, HiSilicon
R5-211865 Update of TX Test Cases for UL MIMO in FR2 Sporton
R5-211866 Correction to definition of power control window size in FR2 relative power tolerance in TC 6.3.4.3 Anritsu
R5-211867 FR2 Tx additional spurious emission test case updates Qualcomm Finland RFFE Oy
R5-211921 Correction to ACLR relaxation value in TC 6.5.2.3 Anritsu
5.3.2.5.2 Rx Requirements (Clause 7)
R5-210294 ACS FR2 test case update Keysight Technologies UK Ltd
R5-210295 IBB FR2 test case update Keysight Technologies UK Ltd
R5-210491 Correction of test applicability and test description for 7.4 Maximum input level CAICT
R5-210492 Addition of new test cases for 7.4A Maximum input level for CA CAICT
R5-210493 Addition of new test case 7.4D Maximum input level for UL MIMO CAICT
R5-211096 Correction to editors note about beam peak direction Anritsu
R5-211868 ACS FR2 test case update Keysight Technologies UK Ltd
R5-211869 IBB FR2 test case update Keysight Technologies UK Ltd
5.3.2.5.3 Clauses 1-5 / Annexes
R5-210296 MU and TT definition for REFSENS FR2 CA test cases Keysight Technologies UK Ltd
R5-210494 Removal of brackets for MU of EIS spherical coverage CAICT
R5-210495 Correction of Annex P for Modified MPR behaviour CAICT
R5-210496 Correction of definition for EIS CAICT
R5-210565 Update of waveform to be used during Rx peam peak search in Annex K.1.2 Keysight Technologies UK Ltd
R5-210731 Adding definition of FR2a, FR2b and FR2c in general section Huawei, HiSilicon
R5-210732 Cleaning up of Annex K Huawei, HiSilicon
R5-211098 Update FR2 MU and TT in 38.521-2 Anritsu
R5-211126 Update of 5.5A.2 for corrections to configurations for intra-band non-contiguous CA ZTE Corporation
R5-211188 CR to 38.521-2 on larger quiet zone with grey box approach Keysight Technologies UK Ltd
R5-211190 CR to 38.521-2 on PC1 Measurement Grid MUs Keysight Technologies UK Ltd
R5-211265 Update of ETC MTSU ROHDE & SCHWARZ
R5-211267 Update of Annex F for test case 7.3.4 ROHDE & SCHWARZ
R5-211693 Update of Annex F for test case 7.3.4 ROHDE & SCHWARZ
R5-211922 MU and TT definition for REFSENS FR2 CA test cases Keysight Technologies UK Ltd
R5-211923 Update FR2 MU and TT in 38.521-2 Anritsu
R5-211924 CR to 38.521-2 on PC1 Measurement Grid MUs Keysight Technologies UK Ltd
R5-211925 Update of ETC MTSU ROHDE & SCHWARZ
5.3.2.6.1 Tx Requirements (Clause 6)
R5-210117 Editorial addition of editors notes in 6.3B.8.1.4, 6.3B.8.2.4 and 6.3B.8.3.4 CMCC, Qualcomm, Bureau Veritas, Ericsson, R&S, Huawei, CAICT, Apple
R5-210298 Spectrum emissions mask for intra-band non-contiguous EN-DC Test Definition Keysight Technologies UK Ltd
R5-210301 Completion of OBW intra-band non-contiguous test 6.5B.1.2 Keysight Technologies UK Ltd
R5-210302 Addition of new test case 6.5B.1.4D OBW for inter-band EN-DC FR2 UL MIMO Keysight Technologies UK Ltd
R5-210303 ACLR for intra-band non-contiguous EN-DC Test Definition Keysight Technologies UK Ltd
R5-210386 Update Test description of 6.5B.1.1 Guangdong OPPO Mobile Telecom.
R5-210387 Correction to EN-DC OoB emissions ROHDE & SCHWARZ
R5-210415 Addition of new test case 6.4B.2.4.3_1.1 In-band Emissions for inter-band EN-DC including FR2 with 3 CCs LG Electronics
R5-210416 Addition of new test case 6.4B.2.4.3_1.2 In-band Emissions for inter-band EN-DC including FR2 with 4 CCs LG Electronics
R5-210417 Addition of new test case 6.4B.2.4.3_1.3 In-band Emissions for inter-band EN-DC including FR2 with 5 CCs LG Electronics
R5-210497 Correction of test frequencies for NR band n28 30MHz test channel bandwidth of 6.2B.1.3 CAICT
R5-210498 Addition of editor note to the incomplete test cases CAICT
R5-210499 Correction of test applicability of 6.5B.5.3 CAICT
R5-210500 Correction of test configuration tables in section 6 CAICT
R5-210545 EN-DC FR2 UL CA Frequency error test cases update Keysight Technologies UK Ltd
R5-210618 CR for 38.521-3: Update Editors Notes in Power Control tests Apple Portugal
R5-210725 Omitting of NSA Rx cases with UL-MIMO on TDD bands Huawei, HiSilicon
R5-210736 Correcting EN-DC A-MPR test requirements for non-overlapping test points Huawei, HiSilicon
R5-210737 Correction of test requirements for EN-DC configured output power Huawei, HiSilicon, Anritsu
R5-210909 Editorial correction to test case 6.2B.4.1.3 Huawei, Hisilicon
R5-210944 Removing Editor note in 6.2B.4 configured transmitted power for EN-DC within FR1 Huawei, HiSilicon
R5-210947 Removing the reconfiguration of TDD-config across EN-DC Tx test cases Huawei, HiSilicon
R5-210951 Correction to the TDM pattern configuration for EN-DC Tx test cases Huawei, HiSilicon
R5-210987 Update for 6.5B.3.3.2 Spurious emission band UE co-existence Qualcomm Korea
R5-211053 Introduction of Rel-15 EN-DC configuration DC_8A_n77A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211054 Introduction of Rel-15 EN-DC configuration DC_11A_n77A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211055 Introduction of Rel-15 EN-DC configuration DC_11A_n78A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211056 Introduction of Rel-15 EN-DC configuration DC_11A_n79A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211057 Introduction of Rel-15 EN-DC configuration DC_25A_n41A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211058 Introduction of Rel-15 EN-DC configuration DC_26A_n41A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211059 Introduction of Rel-15 EN-DC configuration DC_26A_n77A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211060 Introduction of Rel-15 EN-DC configuration DC_26A_n78A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211061 Introduction of Rel-15 EN-DC configuration DC_26A_n79A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211062 Introduction of Rel-15 EN-DC configuration DC_41A_n77A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211063 Introduction of Rel-15 EN-DC configuration DC_41A_n78A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211099 Correction to editors note about number of E-UTRA carriers Anritsu
R5-211100 Correction to MOP and MPR test procedures for PC2 in TC 6.2B.1.3 and 6.2B.2.1 Anritsu
R5-211111 Corrections to subclauses in 38.521-3 with appropriate subclause level and heading styles ZTE Corporation
R5-211694 Spectrum emissions mask for intra-band non-contiguous EN-DC Test Definition Keysight Technologies UK Ltd
R5-211695 ACLR for intra-band non-contiguous EN-DC Test Definition Keysight Technologies UK Ltd
R5-211696 Update Test description of 6.5B.1.1 Guangdong OPPO Mobile Telecom.
R5-211697 EN-DC FR2 UL CA Frequency error test cases update Keysight Technologies UK Ltd
R5-211698 Correction of test requirements for EN-DC configured output power Huawei, HiSilicon, Anritsu
R5-211699 Introduction of Rel-15 EN-DC configuration DC_8A_n77A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211700 Introduction of Rel-15 EN-DC configuration DC_11A_n77A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211701 Introduction of Rel-15 EN-DC configuration DC_11A_n78A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211702 Introduction of Rel-15 EN-DC configuration DC_11A_n79A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211703 Introduction of Rel-15 EN-DC configuration DC_25A_n41A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211704 Introduction of Rel-15 EN-DC configuration DC_26A_n41A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211705 Introduction of Rel-15 EN-DC configuration DC_26A_n77A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211706 Introduction of Rel-15 EN-DC configuration DC_26A_n78A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211707 Introduction of Rel-15 EN-DC configuration DC_26A_n79A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211708 Introduction of Rel-15 EN-DC configuration DC_41A_n77A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211709 Introduction of Rel-15 EN-DC configuration DC_41A_n78A to spurious emission test case 6.5B.3.3.2 Ericsson
R5-211852 Update for 6.5B.3.3.2 Spurious emission band UE co-existence Qualcomm Korea
R5-211870 Editorial addition of editors notes in 6.3B.8.1.4, 6.3B.8.2.4 and 6.3B.8.3.4 CMCC, Qualcomm, Bureau Veritas, Ericsson, R&S, Huawei, CAICT, Apple
R5-211871 Correcting EN-DC A-MPR test requirements for non-overlapping test points Huawei, HiSilicon
R5-211872 Correction to the TDM pattern configuration for EN-DC Tx test cases Huawei, HiSilicon
R5-211873 Correction to MOP and MPR test procedures for PC2 in TC 6.2B.1.3 and 6.2B.2.1 Anritsu
5.3.2.6.2 Rx Requirements (Clause 7)
R5-210299 Correction of LTE frequency for 19-n79 combo in 7.3B.2.3 Keysight Technologies UK Ltd, Ericsson
R5-210300 Correction in Refsens test case 7.3B.2.3_1.1 for DC_1A-7A_n78A combo Keysight Technologies UK Ltd, Ericsson
R5-210351 Correction of MSD test point on Table 7.3B.2.0.3.5.2-1 DC_1A-8A_n78A KT Corp.
R5-210352 Update of 7.3B.2.3_1.1 RefSens DC_3A-8A_n78A KT Corp.
R5-210358 Addition of new test case 7.3B.4 for EIS Spherical Coverage ROHDE & SCHWARZ
R5-210501 Completion of 7.6B.2.3_1.3 Inband blocking for EN-DC within FR1 5 CCs CAICT
R5-210502 Correction of test frequencies for NR band n28 30MHz test channel bandwidth of 7.6B.3.3 CAICT
R5-210503 Editorial correction for errors in 7.6B.4.3_1 CAICT
R5-210504 Correction of test configuration tables in section 7 CAICT
R5-210517 Update to EN-DC Reference Sensitivity ROHDE & SCHWARZ
R5-210738 Clarification of tested Rx antenna numbers on E-UTRA band Huawei, HiSilicon, Bureau Veritas
R5-210989 Update for 7.3B.2.0 Minimum Conformance Requirements of Reference sensitivity for EN-DC Qualcomm Korea
R5-211000 Correction to EN-DC Wideband Intermodulation tests Bureau Veritas, Anritsu
R5-211010 Update of reference sensitivity for intra-band contiguous EN-DC Huawei, HiSilicon
R5-211011 Update of reference sensitivity for intra-band non-contiguous EN-DC Huawei, HiSilicon
R5-211012 Update of reference sensitivity for inter-band 2CC EN-DC Huawei, HiSilicon
R5-211013 Correction to refsens test requirements for DC_1A-7A_n78A Huawei, HiSilicon, Keysight Technologies UK Ltd, Ericsson
R5-211014 Adding in-gap tests to ACS for intra-band non-contiguous EN-DC Huawei, HiSilicon
R5-211016 Update of test configuration for inter-band 2CC EN-DC configurations affected by reference sensitivity exceptions Huawei, HiSilicon
R5-211017 Update of test coverage for reference sensitivity for 3CC EN-DC Huawei, HiSilicon
R5-211101 Correction to test points of FR1 EN-DC intermodulation with 3CC in TC 7.8B.2.6 Anritsu
R5-211137 Update of 2CC refsens test case 7.3B.2.3 Ericsson
R5-211138 Update of 3CC refsens test case 7.3B.2.3_1.1 Ericsson
R5-211139 Correction of configurations not to be tested in 4CC refsens test case 7.3B.2.3_1.2 Ericsson
R5-211141 Addition of DC_8A_n77A in test case 7.3B.2.3 Ericsson
R5-211143 Addition of DC_11A_n79A in test case 7.3B.2.3 Ericsson
R5-211145 Addition of DC_26A_n41A in test case 7.3B.2.3 Ericsson
R5-211147 Addition of DC_26A_n77A and DC_26A_n78A in test case 7.3B.2.3 Ericsson
R5-211149 Addition of DC_26A_n79A in test case 7.3B.2.3 Ericsson
R5-211151 Addition of DC_41A_n77A and DC_41A_n78A in test case 7.3B.2.3 Ericsson
R5-211687 Correction to test points of FR1 EN-DC intermodulation with 3CC in TC 7.8B.2.6 Anritsu
R5-211710 Correction of MSD test point on Table 7.3B.2.0.3.5.2-1 DC_1A-8A_n78A KT Corp.
R5-211711 Update of 7.3B.2.3_1.1 RefSens DC_3A-8A_n78A KT Corp.
R5-211712 Addition of new test case 7.3B.4 for EIS Spherical Coverage ROHDE & SCHWARZ
R5-211713 Editorial correction for errors in 7.6B.4.3_1 CAICT
R5-211714 Correction of test configuration tables in section 7 CAICT
R5-211715 Clarification of tested Rx antenna numbers on E-UTRA band Huawei, HiSilicon, Bureau Veritas
R5-211854 Correction to EN-DC Wideband Intermodulation tests Bureau Veritas, Anritsu
R5-211874 Correction of LTE frequency for 19-n79 combo in 7.3B.2.3 Keysight Technologies UK Ltd, Ericsson
R5-211875 Update to EN-DC Reference Sensitivity ROHDE & SCHWARZ
R5-211876 Update of reference sensitivity for intra-band non-contiguous EN-DC Huawei, HiSilicon
R5-211877 Update of reference sensitivity for inter-band 2CC EN-DC Huawei, HiSilicon
R5-211878 Correction to refsens test requirements for DC_1A-7A_n78A Huawei, HiSilicon, Keysight Technologies UK Ltd, Ericsson
R5-211879 Update of test configuration for inter-band 2CC EN-DC configurations affected by reference sensitivity exceptions Huawei, HiSilicon
R5-211880 Update of 2CC refsens test case 7.3B.2.3 Ericsson
R5-211881 Update of 3CC refsens test case 7.3B.2.3_1.1 Ericsson
R5-211882 Correction of configurations not to be tested in 4CC refsens test case 7.3B.2.3_1.2 Ericsson
R5-211883 Addition of DC_8A_n77A in test case 7.3B.2.3 Ericsson
R5-211884 Addition of DC_11A_n79A in test case 7.3B.2.3 Ericsson
R5-211885 Addition of DC_26A_n41A in test case 7.3B.2.3 Ericsson
R5-211886 Addition of DC_26A_n77A and DC_26A_n78A in test case 7.3B.2.3 Ericsson
R5-211887 Addition of DC_26A_n79A in test case 7.3B.2.3 Ericsson
R5-211888 Addition of DC_41A_n77A and DC_41A_n78A in test case 7.3B.2.3 Ericsson
5.3.2.6.3 Clauses 1-5 / Annexes
R5-210305 MU definition for UE MOP for Inter-Band EN-DC including FR2 (3CCs) Keysight Technologies UK Ltd
R5-210306 MU and TT defintion for REFSENS EN-DC including FR2 up to 5CCs Keysight Technologies UK Ltd
R5-210548 Default message exceptions for LTE carriers in EN-DC Keysight Technologies UK Ltd
R5-211004 Update to EN-DC R15 Configuration information in clause 5 Bureau Veritas
R5-211102 Update FR2 MU and TT in 38.521-3 Anritsu
R5-211926 MU definition for UE MOP for Inter-Band EN-DC including FR2 (3CCs) Keysight Technologies UK Ltd
R5-211927 MU and TT defintion for REFSENS EN-DC including FR2 up to 5CCs Keysight Technologies UK Ltd
R5-211928 Update FR2 MU and TT in 38.521-3 Anritsu
5.3.2.7.1 Conducted Demod Performance and CSI Reporting Requirements (Clauses 5&6)
R5-210521 Correction to test applicability for LTE-NR coexistence performance test cases Anritsu
R5-210524 Correction to test time for Subband CQI test case Anritsu
R5-210525 Correction to DCI bit size for PDSCH Type B performance and LTE coexistence tests Anritsu
R5-210526 Correction to LB setup DRB in CLOSE UE TEST LOOP message Anritsu
R5-210773 Correction in 6.4.2.1_1 test requirements Keysight Technologies UK Ltd
R5-210869 Correction to Test Purpose of PDCCH test cases Huawei, HiSilicon
R5-210870 Correction to NR test case 6.2.2.1.2.1 Huawei, HiSilicon
R5-210993 Editorial, cleanup of some references in 38.521-4 Ericsson
R5-211716 Correction to DCI bit size for PDSCH Type B performance and LTE coexistence tests Anritsu
R5-211717 Correction to LB setup DRB in CLOSE UE TEST LOOP message Anritsu
R5-211718 Correction to NR test case 6.2.2.1.2.1 Huawei, HiSilicon
5.3.2.7.2 Radiated Demod Performance and CSI Reporting Requirements (Clauses 7&8)
R5-210520 Correction to SR config for TDD PDSCH Type A performance test cases Anritsu
R5-210522 Correction to wideband CQI reporting under fading test cases Anritsu
R5-210523 Addition of 8.3.2.2.1 2Rx TDD FR2 Single PMI with 2TX TypeI-SinglePanel Codebook Anritsu
R5-210770 Update message content in test case 7.3.2.2.2 Keysight Technologies UK Ltd
R5-211084 Update to FR2 PDSCH test case for maximum testable SNR Qualcomm Wireless GmbH
R5-211085 Update to FR2 CQI reporting test case for maximum testable SNR Qualcomm Wireless GmbH
R5-211260 Update of FR2 demod test cases ROHDE & SCHWARZ
R5-211929 Update of FR2 demod test cases ROHDE & SCHWARZ
5.3.2.7.3 Interworking Demod Performance and CSI Reporting Requirements (Clauses 9&10)
R5-210871 Correction to NR TC 9.4B.1.1 Huawei, HiSilicon
R5-211851 Correction to NR TC 9.4B.1.1 Huawei, HiSilicon
5.3.2.7.4 Clauses 1-4 / Annexes
R5-210318 Correction to E-UTRA link setup for NSA testing ROHDE & SCHWARZ
R5-210868 Correction to Table F.1.1.2-2 for FR1 test cases Huawei, HiSilicon
R5-211081 Update to downlink physical channel EPRE level for LTE-NR coex scenario Qualcomm Wireless GmbH
R5-211719 Correction to E-UTRA link setup for NSA testing ROHDE & SCHWARZ
5.3.2.8 TS 38.522
R5-210476 Editorial: correct title of PRACH test cases to match RRM work plan - Applicability ROHDE & SCHWARZ
R5-210505 Correction of applicability definitions for PUSCH HalfPi BPSK related test cases CAICT
R5-210506 Correction of applicability definitions for long DRX cycle related test cases CAICT
R5-210726 Updating applicability of FR1 Rx cases with UL-MIMO to only FDD bands Huawei, HiSilicon
R5-211003 Update to applicability spec for 5G test cases Bureau Veritas, ROHDE & SCHWARZ, TTA, KTL, Ericsson, Huawei, HiSilicon, CAICT, Google Inc., Anritsu
R5-211183 Correction PICS condition of test case 6.4.2.5 Google Inc.
R5-211200 Applicability for 5.4.3.1 ROHDE & SCHWARZ
R5-211201 Applicability for FR2 iRAT ROHDE & SCHWARZ
R5-211202 Applicability for 4.5.7.1 ROHDE & SCHWARZ
R5-211720 Correction of applicability definitions for PUSCH HalfPi BPSK related test cases CAICT
R5-211721 Correction PICS condition of test case 6.4.2.5 Google Inc.
R5-211853 Update to applicability spec for 5G test cases Bureau Veritas, ROHDE & SCHWARZ, TTA, KTL, Ericsson, Huawei, HiSilicon, CAICT, Google Inc., Anritsu
5.3.2.9.1 EN-DC with all NR cells in FR1 (Clause 4)
R5-210134 Update of first preamble power for EN-DC TC 4.3.2.2.1 and 4.3.2.2.2 MediaTek Inc.
R5-210174 Update of Scell activation and CSI reporting time for EN-DC TC 4.5.3.1 MediaTek Inc.
R5-210179 Update of PRACH configuration for EN-DC TC 4.5.5.3 and 4.5.5.4 MediaTek Inc.
R5-210436 Complete RRM 4.5.7.1 including TT analysis results ROHDE & SCHWARZ
R5-210442 Update TT results for SS-RSRP measurement accuracy test cases chapter 4 ROHDE & SCHWARZ
R5-210446 Update TT results for SS-RSRQ measurement accuracy test cases chapter 4 ROHDE & SCHWARZ
R5-210458 Correction RLM config for event triggered test cases ROHDE & SCHWARZ
R5-210459 Correction EN-DC FR1 timing tests ROHDE & SCHWARZ
R5-210460 Corrections to 5.4.1.1 ROHDE & SCHWARZ
R5-210467 Corrections to 4.3.2.2.2 ROHDE & SCHWARZ
R5-210471 Clarification on SSB Index to use in the PUxCH-PowerControl for RRM tests with more than one SSB - EN-DC ROHDE & SCHWARZ
R5-210472 Editorial: correct title of PRACH test cases to match RRM work plan - EN-DC FR1 ROHDE & SCHWARZ
R5-210507 Correction of test applicability for long DRX cycle related test cases in section 4 CAICT
R5-210527 Clarification of SNR for 4RX UE in RLM Test Cases Anritsu
R5-210529 Correction to Interruptions during measurements on deactivated NR SCC test cases Anritsu
R5-210530 Correction to message configuration for NSA CSI-RS-based RLM RS test cases Anritsu
R5-210533 Correction to 4.5.1.2 and 6.5.1.2 PDCCH Aggregation Level Anritsu
R5-210536 Correction to L1-RSRP test cases Anritsu
R5-210538 Update of DRX configuration in FR1 Event-triggered Test cases Anritsu
R5-210606 RACH-Config Correction for Non-Contention based Random Access test case 4.3.2.2.2 Keysight Technologies UK Ltd
R5-210607 Correction in 4.7.3.2.1 test parameters Keysight Technologies UK Ltd
R5-210608 Correction in 4.5.2.1 and 4.5.2.2 test procedure Keysight Technologies UK Ltd
R5-210795 Clarification of BWP1 and BWP2 in 4.6.1.3, 4.6.1.4, 4.6.1.6 MediaTek Inc.
R5-210821 Update Test Tolerance for FR1 RLM Test Cases ANRITSU LTD
R5-210851 Update of FR1 TT for 4.5.5.1 and 4.5.5.2 SSB based LR Huawei, HiSilicon
R5-210852 Update of FR1 TT for 4.5.5.3 and 4.5.5.4 CSI-RS based LR Huawei, HiSilicon
R5-210853 Correction to 4.6.4.3 and 4.6.4.4 L1-RSRP reporting delay Huawei, HiSilicon
R5-210854 Correction to EN-DC radio link monitoring Huawei, HiSilicon
R5-210855 Update of 4.5.3.1 SCell activation and deactivation Huawei, HiSilicon
R5-210954 Update to 4.5.4.1 EN-DC FR1 UE UL carrier RRC reconfiguration delay Qualcomm Technologies Netherlands B.V.
R5-210955 Update to 4.7.5.1 EN-DC FR1 SFTD measurement accuracy Qualcomm Technologies Netherlands B.V.
R5-211211 Correction of applied TT for EN-DC FR1 L1-RSRP measurement test cases Ericsson
R5-211255 Clarification of BWP1 and BWP2 in 4.6.1.3, 4.6.1.4, 4.6.1.6 Keysight Technologies UK Ltd
R5-211614 Update of Scell activation and CSI reporting time for EN-DC TC 4.5.3.1 MediaTek Inc.
R5-211615 Complete RRM 4.5.7.1 including TT analysis results ROHDE & SCHWARZ
R5-211616 Update Test Tolerance for FR1 RLM Test Cases ANRITSU LTD
R5-211617 Correction to EN-DC radio link monitoring Huawei, HiSilicon
R5-211618 Update of 4.5.3.1 SCell activation and deactivation Huawei, HiSilicon
R5-211619 Update to 4.5.4.1 EN-DC FR1 UE UL carrier RRC reconfiguration delay Qualcomm Technologies Netherlands B.V.
R5-211620 Update to 4.7.5.1 EN-DC FR1 SFTD measurement accuracy Qualcomm Technologies Netherlands B.V.
R5-211621 Correction of applied TT for EN-DC FR1 L1-RSRP measurement test cases Ericsson
R5-211722 Correction EN-DC FR1 timing tests ROHDE & SCHWARZ
R5-211723 Corrections to 5.4.1.1 ROHDE & SCHWARZ
R5-211724 Clarification of SNR for 4RX UE in RLM Test Cases Anritsu
R5-211725 Correction in 4.7.3.2.1 test parameters Keysight Technologies UK Ltd
5.3.2.9.2 EN-DC with at least 1 NR Cell in FR2 (Clause5)
R5-210176 Update of Scell activation and CSI reporting time for EN-DC TC 5.5.3.1 MediaTek Inc.
R5-210180 Update of PRACH configuration for EN-DC TC 5.5.5.x MediaTek Inc.
R5-210432 Update 5.4.3.1 with TT analysis results ROHDE & SCHWARZ
R5-210508 Correction of test applicability for long DRX cycle related test cases in section 5 CAICT
R5-210816 Update of FR2 Tx Timing Test case 5.4.1.1 Test Tolerances ANRITSU LTD
R5-210952 Update to 5.4.1.1 EN-DC FR2 UE transmit timing accuracy Qualcomm Technologies Netherlands B.V.
R5-210953 Update to 5.4.3.1 EN-DC FR2 timing advance adjustment accuracy Qualcomm Technologies Netherlands B.V.
R5-211213 Correction of EN-DC FR2 inter-freq measurement test case 5.6.2.1 including TT Ericsson
R5-211214 Correction of EN-DC FR2 inter-freq measurement test case 5.6.2.3 including TT Ericsson
R5-211601 Update to 5.4.3.1 EN-DC FR2 timing advance adjustment accuracy Qualcomm Technologies Netherlands B.V.
R5-211603 Update to 5.4.1.1 EN-DC FR2 UE transmit timing accuracy Qualcomm Technologies Netherlands B.V.
R5-211622 Update 5.4.3.1 with TT analysis results ROHDE & SCHWARZ
R5-211623 Correction of EN-DC FR2 inter-freq measurement test case 5.6.2.1 including TT Ericsson
R5-211624 Correction of EN-DC FR2 inter-freq measurement test case 5.6.2.3 including TT Ericsson
5.3.2.9.3 NR Standalone in FR1 (Clause 6)
R5-210135 Update of first preamble power for SA TC 6.3.2.2.1 and 6.3.2.2.2 MediaTek Inc.
R5-210136 Update of UE initial state for SA RLM TC 6.5.1.x MediaTek Inc.
R5-210138 Update of cell frequency for TC 6.7.2.2.2 MediaTek Inc.
R5-210171 Editorial update of SS-RSRP for TC 6.7.1.2.1 MediaTek Inc.
R5-210172 Update of RRC message for TC 6.3.1.4, 6.3.1.5 and 6.3.2.3.2 MediaTek Inc.
R5-210173 Update of RRC message for TC 6.4.3.1 and 6.5.2.1 MediaTek Inc.
R5-210175 Update of CSI reporting time for SA TC 6.5.3.1 MediaTek Inc.
R5-210181 Update of PRACH configuration for SA TC 6.5.5.3 and 6.5.5.4 MediaTek Inc.
R5-210443 Update TT results for SS-RSRP measurement accuracy test cases chapter 6 ROHDE & SCHWARZ
R5-210447 Update TT results for SS-RSRQ measurement accuracy test cases chapter 6 ROHDE & SCHWARZ
R5-210450 Update TT results for 6.3.1.1 ROHDE & SCHWARZ
R5-210464 Corrections NR SA FR1 timing test cases ROHDE & SCHWARZ
R5-210465 Editorial correction of title of clause 6 ROHDE & SCHWARZ
R5-210466 Corrections to 6.3.2.2.1 and 6.3.2.2.2 ROHDE & SCHWARZ
R5-210470 Clarification on SSB Index to use in the PUxCH-PowerControl for RRM tests with more than one SSB ROHDE & SCHWARZ
R5-210473 Editorial: correct title of PRACH test cases to match RRM work plan - SA FR1 ROHDE & SCHWARZ
R5-210509 Correction of test applicability for long DRX cycle related test cases in section 6 CAICT
R5-210528 Correction to test procedure in test case 6.5.1.4 Anritsu
R5-210531 Correction to NR SA RLM out-of-sync test cases Anritsu
R5-210532 Correction to NR SA FR1 RRC Re-establishment test cases Anritsu
R5-210534 Correction to NR SA FR1 E-UTRA RRC connection release with redirection Anritsu
R5-210535 Correction to FR1 NSA SS-SINR measurement test cases Anritsu
R5-210537 Correction to the procedure to add a step for establishing SRB2 and DRB Anritsu
R5-210601 Clarification of BWP1 and BWP2 in 6.6.1.3, 6.6.1.4, 6.6.1.6 Keysight Technologies UK Ltd
R5-210605 RACH-Config Correction for Non-Contention based Random Access test case 6.3.2.2.2 Keysight Technologies UK Ltd
R5-210612 Editorial correction in 6.5.2.1 Keysight Technologies UK Ltd
R5-210614 Correction in 6.1.2.2 test procedure Keysight Technologies UK Ltd
R5-210856 Correction to SA radio link monitoring Huawei, HiSilicon
R5-210857 Update of FR1 TT for 6.5.5.1 and 6.5.5.2 SSB based LR Huawei, HiSilicon
R5-210858 Update of FR1 TT for 6.5.5.3 and 6.5.5.4 CSI-RS based LR Huawei, HiSilicon
R5-210859 Correction to NR TC 6.6.3.2-Inter-RAT DRX Huawei, HiSilicon
R5-210860 Correction to 6.6.4.3 and 6.6.4.4 L1-RSRP reporting delay Huawei, HiSilicon
R5-210861 Update of 6.5.1.2 and 6.5.1.4 SSB based RLM Huawei, HiSilicon
R5-210862 Update of 6.5.2 interruption during measurement on deactivated SCC Huawei, HiSilicon, Keysight
R5-210863 Update of 6.5.3.1 SCell activation and deactivation Huawei, HiSilicon
R5-210956 Update to 6.3.2.2.1 Contention based random access test in FR1 for NR standalone Qualcomm Technologies Netherlands B.V.
R5-210957 Update to 6.3.2.2.2 Non-Contention based random access test in FR1 for NR standalone Qualcomm Technologies Netherlands B.V.
R5-210958 Update to 6.5.2.1 NR SA FR1 interruptions during measurements on deactivated NR SCC Qualcomm Technologies Netherlands B.V.
R5-210959 Update to 6.5.4.1 NR SA FR1 UE UL carrier RRC reconfiguration delay Qualcomm Technologies Netherlands B.V.
R5-210960 Update to 6.6.3.1 NR SA FR1 - E-UTRAN event-triggered reporting in non-DRX Qualcomm Technologies Netherlands B.V.
R5-210961 Update to 6.6.3.2 NR SA FR1 - E-UTRAN event-triggered reporting in DRX Qualcomm Technologies Netherlands B.V.
R5-211212 Correction of applied TT for SA FR1 L1-RSRP measurement test cases Ericsson
R5-211612 Update of 6.5.2 interruption during measurement on deactivated SCC Huawei, HiSilicon, Keysight
R5-211625 Update of CSI reporting time for SA TC 6.5.3.1 MediaTek Inc.
R5-211626 Correction to SA radio link monitoring Huawei, HiSilicon
R5-211627 Update to 6.3.2.2.1 Contention based random access test in FR1 for NR standalone Qualcomm Technologies Netherlands B.V.
R5-211628 Update to 6.3.2.2.2 Non-Contention based random access test in FR1 for NR standalone Qualcomm Technologies Netherlands B.V.
R5-211629 Update to 6.5.2.1 NR SA FR1 interruptions during measurements on deactivated NR SCC Qualcomm Technologies Netherlands B.V.
R5-211630 Update to 6.6.3.1 NR SA FR1 - E-UTRAN event-triggered reporting in non-DRX Qualcomm Technologies Netherlands B.V.
R5-211631 Update to 6.6.3.2 NR SA FR1 - E-UTRAN event-triggered reporting in DRX Qualcomm Technologies Netherlands B.V.
R5-211632 Correction of applied TT for SA FR1 L1-RSRP measurement test cases Ericsson
R5-211726 Update of RRC message for TC 6.3.1.4, 6.3.1.5 and 6.3.2.3.2 MediaTek Inc.
R5-211727 Corrections NR SA FR1 timing test cases ROHDE & SCHWARZ
R5-211728 Correction to NR TC 6.6.3.2-Inter-RAT DRX Huawei, HiSilicon
R5-211729 Update of 6.5.1.2 and 6.5.1.4 SSB based RLM Huawei, HiSilicon
R5-211889 Update TT results for 6.3.1.1 ROHDE & SCHWARZ
5.3.2.9.4 NR standalone with at least one NR cell in FR2 (Clause7)
R5-210177 Update of CSI reporting time for SA TC 7.5.3.1 and 7.5.3.2 MediaTek Inc.
R5-210178 Update of PRACH configuration for SA TC 7.3.2.2.2 MediaTek Inc.
R5-210182 Update of PRACH configuration for SA TC 7.5.5.x MediaTek Inc.
R5-210474 Editorial: correct title of PRACH test cases to match RRM work plan - SA FR2 ROHDE & SCHWARZ
R5-210510 Correction of test applicability for long DRX cycle related test cases in section 7 CAICT
R5-210796 Clarification of BWP1 and BWP2 in 7.6.1.3 and 7.6.1.4 MediaTek Inc.
R5-211215 Correction of SA FR2 inter-freq measurement test case 7.6.2.1 including TT Ericsson
R5-211216 Correction of SA FR2 inter-freq measurement test case 7.6.2.3 including TT Ericsson
R5-211633 Correction of SA FR2 inter-freq measurement test case 7.6.2.1 including TT Ericsson
R5-211634 Correction of SA FR2 inter-freq measurement test case 7.6.2.3 including TT Ericsson
R5-211730 Clarification of BWP1 and BWP2 in 7.6.1.3 and 7.6.1.4 MediaTek Inc.
5.3.2.9.5 E-UTRA – NR Inter-RAT with E-UTRA serving cell (Clause 8)
R5-210137 Update of process delay for SFTD measurement TC 8.4.1.x MediaTek Inc.
R5-210439 Complete FR2 iRAT measurement accuracy test cases ROHDE & SCHWARZ
R5-210511 Correction of test applicability for long DRX cycle related test cases in section 8 CAICT
R5-211635 Complete FR2 iRAT measurement accuracy test cases ROHDE & SCHWARZ
5.3.2.9.6 Clauses 1-3 / Annexes
R5-210183 Update of prach-ConfigurationIndex for FR1 PRACH configuration 4 in A.7 MediaTek Inc.
R5-210433 Update Annex F for 5.4.3.1 and 7.4.3.1 with TT analysis results ROHDE & SCHWARZ
R5-210434 Correct cell mapping for 5.4.3.1 ROHDE & SCHWARZ
R5-210437 Annex E and F 4.5.7.1 PSCell addition test ROHDE & SCHWARZ
R5-210440 Update of TT analysis results in Annex F for FR2 iRAT test cases ROHDE & SCHWARZ
R5-210444 Update TT results for SS-RSRP measurement accuracy test cases Annex F ROHDE & SCHWARZ
R5-210448 Update TT results for SS-RSRQ measurement accuracy test cases Annex F ROHDE & SCHWARZ
R5-210451 Update TT results for 6.3.1.1 Annex F ROHDE & SCHWARZ
R5-210453 Update DL AWGN MU for RRM FR2 ROHDE & SCHWARZ
R5-210456 Update Annex I to TS 38.533 ROHDE & SCHWARZ
R5-210457 Update NR frequency band groups for FR1 ROHDE & SCHWARZ
R5-210463 Addition of Serving Cell Config for RRM timing test cases ROHDE & SCHWARZ
R5-210475 Editorial: correct title of PRACH test cases to match RRM work plan - Annexes ROHDE & SCHWARZ
R5-210478 Align Annex A with TS 38.133 ROHDE & SCHWARZ
R5-210613 Correction in SIB5 for iRAT cell reselection Keysight Technologies UK Ltd
R5-210615 Correction in Table H.3.6-5 Keysight Technologies UK Ltd
R5-210813 Update FR2 Downlink and Uplink MU values ANRITSU LTD
R5-210814 Finalise FR2 Timing MU values ANRITSU LTD
R5-210835 Correction to AoA Test Setup applicability per permitted test method Anritsu
R5-210864 Update of D.4 antenna configuration Huawei, HiSilicon
R5-210865 Update of Annex F for Test Tolerance Huawei, HiSilicon
R5-210866 Correction to CSI-RS RMC Huawei, HiSilicon
R5-210867 Correction to default configuration on L1-RSRP reporting in Annex H Huawei, HiSilicon
R5-211049 Additional of default downlink level for FR2 Anritsu
R5-211217 Correction of MTSU and applied TT in Annex F Ericsson
R5-211225 Addition of new RMCs and OCNGs into Annex A Ericsson
R5-211636 Update Annex F for 5.4.3.1 and 7.4.3.1 with TT analysis results ROHDE & SCHWARZ
R5-211637 Update DL AWGN MU for RRM FR2 ROHDE & SCHWARZ
R5-211638 Update FR2 Downlink and Uplink MU values ANRITSU LTD
R5-211639 Update of Annex F for Test Tolerance Huawei, HiSilicon
R5-211640 Correction of MTSU and applied TT in Annex F Ericsson
R5-211641 Addition of new RMCs and OCNGs into Annex A Ericsson
R5-211731 Addition of Serving Cell Config for RRM timing test cases ROHDE & SCHWARZ
R5-211890 Update TT results for 6.3.1.1 Annex F ROHDE & SCHWARZ
5.3.2.10 TS 36.508
R5-210767 Update to UECapabilityInformation China Telecommunications
R5-210946 Correction to default TDD configuration for EN-DC RF test cases Huawei, HiSilicon
R5-210950 Updating the value of PLTE for EN-DC test cases Huawei, HiSilicon
R5-211891 Updating the value of PLTE for EN-DC test cases Huawei, HiSilicon
5.3.2.15 TR 38.903 ((NR MU & TT analyses)
R5-210307 Adjacent Channel Selectivity FR2 MU definition in 38.903 Keysight Technologies UK Ltd
R5-210308 In-band Blocking FR2 MU definition in 38.903 Keysight Technologies UK Ltd
R5-210431 Test tolerance analysis for 7.4.3.1 and 5.4.3.1 ROHDE & SCHWARZ
R5-210435 Test tolerance analysis for 4.5.7.1 ROHDE & SCHWARZ
R5-210438 Update TT analyses for FR2 iRAT measurement accuracy test cases ROHDE & SCHWARZ
R5-210441 Update SS-RSRP measurement accuracy TT analyses for SNR uncertainty change ROHDE & SCHWARZ
R5-210445 Update SS-RSRQ measurement accuracy TT analyses for SNR uncertainty change ROHDE & SCHWARZ
R5-210449 Correct 6.3.1.1 TT analysis ROHDE & SCHWARZ
R5-210454 Update RRM MU values for FR2 ROHDE & SCHWARZ
R5-210603 Update on DL AWGN absolute power uncertainty values for DFF Keysight Technologies UK Ltd
R5-210604 Update MU threshold for DL AWGN absolute power for RRM FR2 Keysight Technologies UK Ltd
R5-210735 Editorial correction to several MU factors Huawei, HiSilicon
R5-210815 Update Test Tolerance analyses for FR2 Tx Timing Test cases ANRITSU LTD
R5-210817 Update Test Tolerance analyses for FR2 RLM Test cases ANRITSU LTD
R5-210818 Update Test Tolerance analyses for FR2 Event-Trig Test cases ANRITSU LTD
R5-210819 Update Test Tolerance analyses for FR2 SS-RSRP Test cases ANRITSU LTD
R5-210820 Update Test Tolerance analyses for FR1 RLM Test cases ANRITSU LTD
R5-210836 Update on FR2 Blocking Test MU Anritsu
R5-210837 Update MU for FR2 RRM Anritsu
R5-210846 Update of grouping of test cases in clause 8 Huawei, HiSilicon
R5-210847 Update of FR1 TT for SCell activation Huawei, HiSilicon
R5-210848 Update of FR1 TT for SSB based link recovery Huawei, HiSilicon
R5-210849 Update of FR1 TT for CSI-RS based link recovery Huawei, HiSilicon
R5-210850 Update of FR1 TT for RRC re-establishment Huawei, HiSilicon
R5-211103 Update FR2 MU and TT in 38.903 Anritsu
R5-211175 FR2 Minimum output power measurement uncertainty update Keysight Technologies UK Ltd
R5-211185 CR to 38.903 on ETC Testing Keysight Technologies UK Ltd
R5-211191 CR to 38.903 on PC1 Measurement Grid MUs Keysight Technologies UK Ltd
R5-211208 Update of Test Tolerance analysis for FR1 event triggered reporting test cases Ericsson
R5-211209 Update of Test Tolerance analysis for FR1 SSB-based L1-RSRP test cases Ericsson
R5-211210 Update of Test Tolerance analysis for FR1 CSI-RS based L1-RSRP test cases Ericsson
R5-211261 Update of demod SNR testability ROHDE & SCHWARZ
R5-211264 Update of QoQZ MU ROHDE & SCHWARZ
R5-211273 Test Tolerance analysis for FR2 event triggered reporting test cases Ericsson
R5-211607 Update MU threshold for DL AWGN absolute power for RRM FR2 Keysight Technologies UK Ltd
R5-211642 Test tolerance analysis for 4.5.7.1 ROHDE & SCHWARZ
R5-211643 Update SS-RSRP measurement accuracy TT analyses for SNR uncertainty change ROHDE & SCHWARZ
R5-211644 Update RRM MU values for FR2 ROHDE & SCHWARZ
R5-211645 Update of FR1 TT for SCell activation Huawei, HiSilicon
R5-211646 Update of FR1 TT for SSB based link recovery Huawei, HiSilicon
R5-211647 Update of FR1 TT for CSI-RS based link recovery Huawei, HiSilicon
R5-211648 Update of FR1 TT for RRC re-establishment Huawei, HiSilicon
R5-211649 Update of Test Tolerance analysis for FR1 event triggered reporting test cases Ericsson
R5-211650 Update of Test Tolerance analysis for FR1 SSB-based L1-RSRP test cases Ericsson
R5-211651 Update of Test Tolerance analysis for FR1 CSI-RS based L1-RSRP test cases Ericsson
R5-211652 Test Tolerance analysis for FR2 event triggered reporting test cases Ericsson
R5-211732 Editorial correction to several MU factors Huawei, HiSilicon
R5-211892 Correct 6.3.1.1 TT analysis ROHDE & SCHWARZ
R5-211930 Adjacent Channel Selectivity FR2 MU definition in 38.903 Keysight Technologies UK Ltd
R5-211931 In-band Blocking FR2 MU definition in 38.903 Keysight Technologies UK Ltd
R5-211932 Update on FR2 Blocking Test MU Anritsu
R5-211933 Update MU for FR2 RRM Anritsu
R5-211934 Update FR2 MU and TT in 38.903 Anritsu
R5-211935 CR to 38.903 on ETC Testing Keysight Technologies UK Ltd
R5-211936 Update of demod SNR testability ROHDE & SCHWARZ
5.3.2.16 TR 38.905 (NR Test Points Radio Transmission and Reception )
R5-210090 Updated TP analysis for 7.3B Reference sensitivity for EN-DC in FR1 Nokia, Nokia Shanghai Bell
R5-210309 TP analysis for 38.521-3 test case 6.5B.2.2.1 SEM Intra-band non-contiguous Keysight Technologies UK Ltd
R5-210310 TP analysis for 38.521-3 test case 6.5B.2.2.3 ACLR Intra-band non-contiguous Keysight Technologies UK Ltd
R5-210512 Introduction of test point analysis for SA FR2 7.4A Maximum input level for CA CAICT
R5-210544 Update of test point analysis for FR2 UL CA frequency error test cases Keysight Technologies UK Ltd
R5-210546 Update of test point analysis for FR2 MPR, SEM and ACLR test cases Keysight Technologies UK Ltd, Ericsson, CAICT
R5-210900 Updating TP analysis for Spurious Emissions for CA in FR1 Huawei, Hisilicon
R5-210901 Updating test point analysis for FR1 REFSENS for CA test case Huawei, Hisilicon
R5-210905 Updating TP analysis for FR1 REFSENS for SUL testing Huawei, Hisilicon
R5-210941 Addition of reference sensitivity test point analyses for FR1 NR CA and EN-DC Ericsson, Huawei, Hisilicon
R5-210942 Moving of principles for reference sensitivity test point selection from attachments to annexes Ericsson
R5-211064 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_8A_n77A Ericsson
R5-211065 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n77A Ericsson
R5-211066 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n78A Ericsson
R5-211067 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n79A Ericsson
R5-211068 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_25A_n41A Ericsson
R5-211069 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n41A Ericsson
R5-211070 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n77A Ericsson
R5-211071 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n78A Ericsson
R5-211072 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n79A Ericsson
R5-211073 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n77A Ericsson
R5-211074 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n78A Ericsson
R5-211136 TP analysis update for EN_DC refsens Ericsson
R5-211140 TP analysis for DC_8A_n77A Ericsson
R5-211142 TP analysis for DC_11A_n79A Ericsson
R5-211144 TP analysis for DC_26A_n41A Ericsson
R5-211146 TP analysis for DC_26A_n77A and DC_26A_n78A Ericsson
R5-211148 TP analysis for DC_26A_n79A Ericsson
R5-211150 TP analysis for DC_41A_n77A and DC_41A_n78A Ericsson
R5-211228 Test Point analysis update for FR2 Tx additional spurious emission test case Qualcomm Finland RFFE Oy
R5-211606 Updating test point analysis for FR1 REFSENS for CA test case Huawei, Hisilicon
R5-211733 Updated TP analysis for 7.3B Reference sensitivity for EN-DC in FR1 Nokia, Nokia Shanghai Bell
R5-211734 TP analysis for 38.521-3 test case 6.5B.2.2.1 SEM Intra-band non-contiguous Keysight Technologies UK Ltd
R5-211735 TP analysis for 38.521-3 test case 6.5B.2.2.3 ACLR Intra-band non-contiguous Keysight Technologies UK Ltd
R5-211736 Update of test point analysis for FR2 UL CA frequency error test cases Keysight Technologies UK Ltd
R5-211737 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_8A_n77A Ericsson
R5-211738 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n77A Ericsson
R5-211739 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n78A Ericsson
R5-211740 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_11A_n79A Ericsson
R5-211741 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_25A_n41A Ericsson
R5-211742 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n41A Ericsson
R5-211743 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n77A Ericsson
R5-211744 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n78A Ericsson
R5-211745 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_26A_n79A Ericsson
R5-211746 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n77A Ericsson
R5-211747 Introduction of spurious emission TP analysis for Rel-15 EN-DC configuration DC_41A_n78A Ericsson
R5-211748 Test Point analysis update for FR2 Tx additional spurious emission test case Qualcomm Finland RFFE Oy
R5-211893 Update of test point analysis for FR2 MPR, SEM and ACLR test cases Keysight Technologies UK Ltd, Ericsson, CAICT
R5-211894 Addition of reference sensitivity test point analyses for FR1 NR CA and EN-DC Ericsson, Huawei, Hisilicon
R5-211895 Moving of principles for reference sensitivity test point selection from attachments to annexes Ericsson
R5-211896 TP analysis update for EN_DC refsens Ericsson
R5-211897 TP analysis for DC_8A_n77A Ericsson
R5-211898 TP analysis for DC_11A_n79A Ericsson
R5-211899 TP analysis for DC_26A_n41A Ericsson
R5-211900 TP analysis for DC_26A_n77A and DC_26A_n78A Ericsson
R5-211901 TP analysis for DC_26A_n79A Ericsson
R5-211902 TP analysis for DC_41A_n77A and DC_41A_n78A Ericsson
5.3.2.17 Discussion Papers / Work Plan / TC lists
R5-210311 On ACS and IBB FR2 MU definition Keysight Technologies UK Ltd
R5-210312 On minimum requirements for Transmit ON/OFF time mask in UL MIMO FR1 Keysight Technologies UK Ltd
R5-210420 Discussion on equal PSD and PCC prioritization for UL CA test Guangdong OPPO Mobile Telecom.
R5-210452 On the DL AWGN MTSU for RRM ROHDE & SCHWARZ
R5-210515 Discussion on test issue of ONOFF time mask for UL MIMO Guangdong OPPO Mobile Telecom.
R5-210557 On the QoQZ standard deviation for ETC testing ROHDE & SCHWARZ
R5-210600 On MTSU definition for RRM Keysight Technologies UK Ltd
R5-210617 AP#87e.24 Input for Large Device Size Apple Portugal
R5-210722 Discussion on omitting of Rx cases with UL-MIMO on TDD bands Huawei, HiSilicon
R5-210733 Discussion on FR2 TT calculation in special scenarios Huawei, HiSilicon, Vivo
R5-210734 Discussion on draft LS on on nominal channel spacing calculation Huawei, HiSilicon
R5-210775 On Testability Aspects for FR2 Demodulation Testing Keysight Technologies UK Ltd
R5-210822 Handover of Test Tolerance review process in RAN5 ANRITSU LTD
R5-210823 Summary of known issues for NR RRM Test cases in 38.533 ANRITSU LTD
R5-210838 On MU for FR2 Blocker Test using offset antenna Anritsu
R5-210839 On declaration of FR2 antenna implementation and test method applicability Anritsu
R5-210840 On Quality of Quiet Zone for DFF Anritsu
R5-210841 On MU for FR2 Blocker Test Anritsu
R5-210842 On MU of IFF DFF test method for FR2 RRM Anritsu
R5-210843 On FR2 OBW MU Anritsu
R5-210844 On MTSU for FR2 RRM test Anritsu
R5-210845 On FR2 relative power measurement uncertainty Anritsu
R5-210945 Discussion on the default TDD configuration for EN-DC RF test cases Huawei, HiSilicon
R5-210948 Discussion on the uplink power configuration for EN-DC RF cases Huawei, HiSilicon
R5-211015 Discussion on test coverage for reference sensitivity for EN-DC configs with exceptions Huawei, HiSilicon
R5-211083 Input on fading crest factor margin for FR2 Demodulation test cases Qualcomm Wireless GmbH
R5-211104 Correction of parameters of FR2 ACLR test cases Anritsu
R5-211105 The degradation of TE noise floor for ON OFF time mask and how to avoid it Anritsu
R5-211112 Discussion on inter-band CA configurations in RAN5 specs ZTE Corporation
R5-211135 Discussion on test points for EN-DC refsens with exception avoiding Ericsson
R5-211179 On Additional Spurious emissions Keysight Technologies UK Ltd
R5-211184 On ETC MUs Keysight Technologies UK Ltd, Rohde & Schwarz
R5-211186 On Larger Quiet Zone Sizes with Grey Box Keysight Technologies UK Ltd
R5-211189 PC1 MUs based on the revised antenna array assumptions Keysight Technologies UK Ltd
R5-211192 On n259 QoQZ and XPD MU Keysight Technologies UK Ltd
R5-211193 On the MU Element “Uncertainty of an absolute gain of the calibration antenna” for n259 Keysight Technologies UK Ltd
R5-211194 On Declaration of Antenna Aperture for DFF based RRM systems Keysight Technologies UK Ltd
R5-211206 FR1 Test Tolerance review training Ericsson
R5-211207 FR2 Test Tolerance review training Ericsson
R5-211227 Discussion on PCC prioritization for FR1 and FR2 UL CA testing Qualcomm Finland RFFE Oy
R5-211232 Quality of the Quiet Zone measurement results for 20cm QZ ROHDE & SCHWARZ
R5-211235 Discussion on the size of Quiet Zone above 30cm ROHDE & SCHWARZ
R5-211247 Simplified Quality of the Quiet Zone procedure ROHDE & SCHWARZ
R5-211259 On the achievable SNR for demod test cases ROHDE & SCHWARZ
R5-211262 On the QoQZ standard deviation for ETC testing ROHDE & SCHWARZ
R5-211263 On the MU for n259 ROHDE & SCHWARZ
R5-211266 On the MU of FR2 OBW ROHDE & SCHWARZ
R5-211268 On FR2 ON/OFF Time Mask ROHDE & SCHWARZ
R5-211275 Measurement uncertainties for PC1 devices Keysight Technologies UK Ltd
R5-211276 FR2 Extreme testing conditions applicability Keysight Technologies UK Ltd
R5-211653 On the DL AWGN MTSU for RRM ROHDE & SCHWARZ
R5-211654 FR1 Test Tolerance review training Ericsson
R5-211655 FR2 Test Tolerance review training Ericsson
R5-211656 On the MU for n259 ROHDE & SCHWARZ
R5-211850 On minimum requirements for Transmit ON/OFF time mask in UL MIMO FR1 Keysight Technologies UK Ltd
R5-211937 Discussion on equal PSD and PCC prioritization for UL CA test Guangdong OPPO Mobile Telecom.
R5-211938 Discussion on the uplink power configuration for EN-DC RF cases Huawei, HiSilicon
R5-211939 Discussion on test coverage for reference sensitivity for EN-DC configs with exceptions Huawei, HiSilicon
R5-211940 Discussion on test points for EN-DC refsens with exception avoiding Ericsson
R5-211941 Discussion on PCC prioritization for FR1 and FR2 UL CA testing Qualcomm Finland RFFE Oy
R5-211943 On ACS and IBB FR2 MU definition Keysight Technologies UK Ltd
R5-211944 On the QoQZ standard deviation for ETC testing ROHDE & SCHWARZ
R5-211945 On MU for FR2 Blocker Test Anritsu
R5-211946 On FR2 OBW MU Anritsu
R5-211947 Input on fading crest factor margin for FR2 Demodulation test cases Qualcomm Wireless GmbH
R5-211948 On Additional Spurious emissions Keysight Technologies UK Ltd
R5-211949 On Larger Quiet Zone Sizes with Grey Box Keysight Technologies UK Ltd
R5-211950 On the achievable SNR for demod test cases ROHDE & SCHWARZ
5.3.3.2 TS 36.521-1
R5-210073 Addition of new test case 9.6.1.1_A.6 DEKRA
R5-210074 Addition of new test case 9.6.1.2_A.6 DEKRA
R5-210262 Add support for new CA combos to Table 7.4A.8.4.1-1 and Table 7.4A.8.4.2-1 C Spire Wireless
R5-210403 Addition of the definition of CA capability with 6DL and 7DL CCs LG Electronics
R5-210404 Introduction of FDD PDSCH Closed Loop Multi Layer Spatial Multiplexing 4x2 for CA (7DL CA) LG Electronics
R5-210405 Introduction of FDD PDSCH Open Loop Spatial Multiplexing 2x2 for CA (7DL CA) LG Electronics
R5-210406 Introduction of FDD PDSCH Single Antenna Port Performance for CA (7DL CA) LG Electronics
R5-210407 Update to Applicability and test rules for different CA configurations for 6DL CA test cases LG Electronics
R5-210409 Update to TDD FDD 7DL CA PDSCH Closed Loop Multi Layer Spatial Multiplexing 4x2 Performance test cases LG Electronics
R5-210410 Update to TDD FDD 7DL CA PDSCH Open Loop Spatial Multiplexing 2x2 Performance test cases LG Electronics
R5-210411 Update to TDD FDD 7DL CA Single Antenna Port Performance test cases LG Electronics
R5-211749 Addition of new test case 9.6.1.1_A.6 DEKRA
R5-211750 Addition of new test case 9.6.1.2_A.6 DEKRA
R5-211751 Addition of the definition of CA capability with 6DL and 7DL CCs LG Electronics
5.3.3.3 TS 36.521-2
R5-210408 Update to applicability TDD FDD 7DL CA Peformance test cases LG Electronics
R5-211752 Update to applicability TDD FDD 7DL CA Peformance test cases LG Electronics
5.3.3.4 TS 36.521-3
R5-210075 Addition of new test case 9.1.72 DEKRA
R5-210076 Addition of new test case 9.2.59 DEKRA
R5-211753 Addition of new test case 9.1.72 DEKRA
R5-211754 Addition of new test case 9.2.59 DEKRA
5.3.5.2 TS 36.521-1
R5-210776 Correction to the physical configuration for sTTI RF test cases Huawei, HiSilicon
R5-210777 Correction to the physical configuration for sTTI Demod test cases Huawei, HiSilicon
R5-210778 Correction to the physical configuration for sTTI CQI reporting test cases Huawei, HiSilicon
R5-210779 Addition of new test case 6.6.2.1_s SEM for sTTI Huawei, HiSilicon
R5-210780 Addition of new test case 6.6.2.2_s A-SEM for sTTI Huawei, HiSilicon
R5-210781 Addition of new test case 6.6.2.3_s ACLR for sTTI Huawei, HiSilicon
R5-211755 Addition of new test case 6.6.2.1_s SEM for sTTI Huawei, HiSilicon
R5-211756 Addition of new test case 6.6.2.3_s ACLR for sTTI Huawei, HiSilicon
R5-211903 Addition of new test case 6.6.2.2_s A-SEM for sTTI Huawei, HiSilicon
5.3.6.2 TS 36.521-2
R5-210832 Introduction of MU and TT for CA Idle Mode Measurements Nokia, Nokia Shanghai Bell
R5-210833 Introduction of CA Idle Mode Measurement RRM Testcase Applicabilities Nokia, Nokia Shanghai Bell
R5-211292 Introduction of CA Idle Mode Measurement RRM Testcase Applicabilities Nokia, Nokia Shanghai Bell
R5-211757 Introduction of CA Idle Mode Measurement RRM Testcase Applicabilities Nokia, Nokia Shanghai Bell
5.3.6.3 TS 36.521-3
R5-210828 FDD Inter Frequency Absolute RSRP Accuracy CA Idle Mode Measurements for Non-Overlapping Carrier Nokia, Nokia Shanghai Bell
R5-210829 FDD Inter Frequency Absolute RSRP Accuracy CA Idle Mode Measurements for Overlapping Carrier Nokia Corporation
R5-210830 FDD Inter Frequency Absolute RSRP Accuracy CA Idle Mode Measurements for Overlapping Carrier Nokia, Nokia Shanghai Bell
R5-210831 FDD Intra Frequency Absolute RSRP Accuracy CA Idle Mode Measurements Nokia, Nokia Shanghai Bell
R5-211291 Introduction of MU and TT for CA Idle Mode Measurements Nokia, Nokia Shanghai Bell
R5-211293 FDD Inter Frequency Absolute RSRP Accuracy CA Idle Mode Measurements for Non-Overlapping Carrier Nokia, Nokia Shanghai Bell
R5-211294 FDD Inter Frequency Absolute RSRP Accuracy CA Idle Mode Measurements for Overlapping Carrier Nokia, Nokia Shanghai Bell
R5-211295 FDD Intra Frequency Absolute RSRP Accuracy CA Idle Mode Measurements Nokia, Nokia Shanghai Bell
R5-211758 Introduction of MU and TT for CA Idle Mode Measurements Nokia, Nokia Shanghai Bell
R5-211759 FDD Inter Frequency Absolute RSRP Accuracy CA Idle Mode Measurements for Non-Overlapping Carrier Nokia, Nokia Shanghai Bell
R5-211760 FDD Inter Frequency Absolute RSRP Accuracy CA Idle Mode Measurements for Overlapping Carrier Nokia, Nokia Shanghai Bell
R5-211761 FDD Intra Frequency Absolute RSRP Accuracy CA Idle Mode Measurements Nokia, Nokia Shanghai Bell
5.3.7.1 TS 38.508-1
R5-211115 Update of 4.3.1.1.3.40.1 for test frequency of NR intra-band contiguous CA_n40B ZTE Corporation
R5-211117 Update of 4.3.1.1.3.66.1 for test frequency of NR intra-band contiguous CA_n66B ZTE Corporation
R5-211119 Update of 4.3.1.1.3.78.2 for test frequency of NR intra-band contiguous CA_n78B ZTE Corporation
R5-211121 Update of 4.3.1.3.2.1 for test frequencies for NR-DC configurations between FR1 and FR2 ZTE Corporation
R5-211122 Update of 4.3.1.4.1 for test frequencies for EN-DC band combinations within FR1 ZTE Corporation
R5-211123 Update of 4.3.1.5.1 for test frequencies for EN-DC band combinations including FR2 ZTE Corporation
R5-211124 Update of 4.3.1.6.1.3 for test frequencies for EN-DC band combinations including FR1 and FR2 ZTE Corporation
R5-211762 Update of 4.3.1.4.1 for test frequencies for EN-DC band combinations within FR1 ZTE Corporation
R5-211763 Update of 4.3.1.5.1 for test frequencies for EN-DC band combinations including FR2 ZTE Corporation
5.3.7.2 TS 38.508-2
R5-210937 Introducing PICS for CA_n28A-n41A Huawei, Hisilicon
R5-211248 Updating UE capability for Rel-16 NR inter-band CA configurations for band n1 DOCOMO Communications Lab.
R5-211602 Introducing PICS for CA_n28A-n41A Huawei, Hisilicon
R5-211904 Updating UE capability for Rel-16 NR inter-band CA configurations for band n1 DOCOMO Communications Lab.
5.3.7.3.1 Tx Requirements (Clause 6)
R5-210913 Updating Transmitter power for CA requiements for CA_n28A-n41A Huawei, Hisilicon
R5-210914 Updating test case general spurious emission for CA_n28A-n41A Huawei, Hisilicon
R5-210915 Updating Spurious emission for UE co-existence for CA_n28A-n41A Huawei, Hisilicon
R5-211256 Updating 6.2A.1.1 for CA_n1A-n79A DOCOMO Communications Lab.
R5-211274 Updating 6.5A.3.2 for CA_n1A-n79A DOCOMO Communications Lab.
5.3.7.3.2 Rx Requirements (Clause 7)
R5-210169 Addition of TC 7.3A.0.3.2.4 RIB,c for four bands CMCC
R5-210170 Update of TC 7.7A.3 CMCC
R5-210380 Update of 7.5A.3 Adjacent channel selectivity for 4DL CA China Telecommunications
R5-210381 Update of 7.5A.3 Adjacent channel selectivity for 4DL CA China Telecommunications
R5-210382 Update of 7.5A.3 Adjacent channel selectivity for 4DL CA China Telecommunications
R5-210539 Introduction 4CA Reference Sensitivity test 7.3A.3 WE Certification Oy, DISH Network
R5-210540 Introduction 4CA Maximum Input Level test 7.4A.3 WE Certification Oy, DISH Network
R5-210541 Introduction 4CA In-Band Blocking test 7.6A.2.3 WE Certification Oy, DISH Network
R5-211008 Update of CA_n1A-n78C into 3DL CA Refsense TC 7.3A.2 China Unicom
R5-211026 Update of CA_n1A-n78C into 3DL CA maximum input level TC 7.4A.2 China Unicom
R5-211764 Update of 7.5A.3 Adjacent channel selectivity for 4DL CA China Telecommunications
5.3.7.3.3 Clauses 1-5 / Annexes
R5-210803 Update of R16 CADC configurations into TS38.521-1 clause 5 China Unicom, Huawei, HiSilicon, NTT DOCOMO
R5-211252 Updating Rel-16 NR inter-band CA configuration for band n1 DOCOMO Communications Lab.
R5-211765 Update of R16 CADC configurations into TS38.521-1 clause 5 China Unicom, Huawei, HiSilicon, NTT DOCOMO
5.3.7.5.1 Tx Requirements (Clause 6)
R5-210087 Introduction of Rel-16 EN-DC configuration DC_7A_n3A to spurious emission test case 6.5B.3.3.2 Nokia, Nokia Shanghai Bell, Ericsson
R5-210088 Introduction of Rel-16 EN-DC configuration DC_8A_n3A to spurious emission test case 6.5B.3.3.2 Nokia, Nokia Shanghai Bell, Ericsson
R5-210089 Introduction of Rel-16 EN-DC configuration DC_20A_n1A to spurious emission test case 6.5B.3.3.2 Nokia, Nokia Shanghai Bell, Ericsson
R5-210943 Adding delta TIB and delta RIB for DC_2-7-7-66_n78 Huawei, HiSilicon
R5-210986 Update for 6.5B.3.3.2 Spurious emission band UE co-existence_Rel16 Qualcomm Korea
R5-211021 Adding Delta TIB,c for DC_1A-28A_n3A, DC_7A-20A_n1A and DC_7A-28A_n3A to clause 6.2B.4.2.3.3 Ericsson
R5-211766 Introduction of Rel-16 EN-DC configuration DC_7A_n3A to spurious emission test case 6.5B.3.3.2 Nokia, Nokia Shanghai Bell, Ericsson
R5-211767 Introduction of Rel-16 EN-DC configuration DC_8A_n3A to spurious emission test case 6.5B.3.3.2 Nokia, Nokia Shanghai Bell, Ericsson
R5-211768 Introduction of Rel-16 EN-DC configuration DC_20A_n1A to spurious emission test case 6.5B.3.3.2 Nokia, Nokia Shanghai Bell, Ericsson
R5-211769 Update for 6.5B.3.3.2 Spurious emission band UE co-existence_Rel16 Qualcomm Korea, Ericsson
R5-211770 Adding Delta TIB,c for DC_1A-28A_n3A, DC_7A-20A_n1A and DC_7A-28A_n3A to clause 6.2B.4.2.3.3 Ericsson
5.3.7.5.2 Rx Requirements (Clause 7)
R5-210091 Introduction of DC_7A_n3A to reference sensitivity test Nokia, Nokia Shanghai Bell
R5-210092 Introduction of DC_8A_n1A and DC_8A_n3A to reference sensitivity test Nokia, Nokia Shanghai Bell
R5-210093 Introduction of DC_7A-20A_n3A to reference sensitivity test Nokia, Nokia Shanghai Bell
R5-210516 Adding Inter-band EN-DC combination within FR1 KDDI Corporation
R5-211239 Introduction of DC_1A-28A_n3A to reference sensitivity test Ericsson
R5-211240 Introduction of DC_7A-20A_n1A to reference sensitivity test Ericsson
R5-211241 Introduction of DC_7A- 28A_n3A to referce sensitivity test Ericsson
R5-211771 Introduction of DC_7A_n3A to reference sensitivity test Nokia, Nokia Shanghai Bell
R5-211772 Introduction of DC_8A_n1A and DC_8A_n3A to reference sensitivity test Nokia, Nokia Shanghai Bell
R5-211773 Adding Inter-band EN-DC combination within FR1 KDDI Corporation
R5-211905 Introduction of DC_1A-28A_n3A to reference sensitivity test Ericsson
5.3.7.5.3 Clauses 1-5 / Annexes
R5-211005 Update to EN-DC R16 Configuration information in clause 5 Bureau Veritas, Ericsson
R5-211020 Adding EN-DC configurations DC_1A-28A_n3A and DC_7A-28A_n3A to clause 5.5B.4.2 Ericsson
R5-211125 Update of 5.3B for UE channel bandwidth for EN-DC ZTE Corporation
5.3.7.10 TR 38.905 (NR Test Points Radio Transmission and Reception)
R5-210084 Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_7A_n3A Nokia, Nokia Shanghai Bell, Ericsson
R5-210085 Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n3A Nokia, Nokia Shanghai Bell, Ericsson
R5-210086 Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n1A Nokia, Nokia Shanghai Bell, Ericsson
R5-210916 Addition of TP analysis for CA_n28A-n41A in Tx Spurious Emision cases Huawei, Hisilicon
R5-210962 Spur emission TP analysis R16 DC_2A_n41A Qualcomm Korea, Ericsson
R5-210963 Spur emission TP analysis R16 DC_5A_n2A Qualcomm Korea
R5-210980 Spur emission TP analysis R16 DC_13A_n2A Qualcomm Korea
R5-210981 Spur emission TP analysis R16 DC_48A_n5A Qualcomm Korea
R5-210982 Spur emission TP analysis R16 DC_48A_n66A Qualcomm Korea
R5-210985 Spur emission TP analysis R16 DC_66A_n41A Qualcomm Korea, Ericsson
R5-211242 Reference sensitivity TP analysis for DC_1A-28A_n3A Ericsson
R5-211243 Reference sensitivity analysis for DC_3A-7A_n1A Ericsson
R5-211244 Reference sensitivity TP analysis for DC_7A-20A_n1A Ericsson
R5-211245 Reference sensitivity TP analysis for DC_7A-28A_n3A Ericsson
R5-211774 Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_7A_n3A Nokia, Nokia Shanghai Bell, Ericsson
R5-211775 Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_8A_n3A Nokia, Nokia Shanghai Bell, Ericsson
R5-211776 Introduction of spurious emission TP analysis for Rel-16 EN-DC configuration DC_20A_n1A Nokia, Nokia Shanghai Bell, Ericsson
R5-211777 Spur emission TP analysis R16 DC_2A_n41A Qualcomm Korea, Ericsson
R5-211778 Spur emission TP analysis R16 DC_13A_n2A Qualcomm Korea
R5-211779 Spur emission TP analysis R16 DC_48A_n5A Qualcomm Korea, Ericsson
R5-211780 Spur emission TP analysis R16 DC_48A_n66A Qualcomm Korea
R5-211781 Spur emission TP analysis R16 DC_66A_n41A Qualcomm Korea, Ericsson
R5-211906 Reference sensitivity TP analysis for DC_1A-28A_n3A Ericsson
R5-211907 Reference sensitivity analysis for DC_3A-7A_n1A Ericsson
R5-211908 Reference sensitivity TP analysis for DC_7A-20A_n1A Ericsson
R5-211909 Reference sensitivity TP analysis for DC_7A-28A_n3A Ericsson
5.3.7.11 Discussion Papers / Work Plan / TC lists
R5-210083 Conclusion of some Rel-16 inter-band EN-DC configurations Nokia, Nokia Shanghai Bell
R5-211249 Discussion paper to align DL CA Rx test cases Dish Network
5.3.9.1 TR 37.901-5
R5-210593 Updates to 37.901-5 Annex A for Downlink Throughput tests with Fading and FRC scenario QUALCOMM communications-France
R5-210594 Updates to connection diagram for Application Layer Data Throughput QUALCOMM communications-France
R5-210595 Updates to Impact of Modem Performance in Application Layer Throughput QUALCOMM communications-France
R5-210596 Updates to Test System Uncertainty and Test Tolerance for Application Layer Data Throughput QUALCOMM communications-France
R5-210597 Updates to Conclusion for Application Layer Data Throughput QUALCOMM communications-France
R5-211782 Updates to Impact of Modem Performance in Application Layer Throughput QUALCOMM communications-France
5.3.10.1 TS 36.521-1
R5-210874 Update of 6.2.3A.1_3 Maximum Power Reduction for CA and HPUE Huawei, HiSilicon
R5-210875 Update of 6.6.2.3_1 ACLR for HPUE Huawei, HiSilicon
R5-211783 Update of 6.2.3A.1_3 Maximum Power Reduction for CA and HPUE Huawei, HiSilicon
5.3.11.1 TS 38.508-1
R5-211120 Update of 4.3.1.0A for mid test channel bandwidth ZTE Corporation, Ericsson
R5-211233 Correction of test frequencies for NR band n48 Ericsson
R5-211604 Introduction of test frequencies for CBW 70 MHz for n77 Ericsson, China Unicom
R5-211605 Introduction of test frequencies for CBW 70 MHz for n78 Ericsson, China Unicom
R5-211784 Update of 4.3.1.0A for mid test channel bandwidth ZTE Corporation, Ericsson
R5-211785 Correction of test frequencies for NR band n48 Ericsson
5.3.11.2 TS 38.508-2
R5-210081 Introduction of Additional capabilities for NR Band n53 Nokia, Nokia Shanghai Bell
R5-211229 Add n26 to 2Rx capabilities declaration Dish Network
5.3.11.3.1 Tx Requirements (Clause 6)
R5-210739 Correction of test points for NS_48 Huawei, HiSilicon
R5-210741 Addition of A-MPR test for NS_49 Huawei, HiSilicon
R5-210912 Correction to test case 6.2.3 AMPR for NS_24 Huawei, Hisilicon
R5-210997 Update for 6.5.3.2 Spurious emission for UE co-existence_R16 Qualcomm Korea, Keysight
R5-211040 Addition of 70M into 38.521-1 TC6.3A.1 China Unicom
R5-211041 Addition of 70M into 38.521-1 TC6.3D China Unicom
R5-211181 PC1 and PC3 Updates for Band n14 AT&T
R5-211657 PC1 and PC3 Updates for Band n14 AT&T
R5-211786 Correction of test points for NS_48 Huawei, HiSilicon
R5-211787 Addition of A-MPR test for NS_49 Huawei, HiSilicon
R5-211788 Update for 6.5.3.2 Spurious emission for UE co-existence_R16 Qualcomm Korea, Keysight
5.3.11.3.3 Clauses 1-5 / Annexes
R5-210602 Addition of R16 new channel bandwidths for n3 in 38.521-1 China Telecommunications
R5-211789 Addition of R16 new channel bandwidths for n3 in 38.521-1 China Telecommunications
5.3.11.9 TR 38.905 (NR Test Points Radio Transmission and Reception)
R5-210740 Updating TP analysis of FR1 A-MPR for NS_48 Huawei, HiSilicon
R5-210742 Adding TP analysis of FR1 A-MPR for NS_49 Huawei, HiSilicon
R5-210743 Resubmitting TP analysis of FR1 A-MPR for NS_44 Huawei, HiSilicon
R5-211230 NS_12, NS_13, NS_14, NS_15 TP analysis to 38.905 Dish Network
5.3.11.10 Discussion Papers / Work Plan / TC lists
R5-210286 Discussion about n259 OBW relaxation DOCOMO Communications Lab.
R5-211951 Discussion about n259 OBW relaxation DOCOMO Communications Lab.
5.3.12.3 TS 36.521-2
R5-210889 Addition of applicability for NB-IoT RRM TDD Test Cases Sporton
5.3.12.4 TS 36.521-3
R5-210883 Addition of 6.2.21 TDD Contention Based Random Access on Non-anchor Carrier Test for UE category NB1 UEs In-band mode in Enhanced Coverage Sporton
R5-210884 Addition of 7.1.27 E-UTRAN TDD UE Transmit Timing Accuracy Tests for Category NB1 UE In-Band mode under normal coverage Sporton
R5-210885 Addition of 7.1.28 E-UTRAN TDD - UE Transmit Timing Accuracy Tests for Category NB1 UE In-band mode under enhanced coverage Sporton
R5-210886 Addition of 7.2.15 E-UTRAN TDD TDD UE Timing Advance Adjustment Accuracy Test for UE Category NB1 in Standalone Mode under Enhanced Coverage Sporton
R5-210887 Addition of 7.3.88 TDD Radio Link Monitoring Test for Out-of-sync in DRX for UE category NB1 In-band mode in normal coverage Sporton
R5-210888 Addition of 7.3.89 TDD Radio Link Monitoring Test for Out-of-sync in DRX for UE category NB1 In-band mode in enhanced coverage Sporton
R5-210890 Addition of Cell configuration mapping for NB-IoT RRM TDD Test Cases in Annex E Sporton
R5-210892 Update of MU for addition of new NB-IoT TDD Test Cases Sporton
R5-211790 Addition of 6.2.21 TDD Contention Based Random Access on Non-anchor Carrier Test for UE category NB1 UEs In-band mode in Enhanced Coverage Sporton
R5-211791 Addition of 7.1.27 E-UTRAN TDD UE Transmit Timing Accuracy Tests for Category NB1 UE In-Band mode under normal coverage Sporton
R5-211792 Addition of 7.1.28 E-UTRAN TDD - UE Transmit Timing Accuracy Tests for Category NB1 UE In-band mode under enhanced coverage Sporton
R5-211793 Addition of 7.2.15 E-UTRAN TDD TDD UE Timing Advance Adjustment Accuracy Test for UE Category NB1 in Standalone Mode under Enhanced Coverage Sporton
R5-211794 Addition of 7.3.88 TDD Radio Link Monitoring Test for Out-of-sync in DRX for UE category NB1 In-band mode in normal coverage Sporton
R5-211795 Addition of 7.3.89 TDD Radio Link Monitoring Test for Out-of-sync in DRX for UE category NB1 In-band mode in enhanced coverage Sporton
5.3.12.5 TS 37.571-1
R5-210751 Addition of TDD NB-IOT RSTD measurement test case 9.7.1 Huawei, HiSilicon
R5-210752 Addition of TDD NB-IOT RSTD measurement test case 9.7.2 Huawei, HiSilicon
R5-210753 Addition of TDD NB-IOT RSTD measurement test case 9.7.3 Huawei, HiSilicon
R5-210754 Addition of TDD NB-IOT RSTD measurement test case 9.8.1 Huawei, HiSilicon
R5-210755 Addition of TDD NB-IOT RSTD measurement test case 9.8.2 Huawei, HiSilicon
R5-210756 Addition of TDD NB-IOT RSTD measurement test case 9.8.3 Huawei, HiSilicon
R5-210757 Update to Annex C for TDD NB-IOT RSTD measurement test cases Huawei, HiSilicon
R5-211796 Addition of TDD NB-IOT RSTD measurement test case 9.7.1 Huawei, HiSilicon
R5-211797 Addition of TDD NB-IOT RSTD measurement test case 9.7.2 Huawei, HiSilicon
R5-211798 Addition of TDD NB-IOT RSTD measurement test case 9.7.3 Huawei, HiSilicon
R5-211799 Addition of TDD NB-IOT RSTD measurement test case 9.8.1 Huawei, HiSilicon
R5-211800 Addition of TDD NB-IOT RSTD measurement test case 9.8.2 Huawei, HiSilicon
R5-211801 Addition of TDD NB-IOT RSTD measurement test case 9.8.3 Huawei, HiSilicon
5.3.12.6 TS 37.571-3
R5-210758 Addition of applicability for TDD NB-IOT RSTD measurement test cases Huawei, HiSilicon
R5-211802 Addition of applicability for TDD NB-IOT RSTD measurement test cases Huawei, HiSilicon
5.3.13.2 TS 36.521-1
R5-210549 Adding subPRB allocation to test case 6.2.3EC, Maximum Power Reduction (MPR) for UE category M2 Ericsson
R5-210550 Core spec alignment, adding missing note in test case 8.11.1.2.3.1 Ericsson
R5-210552 Adding subPRB allocation to 6.5.2.1EA.2, PUSCH-EVM with exclusion period for UE category M1 Ericsson
R5-210553 Adding subPRB allocation to 6.5.2.2EA and 6.5.2.2EC Ericsson
R5-210558 Adding subPRB allocation to 6.6.2.1EC, Spectrum Emission Mask for UE category M2 Ericsson
R5-210559 Adding subPRB allocation to 6.6.2.3EC, Adjacent Channel Leakage power Ratio for UE category M2 Ericsson
R5-210560 Adding subPRB allocation to 6.6.3EA.1, Transmitter Spurious emissions for UE category M1 Ericsson
5.3.13.3 TS 36.521-2
R5-211177 Correction of Table 4.1-1 Google Inc.
R5-211803 Correction of Table 4.1-1 Google Inc.
5.3.14.2 TS 38.508-2
R5-210744 Adding PICS for UL switching Huawei, HiSilicon
R5-210926 Introduction of PICS for intra-band non-contiguous CA configurations Huawei, Hisilicon
R5-211910 Adding PICS for UL switching Huawei, HiSilicon
5.3.14.3.1 Tx Requirements (Clause 6)
R5-210384 Add TT to power control for UL CA Guangdong OPPO Mobile Telecom.
R5-210918 Updating MOP and MPR for MIMO testing for several NR bands Huawei, Hisilicon
R5-210919 Updating 6.5A.3.1.0 for intra-band CA Huawei, Hisilicon
R5-210920 Updating test requirement of CA test cases for CA configurations including n90 Huawei, Hisilicon
R5-210923 Adding NR test case-Time mask for Uplink carriers switching Huawei, Hisilicon
R5-210936 Updating Editors Note in 6.2A.2 and 6.2A.4 for intra-band UL CA Huawei, Hisilicon
R5-211037 Addition of minimum requirement for intra-band UL CA in the test case 6.4A.2 KTL
R5-211804 Updating Editors Note in 6.2A.2 and 6.2A.4 for intra-band UL CA Huawei, Hisilicon
R5-211911 Adding NR test case-Time mask for Uplink carriers switching Huawei, Hisilicon
5.3.14.3.2 Rx Requirements (Clause 7)
R5-210921 Updating test case 7.3A.2 for CA_n79D Huawei, Hisilicon
R5-210922 Updating test case 7.6A.4 for band n48 Huawei, Hisilicon
5.3.14.3.3 Clauses 1-5 / Annexes
R5-210385 Update MU/TT on power control for UL CA Guangdong OPPO Mobile Telecom.
R5-210917 Updating general requirements for intra-band non-contiguous CA Huawei, Hisilicon
R5-210925 Adding MU and TT for Uplink carriers switching testing Huawei, Hisilicon
R5-211805 Updating general requirements for intra-band non-contiguous CA Huawei, Hisilicon
R5-211912 Adding MU and TT for Uplink carriers switching testing Huawei, Hisilicon
5.3.14.5 TS 38.522
R5-210745 Adding test applicability for switching test case Huawei, HiSilicon
R5-211913 Adding test applicability for switching test case Huawei, HiSilicon
5.3.14.8 TR 38.905 (NR Test Points Radio Transmission and Reception)
R5-210383 Correct a tpyo of 6.3A.4.2 Guangdong OPPO Mobile Telecom.
R5-210924 Adding TP analysis for NR test case-Time mask for UL carrier switching Huawei, Hisilicon
R5-211914 Adding TP analysis for NR test case-Time mask for UL carrier switching Huawei, Hisilicon
5.3.17.4.1 Tx Requirements (Clause 6)
R5-210419 Addition of new test case 6.4E.2.2.1 Error Vector Magnitude for V2X for non-concurrent operation LG Electronics
R5-210422 Addition of 6.5E.2.2.1 Guangdong OPPO Mobile Telecom.
R5-210423 Addition of 6.5E.2.2.1D Guangdong OPPO Mobile Telecom.
R5-210424 Addition of 6.5E.2.3.1 Guangdong OPPO Mobile Telecom.
R5-210425 Addition of 6.5E.2.3.1D Guangdong OPPO Mobile Telecom.
R5-210426 Addition of 6.5E.2.4.1 Guangdong OPPO Mobile Telecom.
R5-210427 Addition of 6.5E.2.4.1D Guangdong OPPO Mobile Telecom.
R5-210428 Addition of 6.5E.3.2.1 Guangdong OPPO Mobile Telecom.
R5-210429 Addition of 6.5E.3.2.1D Guangdong OPPO Mobile Telecom.
R5-211806 Addition of 6.5E.2.2.1 Guangdong OPPO Mobile Telecom.
5.3.17.7 TS 38.522
R5-211610 Applicability of Error Vector Magnitude for V2X for non-concurrent operation LG Electronics
5.3.18.3.1 Tx Requirements (Clause 6)
R5-210782 Update of A-MPR minimum requirements for Rel-16 DMRS Huawei, HiSilicon
R5-210784 Adding test point for Rel-16 DMRS in EVM equalizer spectrum flatness test case Huawei, HiSilicon
R5-210786 Adding additional TP for half Pi BPSK DMRS to MPR test case for SUL Huawei, HiSilicon
R5-210787 Adding additional TP for half Pi BPSK DMRS to SEM test case for SUL Huawei, HiSilicon
R5-210788 Adding additional TP for half Pi BPSK DMRS to NR ACLR test case for SUL Huawei, HiSilicon
R5-210790 Addition of new test case 6.4C.2.5 EVM equalizer spectrum flatness for half Pi BPSK DMRS for SUL Huawei, HiSilicon
R5-210996 Addition of test case 6.5D.2_1.4.2, UTRA ACLR for UL MIMO (Rel-16 onward) Ericsson
R5-211133 Addition of ULFPTx in MPR test case Ericsson
R5-211807 Adding test point for Rel-16 DMRS in EVM equalizer spectrum flatness test case Huawei, HiSilicon
R5-211808 Addition of new test case 6.4C.2.5 EVM equalizer spectrum flatness for half Pi BPSK DMRS for SUL Huawei, HiSilicon
R5-211915 Adding additional TP for half Pi BPSK DMRS to MPR test case for SUL Huawei, HiSilicon
5.3.18.7 TS 38.522
R5-210792 Adding the test applicability of RF test cases for eMIMO Huawei, HiSilicon
5.3.18.10 TR 38.905 (NR Test Points Radio Transmission and Reception)
R5-210783 Adding TP analysis for Rel-16 DMRS in A-MPR test case Huawei, HiSilicon
R5-210785 Update of TP analysis for EVM equalizer spectrum flatness for half Pi BPSK Huawei, HiSilicon
R5-210789 Update of TP analysis for FR1 SUL test cases Huawei, HiSilicon
R5-210791 Adding TP selection for 6.4C.2 Transmit modulation quality for SUL Huawei, HiSilicon
R5-210999 TP analysis for test case 6.5D.1_1, Occupied bandwidth for UL MIMO (Rel-16 onward) Ericsson
R5-211018 TP analysis for test case 6.5D.2_1.4.2, UTRA ACLR for UL MIMO (Rel-16 onward) Ericsson
R5-211134 TP analysis for ULFPTx in MPR test case Ericsson
R5-211809 Adding TP analysis for Rel-16 DMRS in A-MPR test case Huawei, HiSilicon
R5-211810 Update of TP analysis for EVM equalizer spectrum flatness for half Pi BPSK Huawei, HiSilicon
R5-211811 Update of TP analysis for FR1 SUL test cases Huawei, HiSilicon
5.3.21.3 TS 37.571-5
R5-210054 Addition of support for BDS B1C signal Spirent Communications, CATT, CAICT
R5-211812 Addition of support for BDS B1C signal Spirent Communications, CATT, CAICT
5.3.24.3.1 Conducted Demod Performance and CSI Reporting Requirements (Clauses 5&6)
R5-211050 Updating applicability in test case 5.2.2.2.4_1 Ericsson
R5-211075 Adding new test case 6.3.2.2.3, 2Rx TDD FR1 Single PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA Ericsson
R5-211078 Adding new test case 6.3.2.2.4, 2Rx TDD FR1 Single PMI with 32Tx Type1 - SinglePanel codebook for both SA and NSA Ericsson
R5-211079 Adding new test case 6.3.3.2.3, 4Rx TDD FR1 Single PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA Ericsson
R5-211160 Addition of new test case 6.3.2.1.3 2Rx FDD FR1 Multiple PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA China Telecom
R5-211161 Addition of new test case 6.3.3.1.3 4Rx FDD FR1 Multiple PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA China Telecom
R5-211658 Addition of new test case 6.3.2.1.3 2Rx FDD FR1 Multiple PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA China Telecom
R5-211659 Addition of new test case 6.3.3.1.3 4Rx FDD FR1 Multiple PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA China Telecom
R5-211813 Adding new test case 6.3.2.2.3, 2Rx TDD FR1 Single PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA Ericsson
R5-211814 Adding new test case 6.3.3.2.3, 4Rx TDD FR1 Single PMI with 16Tx Type1 - SinglePanel codebook for both SA and NSA Ericsson
R5-211916 Adding new test case 6.3.2.2.4, 2Rx TDD FR1 Single PMI with 32Tx Type1 - SinglePanel codebook for both SA and NSA Ericsson
5.3.24.3.4 Clauses 1-4 / Annexes
R5-211086 Adding new CSI test cases to annex F Ericsson
5.3.24.4 TS 38.522
R5-211158 Addition of applicability new test case 6.3.2.1.3 in TS 38.521-4 China Telecom
R5-211159 Addition of applicability new test case 6.3.3.1.3 in TS 38.521-4 China Telecom
5.3.24.7 Discussion Papers / Work Plan / TC lists
R5-211082 Test case structure updates for CA PDSCH Demodulation test cases Qualcomm Wireless GmbH
R5-211942 Test case structure updates for CA PDSCH Demodulation test cases Qualcomm Wireless GmbH
5.3.25.2 TS 38.508-2
R5-210285 Addition of common ICS in A.4.3.11 for Rel-16 HST CMCC
R5-211815 Addition of common ICS in A.4.3.11 for Rel-16 HST CMCC
5.3.25.3 TS 38.521-4
R5-210418 Update of minimum conformance requirements for 4Rx FDD FR1 PDSCH in TC 5.2.3.1.1_1 LG Electronics
R5-211816 Update of minimum conformance requirements for 4Rx FDD FR1 PDSCH in TC 5.2.3.1.1_1 LG Electronics
5.3.25.3.1 Conducted Demod Performance and CSI Reporting Requirements (Clause 5)
R5-210109 Addition of Applicability of different requirements for R16 NR HST in 5.1.1.7 CMCC
R5-210112 Update of Applicability of requirements for mandatory UE features with capability signalling for R16 NR HST in 5.1.1.4 CMCC
R5-210113 Update of Applicability of requirements for optional UE features for R16 NR HST in 5.1.1.3 CMCC
R5-211817 Addition of Applicability of different requirements for R16 NR HST in 5.1.1.7 CMCC
R5-211818 Update of Applicability of requirements for mandatory UE features with capability signalling for R16 NR HST in 5.1.1.4 CMCC
R5-211819 Update of Applicability of requirements for optional UE features for R16 NR HST in 5.1.1.3 CMCC
5.3.25.3.2 Clauses 1-4 / Annexes
R5-210108 Addition of Abbreviations and References for R16 NR HST in 3.3 and References CMCC
R5-210110 Addition of HST-DPS Channel Profile in B.3.3 CMCC
R5-210111 Addition of HST-SFN Channel Profile in B.3.2 CMCC
R5-210114 Update of Combinations of channel model parameters for R16 NR HST in B.2.2 CMCC
R5-210115 Update of Reference measurement channels for PDSCH performance requirements for R16 NR HST in A.3.2 CMCC
R5-210116 Update of Single Tap Channel Profile for R16 NR HST in B.3.1 CMCC
R5-211820 Addition of Abbreviations and References for R16 NR HST in 3.3 and References CMCC
R5-211821 Addition of HST-DPS Channel Profile in B.3.3 CMCC
R5-211822 Addition of HST-SFN Channel Profile in B.3.2 CMCC
R5-211823 Update of Combinations of channel model parameters for R16 NR HST in B.2.2 CMCC
R5-211824 Update of Reference measurement channels for PDSCH performance requirements for R16 NR HST in A.3.2 CMCC
R5-211825 Update of Single Tap Channel Profile for R16 NR HST in B.3.1 CMCC
5.3.25.4 TS 38.522
R5-211218 Addition of new RRM test cases to the applicability table in 4.2 Ericsson
R5-211611 Applicability for RRM NR HST test case 6.1.1.7 and 6.6.1.7 CMCC
R5-211917 Addition of new RRM test cases to the applicability table in 4.2 Ericsson
R5-211918 Applicability for RRM NR HST test case 6.1.1.7 and 6.6.1.7 CMCC
5.3.25.5 TS 38.533
R5-210279 Addition of minimum conformance requirements for R16 NR HST cell re-selection in 6.1.1.0 CMCC
R5-210280 Addition of new test case 6.1.1.7 for R16 NR HST CMCC
R5-210281 Addition of minimum conformance requirements for R16 NR HST measurement in 6.6.1.0 CMCC
R5-210282 Addition of new test case 6.6.1.7 for R16 NR HST CMCC
R5-210283 Update of Annex H.2.1-3 for R16 NR HST CMCC
R5-210284 Addition of cell configuration mapping in Annex E for R16 NR HST CMCC
R5-211219 Correction of the minimum conformance requirements for Inter-RAT measurements 6.6.3.0 Ericsson
R5-211220 Addition of new RRM iRAT measurement Inter-RAT measurements test case 6.6.3.3 Ericsson
R5-211221 Correction of the minimum conformance requirements for E-UTRA - NR FR1 Cell reselection 8.2.1.0 Ericsson
R5-211222 Addition of new RRM E-UTRA - NR FR1 Cell reselection test case 8.2.1.2 Ericsson
R5-211223 Correction of the minimum conformance requirements for E-UTRA - NR Inter-RAT event triggered reporting tests 8.4.2.0 Ericsson
R5-211224 Addition of new RRM E-UTRA - NR Inter-RAT event triggered reporting test case 8.4.2.9 Ericsson
R5-211827 Addition of new test case 6.1.1.7 for R16 NR HST CMCC
R5-211828 Addition of new test case 6.6.1.7 for R16 NR HST CMCC
R5-211829 Addition of cell configuration mapping in Annex E for R16 NR HST CMCC
R5-211830 Correction of the minimum conformance requirements for E-UTRA - NR FR1 Cell reselection 8.2.1.0 Ericsson
R5-211831 Addition of new RRM E-UTRA - NR FR1 Cell reselection test case 8.2.1.2 Ericsson
R5-211832 Correction of the minimum conformance requirements for E-UTRA - NR Inter-RAT event triggered reporting tests 8.4.2.0 Ericsson
R5-211833 Addition of new RRM E-UTRA - NR Inter-RAT event triggered reporting test case 8.4.2.9 Ericsson
5.3.26.3.2 Rx Requirements (Clause 7)
R5-210082 Introduction of FR2 DL 256QAM Nokia, Nokia Shanghai Bell
R5-211919 Introduction of FR2 DL 256QAM Nokia, Nokia Shanghai Bell
5.3.27.2 TS 36.521-1
R5-211236 Addition of band 7, 42, 43 and 65 for UE category M1 and NB1 to clause 5 Ericsson
R5-211237 Addition of band 7, 42, 43 and 65 for UE category M1 and NB1 to clause 6 Ericsson
R5-211238 Addition of band 7, 42, 43 and 65 for UE category M1 and NB1 to clause 7.3 Ericsson
R5-211834 Addition of band 7, 42, 43 and 65 for UE category M1 and NB1 to clause 5 Ericsson
R5-211835 Addition of band 7, 42, 43 and 65 for UE category M1 and NB1 to clause 6 Ericsson
5.3.28.2 TS 36.521-1
R5-210562 Adding band 7,42, 43 to Rx test cases for cat M2 Ericsson
5.3.30.1 TS 38.508-1
R5-210927 Updating Rel-17 mid and highest channel bandwitch for n83 and n84 Huawei, Hisilicon
R5-210928 Adding Rel-17 CBW 30MHz test frequencies for n83 Huawei, Hisilicon
R5-210929 Updating test frequencies for Rel-17 new CBWs for band n84 Huawei, Hisilicon
R5-211076 Introduction of test frequencies for n41 adding CBW 70 MHz Ericsson
R5-211077 Introduction of test frequencies for n48 adding CBW 70 MHz - DL only Ericsson
R5-211836 Introduction of test frequencies for n48 adding CBW 70 MHz - DL only Ericsson
5.3.30.3.1 Tx Requirements (Clause 6)
R5-210930 Updating MPR testing for SUL band n83 Huawei, Hisilicon
R5-210931 Updating AMPR testing for SUL band n83 and n84 Huawei, Hisilicon
R5-210932 Updating Additional spurious emisisons testing for SUL band n83 and n84 Huawei, Hisilicon
R5-211837 Updating MPR testing for SUL band n83 Huawei, Hisilicon
R5-211838 Updating AMPR testing for SUL band n83 and n84 Huawei, Hisilicon
5.3.30.3.3 Clauses 1-5 / Annexes
R5-211174 Addition of R17 new CBWs into 38.521-1 clause 5 China Unicom, Huawei, HiSilicon
5.3.31.1 TS 38.508-1
R5-211178 Updating test frequencies for Rel-17 inter-band EN-DC configurations for band n1 DOCOMO Communications Lab.
5.3.31.2 TS 38.508-2
R5-210938 Adding PICS for SUL with DL CA configurations Huawei, Hisilicon
R5-211196 Updating UE capability for Rel-17 NR CA configuration DOCOMO Communications Lab.
R5-211226 Updating UE capability for Rel-17 NR inter-band EN-DC configurations for band n1 DOCOMO Communications Lab.
R5-211839 Adding PICS for SUL with DL CA configurations Huawei, Hisilicon
5.3.31.3.1 Tx Requirements (Clause 6)
R5-210933 Updating clause 6.2C.2 for Rel-17 SUL combinations Huawei, Hisilicon
5.3.31.3.2 Rx Requirements (Clause 7)
R5-210934 Updating REFSENS for SUL for new R17 configurations Huawei, Hisilicon
5.3.31.3.3 Clauses 1-5 / Annexes
R5-210804 Update of R17 CADC configurations into TS38.521-1 clause 5 China Unicom, Huawei, HiSilicon
5.3.31.5.1 Tx Requirements (Clause 6)
R5-211270 Updating 6.2B.1.3 for Rel-17 NR inter-band EN-DC configurations for band n1 DOCOMO Communications Lab.
5.3.31.5.3 Clauses 1-5 / Annexes
R5-211006 Update to EN-DC R17 Configuration information in clause 5 Bureau Veritas
R5-211253 Updating Rel-17 NR inter-band EN-DC configurations for band n1 DOCOMO Communications Lab.
5.3.31.11 Discussion Papers / Work Plan / TC lists
R5-210935 Discussion about REFSENS for SUL testing for 3CC Huawei, Hisilicon
5.4.1 TS 38.521-3
R5-210304 Updates on configured Output Power Level for EN-DC test cases 6.2B.4.1.1.x Keysight Technologies UK Ltd
R5-210746 Updating Rel-16 EN-DC PC2 MOP to include powerClassNRPart-r16 Huawei, HiSilicon
R5-210747 Updating Rel-16 EN-DC PC2 MPR to include powerClassNRPart-r16 Huawei, HiSilicon
R5-210748 Updating Rel-16 EN-DC PC2 A-MPR to include powerClassNRPart-r16 Huawei, HiSilicon
R5-210749 Updating Rel-16 EN-DC PC2 configured output power to include powerClassNRPart-r16 Huawei, HiSilicon
R5-210750 TEI16 Status update of introduction of PowerClassNRPart capability Huawei, HiSilicon
R5-211840 Updating Rel-16 EN-DC PC2 MOP to include powerClassNRPart-r16 Huawei, HiSilicon
R5-211841 Updating Rel-16 EN-DC PC2 MPR to include powerClassNRPart-r16 Huawei, HiSilicon
R5-211842 Updating Rel-16 EN-DC PC2 A-MPR to include powerClassNRPart-r16 Huawei, HiSilicon
R5-211843 Updating Rel-16 EN-DC PC2 configured output power to include powerClassNRPart-r16 Huawei, HiSilicon
5.5.1.1 TS 36.508
R5-211127 Minor corrections of 4.1 for test environment conditions ZTE Corporation
5.5.1.2.1 Tx Requirements (Clause 6)
R5-211088 Correction to A-MPR test requirement of NS_22 in TC 6.2.4 Anritsu
R5-211257 Update for Band 48 in test case 6.2.2 ROHDE & SCHWARZ
R5-211920 Correction to A-MPR test requirement of NS_22 in TC 6.2.4 Anritsu
5.5.1.2.2 Rx Requirements (Clause 7)
R5-211258 Editorial Correction in test case 7.3A9 ROHDE & SCHWARZ
5.5.1.3 TS 36.521-2
R5-210481 Correction of applicability definition for 2Rx related test cases to exclude category 1bis UEs equipped with single Rx antenna CAICT, Spreadtrum Communications
R5-210482 Addition of the Additional Information for some RF test cases in 9.6.1 CAICT
R5-210598 Correction to Additional Information of 8.2.1.3.1_A and 8.7.1.1_A in Table 4.1-1 TTA
R5-210894 Correct of test applicability for TC with and without UL CA Sporton
R5-210990 Addition of Note 7 in the Additional Information column of RF conformance test cases with 2Rx and 4Rx Branch in secton 8 and section 9 CAICT
R5-211180 Correction of Table A.4.3-3d Google Inc.
R5-211844 Correction of applicability definition for 2Rx related test cases to exclude category 1bis UEs equipped with single Rx antenna CAICT, Spreadtrum Communications
R5-211845 Correct of test applicability for TC with and without UL CA Sporton
R5-211846 Correction of Table A.4.3-3d Google Inc.
5.5.1.4 TS 36.521-3
R5-210891 Correction of Table number for RRM Radio Link Monitoring Test Cases Sporton
R5-211847 Correction of Table number for RRM Radio Link Monitoring Test Cases Sporton
5.6.11 TS 37.571-5
R5-210052 Corrections for support of multiple signals in a GNSS Spirent Communications
R5-211848 Corrections for support of multiple signals in a GNSS Spirent Communications
5.6.15 TS 37.544
R5-210377 Correction of TRS numeric symbol Intertek
5.7 Outgoing liaison statements for provisional approval
R5-210313 LS on minimum requirements for Transmit ON/OFF time mask in UL MIMO FR1 TSG WG RAN5
R5-211600 Reply LS on nominal channel spacing calculation for two carriers at band n41 with 40MHz and 80MHz channel bandwidths TSG WG RAN5
R5-211609 Clarification on exception requirements for Intermodulation due to Dual uplink (IMD) TSG WG RAN5
R5-211826 LS on minimum requirements for Transmit ON/OFF time mask in UL MIMO FR1 TSG WG RAN5
6.3.2.1.1 Generic Procedures and Test Procedures (Clauses 4.5 / 4.5A & 4.9)
R5-210055 Corrections to generic test procedures for IMS ROHDE & SCHWARZ, Ericsson, MCC TF160
R5-210058 Update Generic Test Procedure for IMS MO speech call Ericsson
R5-210069 Correction to Table 4.5.2.2-4: NR RRC_IDLE Extension Keysight Technologies UK
R5-210070 Correction to generic procedure for UE-requested PDU session modification after S1 to N1 change Keysight Technologies UK
R5-210194 Correction to test procedure 4.9.7 MCC TF160
R5-210195 Corrections to test procedure 4.9.19 MCC TF160
R5-210402 Correction to RRC IDLE procedures Keysight Technologies UK, Qualcomm
R5-210573 Correction to Tracking area updating / Inter-system change from S1 mode to N1 mode in 5GMM/EMM-IDLE MediaTek Inc.
R5-211038 Addition of procedure for clearing Ues Last Registered PLMN Qualcomm Incorporated
R5-211272 Correction to clause 4.5.2 RRC_IDLE Qualcomm CDMA Technologies
R5-211369 Corrections to generic test procedures for IMS ROHDE & SCHWARZ, Ericsson, MCC TF160
R5-211370 Correction to generic procedure for UE-requested PDU session modification after S1 to N1 change Keysight Technologies UK
R5-211371 Correction to test procedure 4.9.7 MCC TF160
R5-211372 Correction to RRC IDLE procedures Keysight Technologies UK, Qualcomm
R5-211373 Addition of procedure for clearing Ues Last Registered PLMN Qualcomm Incorporated
6.3.2.1.2 Default NG-RAN RRC messages and IEs (Clause 4.6)
R5-210187 Editorial update IE PhysicalCellGroupConfig Ericsson
R5-210264 Update IE FailureInformation Ericsson
R5-210325 Editorial update IE DLDedicatedMessageSegment Ericsson
R5-210326 Editorial update DLDedicatedMessageSegment message Ericsson
R5-210328 Editorial update RRCReconfiguration message Ericsson
R5-210611 Update IE PDCCH-ConfigCommon Ericsson, MCC TF160, Anritsu
R5-210623 Correction to Table 4.6.1-13 RRCReconfiguration Huawei, Hisilicon
R5-210624 Correction to Table 4.6.3-185 SSB-MTC Huawei, Hisilicon, Ericsson
R5-210625 Correction to Table 4.6.3-192 TDD-UL-DL-ConfigCommon Huawei, Hisilicon
R5-210826 Editorial update IE ServingCellConfigCommon Ericsson
R5-211374 Update IE PDCCH-ConfigCommon Ericsson, MCC TF160, Anritsu
R5-211375 Correction to Table 4.6.3-185 SSB-MTC Huawei, Hisilicon, Ericsson
6.3.2.1.4 Test environment for SIG (Clause 6)
R5-210626 Correction to Table 6.4.1-11 USIM Configuration 11 Huawei, Hisilicon
R5-211033 Correction test frequencies for CA_n261(2A) for protocol testing Ericsson
R5-211034 Correction of protocol applicability for test frequencies for DC_xA_n261(2A) configurations Ericsson
6.3.2.1.5 Other clauses / Annexes
R5-210627 Correction to Table 4.8.2.1-7 Reference QoS rule 7 Huawei, Hisilicon
R5-211171 Update to RRCReconfiguration-Speech IE Ericsson
6.3.2.2 TS 38.508-2
R5-210393 Addition and update of PICS Lenovo, Motorola Mobility, Qualcomm
R5-210570 Update test case applicability for 6.2.3.9 MediaTek (Chengdu) Inc.
R5-210579 Add capability for I-RAT cell counting MediaTek Inc.
R5-211376 Addition and update of PICS Lenovo, Motorola Mobility, Qualcomm
6.3.2.4.2 Idle Mode (Clause 6)
R5-210062 Correction to NR Idle mode test case 6.4.1.1 Keysight Technologies UK
R5-210157 Editorial changes to 38.523-1 Section 6 Samsung
R5-210320 Correction to NR Idle mode test cases Keysight Technologies UK Ltd, Qualcomm
R5-210363 Correction to NR5G Idle mode TCs Qualcomm CDMA Technologies
R5-210401 Correction to NR Idle mode test case 6.1.1.6 Keysight Technologies UK
R5-210574 Correction to test case 6.1.1.3 MediaTek Inc.
R5-210576 Correction to test case 6.1.2.8 MediaTek Inc.
R5-210577 Correction to test case 6.4.1.2 MediaTek Inc.
R5-210609 Correction to PLMN Selection Test Case 6.2.1.2 Apple (UK) Limited
R5-210610 Correction to Inter-RAT Cell Reselection Test Case 6.4.3.1 Apple (UK) Limited
R5-210628 Correction to NR TC 6.1.1.6-PLMN Selection with MinimumPeriodicSearchTimer Huawei, Hisilicon
R5-210629 Correction to NR TC 6.1.2.2-Cell Selection Qqualmin Huawei, Hisilicon
R5-210630 Correction to NR TC 6.1.2.9-Cell Reselection Huawei, Hisilicon
R5-210631 Correction to NR TC 6.2.3.2-L2N cell reselection Huawei, Hisilicon
R5-210632 Correction to NR TC 6.2.3.4-N2L cell reselection Huawei, Hisilicon
R5-210633 Correction to NR TC 6.3.1.1-SoR security check successful Huawei, Hisilicon
R5-210634 Correction to NR TC 6.3.1.2-SoR ACK has NOT requested Huawei, Hisilicon
R5-210635 Correction to NR TC 6.3.1.3-SoR Security check unsuccessful Huawei, Hisilicon
R5-210636 Correction to NR TC 6.3.1.5-SoR UE configured but not receive Steering of Roaming from Network Huawei, Hisilicon
R5-210637 Correction to NR TC 6.3.1.8-Automatic PLMN selection mode Huawei, Hisilicon
R5-210807 Correction to NR Idle Mode Test Case 6.3.1.7 ZTE Corporation
R5-211022 Update to idle mode test cases 6.2.1.2, 6.2.1.3, 6.4.3.1 Qualcomm Incorporated
R5-211173 Correction NR RRC idle mode test case 6.1.2.14 ANRITSU LTD, Qualcomm
R5-211316 Remove Idle Mode test case 6.2.3.9 MediaTek Inc.
R5-211329 Correction to test case 6.1.1.3 MediaTek Inc.
R5-211330 Correction to test case 6.1.2.8 MediaTek Inc.
R5-211331 Correction to test case 6.4.1.2 MediaTek Inc.
R5-211377 Editorial changes to 38.523-1 Section 6 Samsung
R5-211378 Correction to NR5G Idle mode TCs Qualcomm CDMA Technologies
R5-211379 Correction to NR TC 6.3.1.1-SoR security check successful Huawei, Hisilicon
R5-211380 Correction to NR TC 6.3.1.2-SoR ACK has NOT requested Huawei, Hisilicon
R5-211381 Remove Idle Mode test case 6.2.3.9 MediaTek Inc.
6.3.2.4.3.1.2 MAC
R5-210022 Correction to NR MAC test case 7.1.1.4.2.5 Keysight Technologies UK Ltd
R5-210063 Correction to NR MAC test case 7.1.1.8.1 Keysight Technologies UK
R5-210064 Correction to NR MAC test case 7.1.1.9.1 Keysight Technologies UK, Qualcomm
R5-210065 Correction to NR MAC test case 7.1.1.4.2.5 Keysight Technologies UK
R5-210158 Editorial changes to 38.523-1 Section 7 Samsung
R5-210321 Correction to UL-SCH TBS selection test cases common clause 7.1.1.4.2.0 Keysight Technologies UK, Samsung
R5-210542 Corrections to MAC RACH Beam Failure test case Lenovo, Motorola Mobility, MCC TF160
R5-210567 Corrections to DL SPS test case Lenovo, Motorola Mobility, MCC TF160
R5-210568 Corrections to UL configured grant type 1 test case Lenovo, Motorola Mobility, MCC TF160
R5-210569 Corrections to UL configured grant type 2 test case Lenovo, Motorola Mobility, MCC TF160
R5-210575 Correction to NR5G MAC TC 7.1.1.1.3 Qualcomm CDMA Technologies, Keysight Technologies UK Ltd., MCC TF160
R5-210638 Correction to NR TC 7.1.1.2.2-PDSCH Aggregate Huawei, Hisilicon, MCC TF160
R5-210639 Correction to NR TC 7.1.1.3.8.X-PHR report Huawei, Hisilicon
R5-211382 Correction to NR MAC test case 7.1.1.8.1 Keysight Technologies UK
R5-211383 Editorial changes to 38.523-1 Section 7 Samsung
R5-211384 Correction to NR TC 7.1.1.2.2-PDSCH Aggregate Huawei, Hisilicon, MCC TF160
R5-211385 Correction to NR TC 7.1.1.3.8.X-PHR report Huawei, Hisilicon
6.3.2.4.3.1.3 RLC
R5-210197 Corrections to RLC test case 7.1.2.3.8 MCC TF160
R5-210640 Correction to NR TC 7.1.2.3.3 and 7.1.2.3.4-RLC SN sequence Huawei, Hisilicon, Qualcomm CDMA Technologies, MCC TF160
R5-211386 Correction to NR TC 7.1.2.3.3 and 7.1.2.3.4-RLC SN sequence Huawei, Hisilicon, Qualcomm CDMA Technologies, MCC TF160
6.3.2.4.3.1.4 PDCP
R5-210360 Correction to NR5G PDCP TC 7.1.3.1.1 and 7.1.3.1.2 Qualcomm CDMA Technologies
R5-210641 Correction to NR TC 7.1.3.1.1 and 7.1.3.1.2-PDCP SN sequence Huawei, Hisilicon, Qualcomm CDMA Technologies, MCC TF160
R5-211387 Correction to NR TC 7.1.3.1.1 and 7.1.3.1.2-PDCP SN sequence Huawei, Hisilicon, Qualcomm CDMA Technologies, MCC TF160
6.3.2.4.4.1.1 RRC Connection Management Procedures (clause 8.1.1)
R5-210361 Correction to NR5G RRC TC 8.1.1.3.3 Qualcomm CDMA Technologies
R5-211009 Update to NR RRC test case 8.1.1.3.2 Qualcomm Incorporated
R5-211312 Correction to NR5GC RRC test case 8.1.1.2.4 Keysight Technologies UK
R5-211388 Update to NR RRC test case 8.1.1.3.2 Qualcomm Incorporated
6.3.2.4.4.1.3 RRC Measurement Configuration Control and Reporting (clause 8.1.3)
R5-210642 Correction to NR test case 8.1.3.1.13-CSI-RS based intra-freq measure Huawei, Hisilicon
R5-210643 Correction to NR TC 8.1.3.1.15A-bliacklisting Huawei, Hisilicon
R5-210644 Correction to NR TC 8.1.3.2.2-Event B2 Huawei, Hisilicon
R5-211390 Correction to NR test case 8.1.3.1.13-CSI-RS based intra-freq measure Huawei, Hisilicon
6.3.2.4.4.1.4 RRC Handover (clause 8.1.4)
R5-210066 Correction to NR5GC IRAT test case 8.1.4.2.1.1 Keysight Technologies UK
R5-210067 Correction of NR RRC test case 8.1.4.1.5 Keysight Technologies UK
R5-210131 Correction of NR CA TC 8.1.4.1.7.x MediaTek Inc., Keysight Technologies
R5-210132 Correction of NR CA TC 8.1.4.1.9.x MediaTek Inc., Keysight Technologies
R5-210367 Correction to NR5G RRC IRAT TC 8.1.4.2.1.1 Qualcomm CDMA Technologies
R5-211332 Correction of NR RRC test case 8.1.4.1.5 Keysight Technologies UK
R5-211391 Correction of NR CA TC 8.1.4.1.9.x MediaTek Inc., Keysight Technologies
6.3.2.4.4.1.5 RRC Others (clause 8.1.5)
R5-210379 Update of RRC TC 8.1.5.6.5.1 Intertek
R5-210645 Correction to NR TC 8.1.5.6.1-RLF Huawei, Hisilicon
R5-210646 Correction to NR TC 8.1.5.8.1-Latency check Huawei, Hisilicon, MCC TF160, Qualcomm
R5-210647 Addition of NR TC 8.1.5.8.2.1-intra-band SCell Latency check Huawei, Hisilicon, MCC TF160
R5-210648 Addition of NR TC 8.1.5.8.2.2-inter-band SCell Latency check Huawei, Hisilicon, MCC TF160
R5-210649 Addition of NR TC 8.1.5.8.2.3-intra-band non-contigous SCell Latency check Huawei, Hisilicon, MCC TF160
R5-211027 Update to NR RRC test case 8.1.5.8.1 Qualcomm Incorporated
R5-211234 Update to NR RRC UE capability transfer test case 8.1.5.1.1 Qualcomm Incorporated
R5-211296 Correction to test case 8.1.5.1.1 MediaTek Inc.
R5-211392 Correction to NR TC 8.1.5.8.1-Latency check Huawei, Hisilicon, MCC TF160, Qualcomm
R5-211393 Addition of NR TC 8.1.5.8.2.1-intra-band SCell Latency check Huawei, Hisilicon, MCC TF160
R5-211394 Correction to test case 8.1.5.1.1 MediaTek Inc.
6.3.2.4.4.2.1 RRC UE Capability / Others (clause 8.2.1)
R5-211246 Update to MR-DC RRC UE capability transfer test case 8.2.1.1.1 Qualcomm Incorporated
R5-211297 Correction to test case 8.2.1.1.1 MediaTek Inc.
R5-211395 Correction to test case 8.2.1.1.1 MediaTek Inc.
6.3.2.4.4.2.2 RRC Radio Bearer (clause 8.2.2)
R5-210159 Editorial changes to 38.523-1 Section 8 Samsung
R5-210650 Correction to NR-DC TC 8.2.2.7.2-bearer type change without security key change Huawei, Hisilicon
R5-210651 Correction to NR-DC TC 8.2.2.9.2-Split DRB Huawei, Hisilicon
6.3.2.4.4.2.3 RRC Measurement / Handovers (clause 8.2.3)
R5-210362 Correction to NR5G TCs 8.1.X on SINR reporting Qualcomm CDMA Technologies, Mediatek
R5-210378 Update of RRC TC 8.2.3.12.1 Intertek
R5-210389 Correction to MR-DC test case 8.2.3.2.1 Guangdong OPPO Mobile Telecom.
R5-210390 Correction to MR-DC test case 8.2.3.6.1a and 8.2.3.6.1b Guangdong OPPO Mobile Telecom.
R5-210391 Correction to MR-DC test case 8.2.3.7.1 Guangdong OPPO Mobile Telecom.
R5-210392 Correction to MR-DC test case 8.2.3.9.1 Guangdong OPPO Mobile Telecom.
R5-210397 Correction to NR-DC Test case 8.2.2.8.2 ANRITSU LTD
R5-210619 Correction to NR-DC RRC test case 8.2.3.14.2 TDIA, CATT
R5-210620 Correction to NR-DC RRC test case 8.2.3.14.2 TDIA, CATT
R5-210652 Correction to NR-DC TC 8.2.3.16.2-Intra NR measurements Huawei, Hisilicon
R5-211389 Correction to NR5G TCs 8.1.X on SINR reporting Qualcomm CDMA Technologies, Mediatek
R5-211396 Correction to MR-DC test case 8.2.3.7.1 Guangdong OPPO Mobile Telecom.
R5-211397 Correction to NR-DC RRC test case 8.2.3.14.2 TDIA, CATT
6.3.2.4.4.2.4 RRC Carrier Aggregation (clause 8.2.4)
R5-210068 Correction to NR CA testcases 8.2.4.1.1.x Keysight Technologies UK
R5-210561 Correction to EN-DC test case 8.2.4.3.1.3 ANRITSU LTD
6.3.2.4.4.2.5 RRC Reconfiguration / Radio Link Failure (clause 8.2.5)
R5-210265 Addition of NR-DC RRC TC 8.2.5.3.2 Qualcomm CDMA Technologies
R5-210266 Addition of NR-DC RRC TC 8.2.5.4.2 Qualcomm CDMA Technologies
R5-210365 Correction to NR-DC RRC TC 8.2.5.1.2 Qualcomm CDMA Technologies, TDIA, CATT
R5-210366 Correction to NR-DC RRC TC 8.2.5.2.2 Qualcomm CDMA Technologies
R5-210621 Correction of NR-DC tese case 8.2.5.1.2 TDIA, CATT
R5-211398 Addition of NR-DC RRC TC 8.2.5.3.2 Qualcomm CDMA Technologies
R5-211399 Addition of NR-DC RRC TC 8.2.5.4.2 Qualcomm CDMA Technologies
R5-211400 Correction to NR-DC RRC TC 8.2.5.1.2 Qualcomm CDMA Technologies, TDIA, CATT
6.3.2.4.4.2.6 RRC Others (clause 8.2.6)
R5-210653 Correction to NR-DC TC 8.2.6.1.2.1-RLC failure Huawei, Hisilicon
R5-211401 Correction to NR-DC TC 8.2.6.1.2.1-RLC failure Huawei, Hisilicon
6.3.2.4.5.3 MM Registration & De-registration (clauses 9.1.5 & 9.1.6)
R5-210026 Addition of new 5GS NAS test case to test handling of extended octets NTT DOCOMO INC.
R5-210160 Editorial changes to 38.523-1 Sections 9-12 Samsung
R5-210191 Correction of NR test case 9.1.5.1.8 Qualcomm Incorporated, ANRITSU LTD
R5-210267 Update to 5GC NAS TC 9.1.5.2.9 Qualcomm CDMA Technologies
R5-210322 Correction to 5GMM Initial Registration test cases Keysight Technologies UK Ltd, Qualcomm
R5-210572 Removing test case 9.1.5.2.9 MediaTek Inc.
R5-211333 Removing test case 9.1.5.2.9 MediaTek Inc.
R5-211402 Addition of new 5GS NAS test case to test handling of extended octets NTT DOCOMO INC.
6.3.2.4.5.5 MM SMS Over NAS (clause 9.1.8)
R5-211007 Correction to NR TC 9.1.8.1-SMS Huawei, Hisilicon
R5-211403 Correction to NR TC 9.1.8.1-SMS Huawei, Hisilicon
6.3.2.4.5.6 Inter-system Mobility (clause 9.3)
R5-210794 Correction to 5GMM Inter-system mobility test case 9.3.1.2 Keysight Technologies UK
R5-211019 Update of Inter system mobility test case 9.3.1.1 Qualcomm Incorporated
R5-211404 Correction to 5GMM Inter-system mobility test case 9.3.1.2 Keysight Technologies UK
R5-211405 Update of Inter system mobility test case 9.3.1.1 Qualcomm Incorporated
6.3.2.4.6.3 SM UE-requested PDU session establishment / modification & release (clauses 10.1.4 / 10.1.5 & 10.1.6)
R5-210398 Correction to NR5GC NAS test cases for handling additional PDN ANRITSU LTD
6.3.2.4.8.1 EPS Fallback
R5-210133 Update of power level tables for Multilayer EPSFB TC 11.1.x MediaTek Inc.
R5-210268 Correction to EPS Fallback Test Case 11.1.1 Qualcomm CDMA Technologies, Anritsu
R5-210654 Correction to NR TC 11.1.3-EPS Fallback with handover Huawei, Hisilicon
R5-211319 Correction to EPS FallBack test cases 11.1.X ANRITSU LTD, Qualcomm, Keysight
R5-211406 Correction to NR TC 11.1.3-EPS Fallback with handover Huawei, Hisilicon
R5-211407 Correction to EPS FallBack test cases 11.1.X ANRITSU LTD, Qualcomm, Keysight
R5-211547 Correction to EPS Fallback Test Case 11.1.1 Qualcomm CDMA Technologies, Anritsu
6.3.2.4.8.3 Unified Access Control (UAC)
R5-210198 Corrections to test case 11.3.1 MCC TF160
R5-210356 Corrections to test case 11.3.1 ROHDE & SCHWARZ, MCC TF160
R5-210364 Correction to NR5G UAC TC 11.3.4 Qualcomm CDMA Technologies, Keysight
R5-211025 Update of UAC test case 11.3.6 Qualcomm Incorporated
R5-211318 Correction to NR5GC UAC test case 11.3.7 Keysight Technologies UK, Qualcomm
R5-211408 Correction to NR5G UAC TC 11.3.4 Qualcomm CDMA Technologies, Keysight
R5-211409 Update of UAC test case 11.3.6 Qualcomm Incorporated
R5-211410 Correction to NR5GC UAC test case 11.3.7 Keysight Technologies UK, Qualcomm
6.3.2.4.8.4 Emergency Services
R5-210163 Update of TC for IMS emergency TC 11.4.10 5GMM-REGISTERED.NORMAL-SERVICE N26 interface not supported N1 to S1 Samsung
R5-210164 Update to indication of Max nr cells in emergency test cases being active during test execution Samsung
R5-210165 Introduction of new IMS emergency TC 11.4.11 5GMM-REGISTERED.NORMAL-SERVICE N26 interface not supported S1 to N1 Samsung
R5-210388 Correction to 11.4.2 and 11.4.3 MediaTek Inc.
R5-210571 Correction to 11.4.8 MediaTek Inc.
R5-211411 Correction to 11.4.2 and 11.4.3 MediaTek Inc.
6.3.2.5 TS 38.523-2
R5-210025 Update release applicability of RRC TC 8.1.1.2.4 NTT DOCOMO INC.
R5-210161 Aligning content of 38.523-2 with 38.523-1 Samsung
R5-210162 Adding missing applicability for TC 6.1.2.7 and 8.1.5.2.2 Samsung
R5-210166 Adding applicability for new IMS emergency TC 11.4.11 Samsung
R5-210190 Update of 5G-NR test cases applicability Qualcomm Incorporated, Mediatek
R5-210578 Update test case applicability for 6.2.3.9 MediaTek Inc.
R5-210655 Correction to NR TC applicability for 5GS Huawei, Hisilicon
R5-211315 Update test case applicability for 6.2.3.9 MediaTek Inc.
R5-211412 Update release applicability of RRC TC 8.1.1.2.4 NTT DOCOMO INC.
R5-211413 Adding missing applicability for TC 6.1.2.7 and 8.1.5.2.2 Samsung
R5-211414 Adding applicability for new IMS emergency TC 11.4.11 Samsung
R5-211415 Update of 5G-NR test cases applicability Qualcomm Incorporated, Mediatek
R5-211416 Correction to NR TC applicability for 5GS Huawei, Hisilicon
6.3.2.6 TS 38.523-3
R5-210199 5G Test Models updates MCC TF160
R5-211417 5G Test Models updates MCC TF160
6.3.2.7 TS 34.229-1
R5-210059 Voiding A.1.9 ROHDE & SCHWARZ
R5-210347 Adding NG.114 dependencies to Annex A.2.1 ROHDE & SCHWARZ
R5-211418 Adding NG.114 dependencies to Annex A.2.1 ROHDE & SCHWARZ
6.3.2.8 TS 34.229-2
R5-210079 Addition of applicabilities for new IMS over 5GS test cases ROHDE & SCHWARZ
R5-210094 Corrections and extensions to applicability statements of IMS over 5GS test cases ROHDE & SCHWARZ
R5-210346 Adding NG.114 dependencies and PICS for test case 7.4 ROHDE & SCHWARZ
R5-211299 Applicability of ‘Re-registration after capability update / 5GS’ test case Apple Inc.
R5-211419 Addition of applicabilities for new IMS over 5GS test cases ROHDE & SCHWARZ
R5-211420 Corrections and extensions to applicability statements of IMS over 5GS test cases ROHDE & SCHWARZ
6.3.2.10 TS 34.229-5
R5-210056 Corrections to A.5 on MT Voice Call ROHDE & SCHWARZ, MCC TF160
R5-210057 Corrections to test case 6.3 ROHDE & SCHWARZ, Anritsu, Keysight, Qualcomm
R5-210072 Addition of IMS over 5GS test case 7.25 ROHDE & SCHWARZ
R5-210095 Corrections to test case 6.4 ROHDE & SCHWARZ
R5-210118 Addition of IMS over 5GS test case 7.27 ZTE Corporation
R5-210119 Addition of IMS over 5GS test case 7.28 ZTE Corporation
R5-210120 Addition of IMS over 5GS test case 7.29 ZTE Corporation
R5-210121 Addition of IMS over 5GS test case 7.30 ZTE Corporation
R5-210122 Addition of IMS over 5GS test case 7.31 ZTE Corporation
R5-210123 Addition of IMS over 5GS test case 7.32 ZTE Corporation
R5-210124 Addition of IMS over 5GS test case 7.33 ZTE Corporation
R5-210125 Addition of IMS over 5GS test case 7.34 ZTE Corporation
R5-210188 New References ZTE Corporation
R5-210189 Update test case 7.4, 7.5, 7.6 and 7.7 ZTE Corporation
R5-210196 Corrections to SMS test case 9.5 MCC TF160
R5-210259 Corrections to A.11 ROHDE & SCHWARZ
R5-210269 Correction to Annex A.9 EPS Fallback for Voice Call / 5GS Qualcomm CDMA Technologies
R5-210270 Correction to IMS over 5GS TC 6.2 Qualcomm CDMA Technologies
R5-210271 Correction to IMS over 5GS TC 7.2 Qualcomm CDMA Technologies
R5-210272 Correction to IMS over 5GS TC 7.11 Qualcomm CDMA Technologies
R5-210343 Corrections and extensions to test case 7.4 ROHDE & SCHWARZ
R5-210348 Adding NG.114 dependencies to Annex A.4 ROHDE & SCHWARZ
R5-210357 Editorial corrections to TS 34.229-5 ROHDE & SCHWARZ
R5-210368 Correction to IMS over 5GS TC 7.3 Qualcomm CDMA Technologies
R5-210369 Addition of IMS over 5GS TC 7.14 Qualcomm CDMA Technologies
R5-210554 Adding references ROHDE & SCHWARZ
R5-210582 Addition of A.15.1 MTSI MO Video Call / with preconditions / 5GS Qualcomm CDMA Technologies
R5-210589 Correction to Annex A.9 EPS Fallback for Voice Call / 5GS Qualcomm CDMA Technologies, Anritsu
R5-210590 Correction to IMS over 5GS TC 6.2 Qualcomm CDMA Technologies
R5-210591 Correction to IMS over 5GS TC 7.2 Qualcomm CDMA Technologies, Anritsu, MCC TF160
R5-210592 Correction to IMS over 5GS TC 7.11 Qualcomm CDMA Technologies, Keysight Technologies, Anritsu
R5-210656 Correction to NR IMS TC 6.5-UE de-reg after ISIM refresh Huawei, Hisilicon
R5-210657 Correction to NR IMS TC 7.10-Content Type not present Huawei, Hisilicon
R5-210658 Correction to NR IMS A.9.2-Optional UPDATE after EPS fallback Huawei, Hisilicon
R5-210659 Withdrawing NR IMS TC 7.3-MO voice-UE preconditions enabled but not included in INVITE Huawei, Hisilicon
R5-210660 Correction to NR IMS TC 10.1-Conformance requirement update Huawei, Hisilicon
R5-210661 Addition of NR IMS TC 7.26-MO CAT forking model Huawei, Hisilicon
R5-210662 Addition of NR IMS TC 8.26-MO hold without announcement Huawei, Hisilicon
R5-210663 Addition of NR IMS TC 8.28-MT hold without announcement Huawei, Hisilicon
R5-210664 Addition of NR IMS TC 8.30-Subscription to MWI event Huawei, Hisilicon
R5-210665 Addition of NR IMS TC 8.31-Creating and leaving conference Huawei, Hisilicon
R5-210666 Addition of NR IMS TC 8.32-Inviting user to conference by REFER Huawei, Hisilicon
R5-210667 Addition of NR IMS TC 8.34-Three way session Huawei, Hisilicon
R5-210668 Addition of NR IMS TC 8.36-MO explicit communication transfer Huawei, Hisilicon
R5-210882 Correction to NR IMS TC 7.1-Shorter Retry-after period Huawei, Hisilicon
R5-211043 Addition of new IMS over 5GS TC 8.38 Communication Waiting and cancelling the call / 5GS Qualcomm Incorporated
R5-211334 Addition of IMS over 5GS test case 7.25 ROHDE & SCHWARZ
R5-211421 Addition of IMS over 5GS test case 7.27 ZTE Corporation
R5-211422 Addition of IMS over 5GS test case 7.28 ZTE Corporation
R5-211423 Addition of IMS over 5GS test case 7.29 ZTE Corporation
R5-211424 Addition of IMS over 5GS test case 7.30 ZTE Corporation
R5-211425 Addition of IMS over 5GS test case 7.31 ZTE Corporation
R5-211426 Addition of IMS over 5GS test case 7.32 ZTE Corporation
R5-211427 Addition of IMS over 5GS test case 7.33 ZTE Corporation
R5-211428 Addition of IMS over 5GS test case 7.34 ZTE Corporation
R5-211429 Update test case 7.4, 7.5, 7.6 and 7.7 ZTE Corporation
R5-211430 Editorial corrections to TS 34.229-5 ROHDE & SCHWARZ
R5-211431 Addition of IMS over 5GS TC 7.14 Qualcomm CDMA Technologies
R5-211432 Adding references ROHDE & SCHWARZ
R5-211433 Addition of A.15.1 MTSI MO Video Call / with preconditions / 5GS Qualcomm CDMA Technologies
R5-211434 Correction to IMS over 5GS TC 7.2 Qualcomm CDMA Technologies, Anritsu, MCC TF160
R5-211435 Correction to IMS over 5GS TC 7.11 Qualcomm CDMA Technologies, Keysight Technologies, Anritsu
R5-211436 Correction to NR IMS TC 7.10-Content Type not present Huawei, Hisilicon
R5-211437 Correction to NR IMS A.9.2-Optional UPDATE after EPS fallback Huawei, Hisilicon
R5-211438 Correction to NR IMS TC 10.1-Conformance requirement update Huawei, Hisilicon
R5-211439 Addition of NR IMS TC 7.26-MO CAT forking model Huawei, Hisilicon
R5-211440 Addition of NR IMS TC 8.26-MO hold without announcement Huawei, Hisilicon
R5-211441 Addition of NR IMS TC 8.28-MT hold without announcement Huawei, Hisilicon
R5-211442 Addition of NR IMS TC 8.30-Subscription to MWI event Huawei, Hisilicon
R5-211443 Addition of NR IMS TC 8.31-Creating and leaving conference Huawei, Hisilicon
R5-211444 Addition of NR IMS TC 8.32-Inviting user to conference by REFER Huawei, Hisilicon
R5-211445 Addition of NR IMS TC 8.34-Three way session Huawei, Hisilicon
R5-211446 Addition of NR IMS TC 8.36-MO explicit communication transfer Huawei, Hisilicon
R5-211447 Addition of new IMS over 5GS TC 8.38 Communication Waiting and cancelling the call / 5GS Qualcomm Incorporated
6.3.2.11 TS 36.508
R5-210399 Inclusion of SK-Counter IE in RRCConnectionReconfiguration ANRITSU LTD
6.3.2.20 Discussion Papers / Work Plan / TC lists
R5-210167 MR-DC Ericsson
R5-210185 SST and NG.116 Ericsson
R5-210317 Discussion paper on IMS over 5GS test case 7.3 regarding flexible use of preconditions ROHDE & SCHWARZ
R5-210580 Discussion paper to remove test case 9.1.5.2.9 from TS 38.523-1 MediaTek Inc.
R5-210806 Discussion paper on confirming successful resource reservation ROHDE & SCHWARZ
R5-211045 Discussion paper on impact of UE’s highest channel bandwidth capability on Transport Block Selection test cases Qualcomm Incorporated
R5-211323 MR-DC Ericsson
R5-211325 Title: Discussion paper on IMS 180 Ringing before or after resource reservation Huawei, Hisilicon
R5-211362 Discussion paper on impact of UE’s highest channel bandwidth capability on Transport Block Selection test cases Qualcomm Incorporated
6.3.6.3 TS 36.523-2
R5-210152 Adding missing applicability for TC 8.2.2.14.1 Samsung
R5-211448 Adding missing applicability for TC 8.2.2.14.1 Samsung
6.3.7.2 TS 38.508-2
R5-211128 Correction of Table A.4.3.2B.2.3.12-1 Google Inc.
R5-211449 Correction of Table A.4.3.2B.2.3.12-1 Google Inc.
6.3.9.1 TS 38.508-1
R5-211328 Correction to frequency parameters for band n53 Keysight Technologies UK, Nokia
6.3.9.3 TS 38.523-3
R5-210355 Guidelines on test execution for bands n14 and n53 MCC TF160, Nokia, AT&T
6.3.10.1 TS 36.508
R5-210342 Correction to NB-IoT Common contents of system information messages CATT, TDIA
6.3.11.1 TS 36.508
R5-211172 Editorial updates to RACH-ConfigCommon IE Ericsson
R5-211450 Editorial updates to RACH-ConfigCommon IE Ericsson
6.3.11.4 TS 36.523-2
R5-211130 Completion C384 and C385 of Table 4-1a Google Inc.
R5-211451 Completion C384 and C385 of Table 4-1a Google Inc.
6.3.13.2 TS 36.523-1
R5-211162 Addition of E-UTRAN TC 8.2.4.30.1 DAPS handover China Telecom
R5-211452 Addition of E-UTRAN TC 8.2.4.30.1 DAPS handover China Telecom
6.3.13.3 TS 36.523-2
R5-211356 Adding applicability for E-UTRAN TC 8.2.4.30.1 DAPS handover China Telecom
R5-211453 Adding applicability for E-UTRAN TC 8.2.4.30.1 DAPS handover China Telecom
6.3.14.3 TS 38.523-1
R5-210669 Addition of TC 7.1.1.3.1-UL grant prioritization Huawei, Hisilicon
R5-210769 Corrections to DL Multi SPS test case Lenovo, Motorola Mobility, MCC TF160
R5-211313 Addition of TC 7.1.1.3.11 - UL grant prioritization Huawei, Hisilicon
R5-211454 Corrections to DL Multi SPS test case Lenovo, Motorola Mobility, MCC TF160
6.3.14.4 TS 38.523-2
R5-210670 Correction to NR TC applicability for IIoT Huawei, Hisilicon
R5-211455 Correction to NR TC applicability for IIoT Huawei, Hisilicon
6.3.15.1 TS 38.508-1
R5-210687 Correction to Table 4.6.3-25B CondReconfigId Huawei, Hisilicon
R5-210688 Correction to Table 4.6.3-25C CondReconfigToAddModList Huawei, Hisilicon
R5-210689 Correction to Table 4.6.3-25D ConditionalReconfiguration Huawei, Hisilicon
R5-210690 Correction to Table 4.6.3-142 ReportConfigNR Huawei, Hisilicon
R5-211456 Correction to Table 4.6.3-142 ReportConfigNR Huawei, Hisilicon
6.3.15.2 TS 38.508-2
R5-210695 Add UE capability for NR MobEnc Huawei, Hisilicon
R5-211457 Add UE capability for NR MobEnc Huawei, Hisilicon
6.3.15.3 TS 38.523-1
R5-210691 Addition of NR TC 8.1.4.4.1-Conditional handover Success Huawei, Hisilicon
R5-210692 Addition of NR TC 8.1.4.4.2 -Conditional handover modify conditional handover configuration Huawei, Hisilicon
R5-210693 Addition of NR TC 8.1.4.4.3-Conditional handover Failure Huawei, Hisilicon
R5-211458 Addition of NR TC 8.1.4.4.1-Conditional handover Success Huawei, Hisilicon
R5-211459 Addition of NR TC 8.1.4.4.2 -Conditional handover modify conditional handover configuration Huawei, Hisilicon
R5-211460 Addition of NR TC 8.1.4.4.3-Conditional handover Failure Huawei, Hisilicon
6.3.15.4 TS 38.523-2
R5-210694 Correction to applicability for NR MobEnc Huawei, Hisilicon
R5-211461 Correction to applicability for NR MobEnc Huawei, Hisilicon
6.3.16.1 TS 38.508-1
R5-210698 Addition of IE SL-PreconfigurationNR Huawei, Hisilicon
R5-210699 Addition of V2X NAS IEs Huawei, Hisilicon
R5-210700 Addition of SI combination for NR SL Huawei, Hisilicon
R5-210701 Correction of NR SL IE SL-BWP-ConfigCommon Huawei, Hisilicon
R5-210702 Correction of NR SL IE SL-BWP-PoolConfigCommon Huawei, Hisilicon
R5-210703 Correction of NR SL IE SL-ConfigDedicatedNR Huawei, Hisilicon
R5-210704 Correction of NR SL IE SL-FreqConfigCommon Huawei, Hisilicon
R5-210705 Correction of NR SL IE SL-LogicalChannelConfig Huawei, Hisilicon
R5-210706 Correction of NR SL IE SL-MeasConfigInfo Huawei, Hisilicon
R5-210707 Correction of NR SL IE SL-PDCP-Config Huawei, Hisilicon
R5-210708 Correction of NR SL IE SL-RadioBearerConfig Huawei, Hisilicon
R5-210709 Correction of NR SL IE SL-ResourcePool Huawei, Hisilicon
R5-210710 Correction of NR SL IE SL-RLC-BearerConfig Huawei, Hisilicon
R5-210711 Correction of NR SL IE SL-RLC-Config Huawei, Hisilicon
R5-210712 Correction of NR SL IE SL-SDAP-Config Huawei, Hisilicon
R5-210713 Correction to NR Uu IE ARFCN-ValueNR Huawei, Hisilicon
R5-210714 Correction to NR Uu IE SCS-SpecificCarrier Huawei, Hisilicon
R5-210715 Correction to PC5-RRC message RRCReconfigurationSidelink Huawei, Hisilicon
R5-210716 Correction to PC5-RRC message UECapabilityEnquirySidelink Huawei, Hisilicon
R5-210717 Correction to PC5-RRC message UECapabilityInformationSidelink Huawei, Hisilicon
R5-211335 Correction of NR SL IE SL-BWP-PoolConfigCommon Huawei, Hisilicon
R5-211336 Correction of NR SL IE SL-SDAP-Config Huawei, Hisilicon
R5-211337 Correction to PC5-RRC message RRCReconfigurationSidelink Huawei, Hisilicon
R5-211338 Correction to PC5-RRC message UECapabilityEnquirySidelink Huawei, Hisilicon
R5-211339 Correction to PC5-RRC message UECapabilityInformationSidelink Huawei, Hisilicon
R5-211462 Addition of SI combination for NR SL Huawei, Hisilicon
6.3.17.3 TS 38.523-1
R5-210880 Correction to MultipleCoreset test case Lenovo, Motorola Mobility
R5-210881 New MIMO enhancements test case Lenovo, Motorola Mobility
6.3.18.2 TS 38.508-2
R5-210331 Adding scell dormancy indication outside active time to physical layer baseline implementation capabilities CATT
R5-211463 Adding scell dormancy indication outside active time to physical layer baseline implementation capabilities CATT
6.3.18.3 TS 38.509
R5-210372 Addition of UAI test function Qualcomm CDMA Technologies
R5-211283 Addition of UAI test function Qualcomm CDMA Technologies
R5-211549 Addition of UAI test function Qualcomm CDMA Technologies
6.3.18.4 TS 38.523-1
R5-210329 Addition of UE power saving test case 7.1.1.12.2 CATT
R5-210330 Addition of new test cases 7.1.1.12.4, 7.1.1.12.5 and 7.1.1.12.6 for UE power saving in NR CATT
R5-210333 Correction test purpose to MAC test case 7.1.1.12.1 CATT
R5-211358 Adding new test cases of SCell Dormancy Indication for UE power saving in NR CATT
6.3.18.5 TS 38.523-2
R5-210332 Addition of test applicabilities for UE power saving in NR CATT
R5-211464 Addition of test applicabilities for UE power saving in NR CATT
6.3.19.1 TS 38.508-1
R5-210371 Updates to SIB1 and SIB10 for Rel-16 NPN Qualcomm CDMA Technologies
R5-210373 Addition of System information combination for Rel-16 NPN Qualcomm CDMA Technologies
R5-210374 Addition of NID information for Rel-16 NPN Qualcomm CDMA Technologies
R5-210375 Updates to NAS messages for Rel-16 NPN Qualcomm CDMA Technologies
R5-211465 Updates to SIB1 and SIB10 for Rel-16 NPN Qualcomm CDMA Technologies
R5-211466 Addition of System information combination for Rel-16 NPN Qualcomm CDMA Technologies
R5-211548 Addition of NID information for Rel-16 NPN Qualcomm CDMA Technologies
6.3.20.3 TS 38.523-1
R5-210370 Addition of RACS RRC TC 8.1.5.9.1 Qualcomm CDMA Technologies
R5-210430 Addition of new NAS Test case 9.1.9.2 for testing RACS UE Configuration Update Tech Mahindra Limited
6.3.20.4 TS 38.523-2
R5-210513 Addition of applicability for new NAS Test case 9.1.9.2 Tech Mahindra Limited
6.3.20.10 Discussion Papers / Work Plan / TC lists
R5-210277 Discussion paper for RRC Segmentation in Rel-16 RACS Qualcomm CDMA Technologies
R5-210376 Addition of test function Set UE Capability Info Qualcomm CDMA Technologies
R5-211324 Discussion paper for RRC Segmentation in Rel-16 RACS Qualcomm CDMA Technologies
R5-211550 Addition of test function Set UE Capability Info Qualcomm CDMA Technologies
6.3.22.1 TS 38.508-1
R5-210288 Introduction of definition of common environment for R16 NR Immediate MDT CMCC, ZTE
R5-210314 Updating Contents of RRC messages for Logged MDT test cases ZTE Corporation, CMCC
R5-211467 Introduction of definition of common environment for R16 NR Immediate MDT CMCC, ZTE
R5-211468 Updating Contents of RRC messages for Logged MDT test cases ZTE Corporation, CMCC
6.3.22.2 TS 38.508-2
R5-210289 Introduction of common implementation conformance statements for R16 NR SON and MDT CMCC, ZTE, MediaTek Inc, HiSilicon
R5-211469 Introduction of common implementation conformance statements for R16 NR SON and MDT CMCC, ZTE, MediaTek Inc, HiSilicon
6.3.22.3 TS 38.523-1
R5-210029 Addition of new MDT test case 8.1.6.1.2.1 ZTE, SRTC, Tejet
R5-210030 Addition of new MDT test case 8.1.6.1.2.2 ZTE, SRTC, Tejet
R5-210031 Addition of new MDT test case 8.1.6.1.2.3 ZTE, SRTC, Tejet
R5-210032 Addition of new MDT test case 8.1.6.1.2.4 ZTE, SRTC, Tejet
R5-210033 Addition of new MDT test case 8.1.6.1.2.5 ZTE, SRTC, Tejet
R5-210034 Addition of new MDT test case 8.1.6.1.2.6 ZTE Corporation
R5-210035 Addition of new MDT test case 8.1.6.1.2.7 ZTE Corporation
R5-210036 Addition of new MDT test case 8.1.6.1.2.8 ZTE Corporation
R5-210037 Addition of new MDT test case 8.1.6.1.2.9 ZTE Corporation
R5-210038 Addition of new MDT test case 8.1.6.1.2.10 ZTE Corporation
R5-210039 Addition of new MDT test case 8.1.6.1.2.11 ZTE Corporation
R5-210040 Addition of new MDT test case 8.1.6.1.2.12 ZTE Corporation
R5-210041 Addition of new MDT test case 8.1.6.1.2.13 ZTE Corporation
R5-210128 Addition of new test case 8.1.6.1.1.1 for NR Immediate MDT CMCC
R5-210129 Addition of new test case 8.1.6.1.1.2 for NR L2 measurement CMCC
R5-210671 Addition of MDT TC 8.1.6.1.4.3-CEF-intra-NR handover Huawei, Hisilicon
R5-210672 Addition of MDT TC 8.1.6.1.4.4-CEF-RRC re-establishment Huawei, Hisilicon
R5-210673 Addition of MDT TC 8.1.6.1.4.5-CEF-location info Huawei, Hisilicon
R5-210674 Addition of MDT TC 8.1.6.1.4.6-CEF-intra-freq measurements Huawei, Hisilicon
R5-210675 Addition of MDT TC 8.1.6.1.4.7-CEF-inter-freq measurements Huawei, Hisilicon
R5-210676 Addition of MDT TC 8.1.6.1.4.8-CEF-rach failure Huawei, Hisilicon
R5-210798 Addition of new MDT TC 8.1.6.1.3.1 MediaTek Inc., Tejet, SRTC
R5-210799 Addition of new MDT TC 8.1.6.1.3.2 MediaTek Inc., Tejet, SRTC
R5-210800 Addition of new MDT TC 8.1.6.1.3.3 MediaTek Inc., Tejet, SRTC
R5-211470 Addition of new MDT test case 8.1.6.1.2.1 ZTE, SRTC, Tejet
R5-211471 Addition of new MDT test case 8.1.6.1.2.2 ZTE, SRTC, Tejet
R5-211472 Addition of new MDT test case 8.1.6.1.2.3 ZTE, SRTC, Tejet
R5-211473 Addition of new MDT test case 8.1.6.1.2.7 ZTE Corporation
R5-211474 Addition of new MDT test case 8.1.6.1.2.8 ZTE Corporation
R5-211475 Addition of new MDT test case 8.1.6.1.2.12 ZTE Corporation
R5-211476 Addition of new MDT test case 8.1.6.1.2.13 ZTE Corporation
R5-211477 Addition of new test case 8.1.6.1.1.1 for NR Immediate MDT CMCC
R5-211478 Addition of new test case 8.1.6.1.1.2 for NR L2 measurement CMCC
R5-211479 Addition of MDT TC 8.1.6.1.4.3-CEF-intra-NR handover Huawei, Hisilicon
R5-211480 Addition of MDT TC 8.1.6.1.4.4-CEF-RRC re-establishment Huawei, Hisilicon
R5-211481 Addition of MDT TC 8.1.6.1.4.5-CEF-location info Huawei, Hisilicon
R5-211482 Addition of MDT TC 8.1.6.1.4.6-CEF-intra-freq measurements Huawei, Hisilicon
R5-211483 Addition of MDT TC 8.1.6.1.4.7-CEF-inter-freq measurements Huawei, Hisilicon
R5-211484 Addition of MDT TC 8.1.6.1.4.8-CEF-rach failure Huawei, Hisilicon
R5-211485 Addition of new MDT TC 8.1.6.1.3.1 MediaTek Inc., Tejet, SRTC
R5-211486 Addition of new MDT TC 8.1.6.1.3.3 MediaTek Inc., Tejet, SRTC
6.3.22.4 TS 38.523-2
R5-210130 Applicability statement for new test cases for NR Immediate MDT CMCC
R5-210315 Adding applicability for new logged MDT test cases ZTE Corporation, CMCC
R5-210677 Correction to NR TC applicability for MDT Huawei, Hisilicon
R5-210801 Adding applicability for new MDT test cases MediaTek Inc., Tejet, SRTC
R5-211487 Applicability statement for new test cases for NR Immediate MDT CMCC
R5-211488 Adding applicability for new logged MDT test cases ZTE Corporation, CMCC
R5-211489 Correction to NR TC applicability for MDT Huawei, Hisilicon
6.3.22.6 Discussion Papers / Work Plan / TC lists
R5-210316 Update UE Positioning test mode procedures and UE Positioning messages ZTE Corporation
R5-211490 Update UE Positioning test mode procedures and UE Positioning messages ZTE Corporation
6.3.23.4 TS 37.571-5
R5-210053 Addition of support for BDS B1C signal Spirent Communications, CATT, CAICT
R5-211340 Addition of support for BDS B1C signal Spirent Communications, CATT, CAICT
6.3.24.1 TS 38.508-1
R5-210421 Addition of Cell configurations for 5G-SRVCC from NG-RAN to UTRAN CATT, TDIA
R5-211491 Addition of Cell configurations for 5G-SRVCC from NG-RAN to UTRAN CATT, TDIA
6.3.24.2 TS 38.508-2
R5-210622 Introduciton of general capability for NR to UTRA-FDD CELL_DCH CS handover CATT, TDIA
R5-211492 Introduciton of general capability for NR to UTRA-FDD CELL_DCH CS handover CATT, TDIA
6.3.24.3 TS 38.523-1
R5-210412 Addition of a new test case for 5G-SRVCC from NG-RAN to 3GPP UTRAN CATT, TDIA
R5-210678 Addition of 5G SRVCC TC 8.1.3.2.6-NR to UMTS Inter-RAT measurements-Event B1 Huawei, Hisilicon
R5-210679 Addition of 5G SRVCC TC 8.1.3.2.7-NR to UMTS Inter-RAT measurements-Event B2 Huawei, Hisilicon
R5-211493 Addition of a new test case for 5G-SRVCC from NG-RAN to 3GPP UTRAN CATT, TDIA
R5-211494 Addition of 5G SRVCC TC 8.1.3.2.6-NR to UMTS Inter-RAT measurements-Event B1 Huawei, Hisilicon
R5-211495 Addition of 5G SRVCC TC 8.1.3.2.7-NR to UMTS Inter-RAT measurements-Event B2 Huawei, Hisilicon
6.3.24.4 TS 38.523-2
R5-210413 Addition of the applicability for new test case for 5G-SRVCC from NG-RAN to 3GPP UTRAN CATT, TDIA
R5-210564 Introduction of applicability for SRVCC from NG-RAN to 3GPP UTRAN CATT, TDIA, Huawei, Hisilicon
R5-210680 Correction to NR TC applicability for 5G SRVCC Huawei, Hisilicon
R5-211496 Introduction of applicability for SRVCC from NG-RAN to 3GPP UTRAN CATT, TDIA, Huawei, Hisilicon
6.4.1 TS 38.508-1
R5-210186 Update global conditions Ericsson
R5-210263 Editorial update IE PhysicalCellGroupConfig Ericsson
R5-210327 Update FailureInformation message Ericsson
R5-210359 Editorial update SidelinkUEInformationNR message Ericsson
R5-210394 Editorial update UEAssistanceInformation message Ericsson
R5-210414 Update UECapabilityEnquiry message Ericsson
R5-210616 Editorial update DLDedicatedMessageSegment message Ericsson
R5-210805 Update IE SemiStaticChannelAccessConfig Ericsson
R5-210812 Update IE ServingCellConfig Ericsson
R5-210825 Editorial update IE SSB-MTC Ericsson
R5-211165 Introduction of support for URLLC Ericsson
R5-211166 Addition of QoS for URLLC Ericsson
R5-211167 Updates to REGISTRATION ACCEPT message Ericsson
R5-211168 Updates to PDU SESSION ESTABLISHMENT ACCEPT message Ericsson
R5-211169 Addition of URSP details Ericsson
R5-211170 Editorial update to BandCombinationListSidelink IE Ericsson
R5-211204 Editorial update IE BWP Ericsson
R5-211357 Addition of URSP details Ericsson
R5-211497 Editorial update IE PhysicalCellGroupConfig Ericsson
R5-211498 Introduction of support for URLLC Ericsson
R5-211499 Addition of QoS for URLLC Ericsson
6.4.4.4.1.4 RRC Handover (clause 8.1.4)
R5-210200 Corrections to test case 8.1.4.2.1.2 MCC TF160
6.4.4.4.1.5 RRC Others (clause 8.1.5)
R5-210028 Update test case 8.1.5.1.1 to add UE capability nr-HO-ToEN-DC-r16 China Telecommunications
R5-211500 Update test case 8.1.5.1.1 to add UE capability nr-HO-ToEN-DC-r16 China Telecommunications
6.4.4.4.2.1 RRC UE Capability / Others (clause 8.2.1)
R5-210027 Update of test case 8.2.1.1.1 to support Inter-RAT handover from NR to EN-DC China Telecommunications
R5-211501 Update of test case 8.2.1.1.1 to support Inter-RAT handover from NR to EN-DC China Telecommunications
6.4.4.6 5GS Non-3GPP Access Mobility Management (clause 9.2)
R5-210808 Correction to 5GS Non-3GPP Access Test Case 9.2.2.2 ZTE Corporation
R5-210809 Correction to 5GS Non-3GPP Access Test Case 9.2.4.1 ZTE Corporation
R5-210810 Correction to 5GS Non-3GPP Access Test Case 9.2.5.1.4 ZTE Corporation
R5-210811 Correction to 5GS Non-3GPP Access Test Case 9.2.5.2.1 ZTE Corporation
R5-211321 Voiding 5GS Non-3GPP Access Test Case 9.2.5.2.1 ZTE Corporation
R5-211502 Correction to 5GS Non-3GPP Access Test Case 9.2.2.2 ZTE Corporation
6.4.4.11.1 EPS Fallback
R5-210344 Introduction of a new test case for voice fallback indication under EPS Fallback with handover CATT, TDIA
R5-211503 Introduction of a new test case for voice fallback indication under EPS Fallback with handover CATT, TDIA
6.4.5 TS 38.523-2
R5-210184 Update of applicability for RRC TC 8.1.3.1.21 and 8.1.4.2.1.2 MediaTek Inc.
R5-210345 Update to applicabilities for the EPS fallback test cases CATT, TDIA
R5-210998 Correction to applicability conditions of test cases 8.1.4.2.1.2 and 11.1.9 Qualcomm Incorporated, MCC TF160
R5-211327 Remove applicability of 5GS Non-3GPP Access Test Case 9.2.5.2.1 ZTE Corporation
R5-211504 Update to applicabilities for the EPS fallback test cases CATT, TDIA
6.4.7 Discussion Papers / Work Plan / TC lists
R5-210155 TS 38.523-1 Tracker status before RAN5#90-e Samsung (Rapporteur)
R5-210581 Discussion to add test cases for RRC DL segmentation MediaTek Inc.
R5-211310 Discussion to add test cases for RRC DL segmentation MediaTek Inc.
6.5.1 Routine Maintenance for TS 36.508
R5-210071 Correction to emergency bearer service over S1 for eCall test cases Keysight Technologies UK, Qualcomm
R5-210201 MCPTT Packet Filter MCC TF160
R5-211203 Editorial for Table 6.6.2-10 Reference packet filter #9 NIST
R5-211320 Correction to Test frequencies for NB-IoT FDD MFBI ANRITSU LTD
R5-211505 Correction to emergency bearer service over S1 for eCall test cases Keysight Technologies UK, Qualcomm
R5-211506 Editorial for Table 6.6.2-10 Reference packet filter #9 NIST
R5-211507 Correction to Test frequencies for NB-IoT FDD MFBI ANRITSU LTD
6.5.2 Routine Maintenance for TS 36.509
R5-210518 Clarification of DRB identity in CLOSE UE TEST LOOP message in 36.509 Anritsu
R5-211508 Clarification of DRB identity in CLOSE UE TEST LOOP message in 36.509 Anritsu
6.5.3.1 Idle Mode
R5-210142 Editorial updates of TS 36.523-1 Section 6 Samsung
R5-210681 Correction to LTE TC 6.1.1.2a Huawei, Hisilicon, MCC TF160
R5-210682 Correction to LTE TC 6.1.1.6a Huawei, Hisilicon, MCC TF160
R5-210683 Addition of LTE TC 6.1.1.6b Huawei, Hisilicon, MCC TF160
R5-210684 Correction to LTE TC 6.1.2.3 Huawei, Hisilicon, MCC TF160
R5-210685 Correction to LTE TC 6.1.2.12 Huawei, Hisilicon, MCC TF160
R5-211341 Editorial updates of TS 36.523-1 Section 6 Samsung
R5-211342 Correction to LTE TC 6.1.1.6a Huawei, Hisilicon, MCC TF160
6.5.3.2.1 MAC
R5-210143 Editorial updates of TS 36.523-1 Section 7.1 Samsung
R5-211343 Editorial updates of TS 36.523-1 Section 7.1 Samsung
6.5.3.3.1 RRC Part 1 (clauses 8.1 and 8.5)
R5-210144 Editorial updates of TS 36.523-1 Sections 8.1 and 8.2 Samsung
R5-211344 Editorial updates of TS 36.523-1 Sections 8.1 and 8.2 Samsung
6.5.3.3.2 RRC Part 2 (clause 8.2)
R5-211023 Correction to LTE test case 8.2.4.1 for CAT-M mode UEs ROHDE & SCHWARZ
R5-211345 Correction to LTE test case 8.2.4.1 for CAT-M mode UEs ROHDE & SCHWARZ
6.5.3.3.3 RRC Part 3 (clause 8.3)
R5-210145 Editorial updates of TS 36.523-1 Section 8.3 Samsung
R5-211346 Editorial updates of TS 36.523-1 Section 8.3 Samsung
6.5.3.3.4 Inter-RAT (clauses 8.4 & 8.4A)
R5-210146 Editorial updates of TS 36.523-1 Section 8.4 Samsung
R5-211347 Editorial updates of TS 36.523-1 Section 8.4 Samsung
6.5.3.3.5 RRC LTE MDT (clause 8.6)
R5-210042 Editorial TC BT measurement collection in Immediate MDT to the correct subclause CMCC
R5-210043 Editorial TC BT measurement collection in Logged MDT to the correct subclause CMCC
R5-210044 Editorial TC BT measurement collection in RLF logging to the correct subclause CMCC
R5-210045 Editorial TC WLAN measurement collection in RLF logging to the correct subclause CMCC
R5-210046 Editorial TC BT measurement collection in CEF logging to the correct subclause CMCC
R5-210047 Editorial TC WLAN measurement collection in CEF logging to the correct subclause CMCC
R5-210048 Update of TC WLAN measurement collection in Immediate MDT for specific sys infos CMCC
R5-210049 Update of TC WLAN measurement collection in Logged MDT for specific sys infos CMCC
R5-211509 Update of TC WLAN measurement collection in Immediate MDT for specific sys infos CMCC
R5-211510 Update of TC WLAN measurement collection in Logged MDT for specific sys infos CMCC
6.5.3.4 EPS Mobility Management
R5-210147 Editorial updates of TS 36.523-1 Section 9 Samsung
R5-211348 Editorial updates of TS 36.523-1 Section 9 Samsung
6.5.3.5 EPS Session Management
R5-210148 Editorial updates of TS 36.523-1 Sections 10 to 13 Samsung
R5-211205 Correction to Test Case 10.2.2 NIST
R5-211349 Editorial updates of TS 36.523-1 Sections 10 to 13 Samsung
R5-211511 Correction to Test Case 10.2.2 NIST
6.5.3.8 Multilayer Procedures
R5-210153 Update to TC 13.1.22 MCPTT / Attach / Call setup CO Samsung
R5-211512 Update to TC 13.1.22 MCPTT / Attach / Call setup CO Samsung
6.5.3.11 Others (TS 36.523-1 clauses not covered by other AIs under AI 6.5.3 / e.g. eMBMS / Home (e)NB / MBMS in LTE / D2D / SC-PTM / NB-IoT / CIoT...)
R5-210149 Editorial updates of TS 36.523-1 Sections 15, 17 and 19 Samsung
R5-210150 Editorial updates of TS 36.523-1 Sections 22 and 24 Samsung
R5-210556 Adding specs to References in TS 36.523-1 Samsung
R5-211350 Editorial updates of TS 36.523-1 Sections 15, 17 and 19 Samsung
R5-211513 Editorial updates of TS 36.523-1 Sections 22 and 24 Samsung
R5-211514 Adding specs to References in TS 36.523-1 Samsung
6.5.4 Routine Maintenance for TS 36.523-2
R5-210024 Correction to test cases 22.3.1.6a, 22.3.1.9 and 22.3.2.7 ROHDE & SCHWARZ, Nordic Semiconductor, Verizon, Telstra
R5-210050 Update of LTE_MDT_BT_WLAN test cases for PICS definition CMCC
R5-210151 Aligning content of 36.523-2 with 36.523-1 Samsung
R5-210154 Adding applicability for TC 13.1.22 MCPTT / Attach / Call setup CO Samsung
R5-210686 Addition of LTE TC applicability Huawei, Hisilicon, MCC TF160
R5-211351 Aligning content of 36.523-2 with 36.523-1 Samsung
R5-211352 Adding applicability for TC 13.1.22 MCPTT / Attach / Call setup CO Samsung
R5-211368 Correction to test cases 22.3.1.6a, 22.3.1.9 and 22.3.2.7 ROHDE & SCHWARZ, Nordic Semiconductor, Verizon, Telstra
R5-211515 Addition of LTE TC applicability Huawei, Hisilicon, MCC TF160
6.5.6 Discussion Papers / Work Plan / TC lists
R5-210140 TS 36.523-1 Tracker status before RAN5#90-e Samsung (Rapporteur)
R5-211322 Testing Early implementation of Rel-14 NB-IoT Features “Category NB2”, and “twoHARQ-Processes-r14” ROHDE & SCHWARZ, Nordic Semiconductor, Verizon, Telstra
6.6.6.1 TS 34.229-1
R5-210060 Voiding generic procedures for text call ROHDE & SCHWARZ
R5-210061 Voiding SigComp test cases ROHDE & SCHWARZ
R5-210202 Corrections to SMS test case 18.b1, Annexes A.7.2 and A.7.8 MCC TF160
R5-210323 Correction to annexure A.3.1 Keysight Technologies UK, MCC TF160, Qualcomm
R5-210324 Clarification of conditions used in INVITE for eCall setup Keysight Technologies UK, MCC TF160, Qualcomm
R5-210992 Correction to XCAP test case 15.5 Qualcomm Incorporated
R5-211353 Correction to annexure A.3.1 Keysight Technologies UK, MCC TF160, Qualcomm
6.6.6.3 TS 34.229-3
R5-210203 Routine maintenance for TS 34.229-3 MCC TF160
6.6.7.1 TS 37.571-2
R5-210258 Definition of values for epdu fields PCTEST Engineering Laboratory
R5-210260 Corrections and clarifications to default MBS, WLAN and Sensor assistance data in clause 5.4.1 PCTEST Engineering Laboratory
R5-211298 Corrections for support of multiple GPS signals Spirent Communications
6.6.7.2 TS 37.571-3
R5-210261 Deletion of PICS for wlan-AP-Identifier PCTEST Engineering Laboratory
6.6.7.4 TS 37.571-5
R5-210051 Corrections for support of multiple GPS signals Spirent Communications
R5-211516 Corrections for support of multiple GPS signals Spirent Communications
6.6.9.1 TS 36.579-1
R5-210204 Addition of a generic procedure for MCPTT radio bearer establishment for use of pre-established session MCC TF160
R5-210205 Correction to Generic Test Procedure for MCPTT CT group call establishment, manual commencement MCC TF160
R5-210206 Correction to generic test procedure for MCPTT pre-established session establishment MCC TF160
R5-210207 New MCPTT generic test procedures MCC TF160, NIST, UPV/EHU, Nemergent Solutions
R5-210208 Update to Default HTTP message - POST MCC TF160
R5-210209 Update to Default Message Content - Floor Ack, Connect, Disconnect, Acknowledge MCC TF160
R5-210210 Update to Default Message Content - INVITE MCC TF160
R5-210211 Update to Default Message Content - Pidf MCC TF160
R5-210212 Update to Default Message Content - REFER and Resource-List MCC TF160
R5-210213 Update to Default Message Content - SDP MCC TF160
R5-210214 Update to Default Message Content - SIP 200 (OK) MCC TF160
R5-210215 Update to Default Message Content - UPDATE MCC TF160
R5-210216 Update to Default Message Content AFFILIATION-COMMAND MCC TF160
R5-210217 Update to Default Message Content MIKEY-SAKKE I_MESSAGE MCC TF160
R5-210218 Update to Default Message Content SIP 180 (Ringing) and SIP 183 (Session progress) MCC TF160
R5-210219 Update to Default Message Content SIP MESSAGE MCC TF160
R5-210220 Update to Default Message Content SUBSCRIBE MCC TF160
R5-210221 Update to the MCS GKTP document MCC TF160
R5-210319 Update to references clause MCC TF160
R5-210551 MCPTT Info Corrections UPV/EHU, Nemergent Solutions, MCC TF160
R5-210994 Update to default MCPTT media plane control messages MCC TF160
R5-211044 Update of References in 36.579-1 Samsung
R5-211152 Updates to global conditions used in default messages MCC TF160
R5-211354 Update of References in 36.579-1 Samsung
R5-211517 Addition of a generic procedure for MCPTT radio bearer establishment for use of pre-established session MCC TF160
R5-211518 Correction to generic test procedure for MCPTT pre-established session establishment MCC TF160
R5-211519 Update to Default Message Content - REFER and Resource-List MCC TF160
R5-211520 MCPTT Info Corrections UPV/EHU, Nemergent Solutions, MCC TF160
6.6.9.2 TS 36.579-2
R5-210222 Correction to MCPTT Test Case 5.1 MCC TF160
R5-210223 Correction to MCPTT Test Case 5.3 MCC TF160
R5-210224 Correction to MCPTT Test Case 5.4 MCC TF160
R5-210225 Correction to MCPTT Test Case 6.1.1.1 MCC TF160
R5-210226 Correction to MCPTT Test Case 6.1.1.10 MCC TF160, NIST, UPV/EHU, Nemergent Solutions
R5-210227 Correction to MCPTT Test Case 6.1.1.11 MCC TF160
R5-210228 Correction to MCPTT Test Case 6.1.1.12 MCC TF160
R5-210229 Correction to MCPTT Test Case 6.1.1.13 MCC TF160
R5-210230 Correction to MCPTT Test Case 6.1.1.14 MCC TF160
R5-210231 Correction to MCPTT Test Case 6.1.1.2 MCC TF160
R5-210232 Correction to MCPTT Test Case 6.1.1.3 MCC TF160
R5-210233 Correction to MCPTT Test Case 6.1.1.5 MCC TF160
R5-210234 Correction to MCPTT Test Case 6.1.1.8 MCC TF160
R5-210235 Correction to MCPTT Test Case 6.1.1.9 MCC TF160
R5-210236 Correction to MCPTT Test Case 6.1.2.10 MCC TF160
R5-210237 Correction to MCPTT Test Case 6.1.2.11 MCC TF160
R5-210238 Correction to MCPTT Test Case 6.1.2.12 MCC TF160
R5-210239 Correction to MCPTT Test Case 6.1.2.7 MCC TF160
R5-210240 Correction to MCPTT Test Case 6.1.2.8 MCC TF160
R5-210241 Correction to MCPTT Test Case 6.1.2.9 MCC TF160
R5-210242 Correction to MCPTT Test Case 6.2.1 MCC TF160
R5-210243 Correction to MCPTT Test Case 6.2.14 MCC TF160
R5-210244 Correction to MCPTT Test Case 6.2.15 MCC TF160
R5-210245 Correction to MCPTT Test Case 6.2.16 MCC TF160
R5-210246 Correction to MCPTT Test Case 6.2.17 MCC TF160
R5-210247 Correction to MCPTT Test Case 6.2.2 MCC TF160
R5-210248 Correction to MCPTT Test Case 6.2.3 MCC TF160
R5-210249 Correction to MCPTT Test Case 6.2.4 MCC TF160
R5-210250 Correction to MCPTT Test Case 6.2.5 MCC TF160
R5-210251 Correction to MCPTT Test Case 6.2.6 MCC TF160
R5-210252 Correction to MCPTT Test Case 6.2.7 MCC TF160
R5-210253 Correction to MCPTT Test Case 6.2.8 MCC TF160
R5-211521 Correction to MCPTT Test Case 5.3 MCC TF160
R5-211522 Correction to MCPTT Test Case 5.4 MCC TF160
R5-211523 Correction to MCPTT Test Case 6.1.1.1 MCC TF160
R5-211524 Correction to MCPTT Test Case 6.1.1.10 MCC TF160, NIST, UPV/EHU, Nemergent Solutions
R5-211525 Correction to MCPTT Test Case 6.1.1.2 MCC TF160
R5-211526 Correction to MCPTT Test Case 6.1.1.5 MCC TF160
R5-211527 Correction to MCPTT Test Case 6.1.1.8 MCC TF160
R5-211528 Correction to MCPTT Test Case 6.1.2.10 MCC TF160
R5-211529 Correction to MCPTT Test Case 6.1.2.11 MCC TF160
R5-211530 Correction to MCPTT Test Case 6.1.2.12 MCC TF160
R5-211531 Correction to MCPTT Test Case 6.1.2.7 MCC TF160
R5-211532 Correction to MCPTT Test Case 6.1.2.8 MCC TF160
R5-211533 Correction to MCPTT Test Case 6.1.2.9 MCC TF160
R5-211534 Correction to MCPTT Test Case 6.2.1 MCC TF160
R5-211535 Correction to MCPTT Test Case 6.2.14 MCC TF160
R5-211536 Correction to MCPTT Test Case 6.2.15 MCC TF160
R5-211537 Correction to MCPTT Test Case 6.2.16 MCC TF160
R5-211538 Correction to MCPTT Test Case 6.2.17 MCC TF160
R5-211539 Correction to MCPTT Test Case 6.2.2 MCC TF160
R5-211540 Correction to MCPTT Test Case 6.2.3 MCC TF160
R5-211541 Correction to MCPTT Test Case 6.2.4 MCC TF160
R5-211542 Correction to MCPTT Test Case 6.2.5 MCC TF160
R5-211543 Correction to MCPTT Test Case 6.2.6 MCC TF160
R5-211544 Correction to MCPTT Test Case 6.2.7 MCC TF160
6.6.9.4 TS 36.579-4
R5-210254 Addition of missing MCX PICS MCC TF160
R5-211254 Adding an MCPTT test case to the applicability table NIST
R5-211545 Addition of missing MCX PICS MCC TF160
6.6.9.5 TS 36.579-5
R5-210255 Routine maintenance for TS 36.579-5 MCC TF160
6.6.9.6 TS 36.579-6
R5-211250 Correction to MCVideo Test Case 6.1.1.9 NIST
R5-211269 Correction to MCVideo Test Case 6.2.6 NIST
R5-211546 Correction to MCVideo Test Case 6.1.1.9 NIST
6.6.9.7 TS 36.579-7
R5-211271 Editorial for correcting heading styles NIST
R5-211355 Editorial for correcting heading styles NIST
6.6.9.9 Discussion Papers / Work Plan / TC lists
R5-210256 Handling of optional KMS request security MCC TF160
R5-210257 Issues with pre-established sessions MCC TF160
R5-211039 Issues with pre-established session establishment UPV/EHU, Nemergent Solutions
6.7 Outgoing liaison statements for provisional approval
R5-211311 LS on confirming successful resource reservation TSG WG RAN5

17-Apr-2025 20:05:08

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